JPS5824192Y2 - Test piece clamping plate for thin plate spring testing equipment - Google Patents

Test piece clamping plate for thin plate spring testing equipment

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Publication number
JPS5824192Y2
JPS5824192Y2 JP12363578U JP12363578U JPS5824192Y2 JP S5824192 Y2 JPS5824192 Y2 JP S5824192Y2 JP 12363578 U JP12363578 U JP 12363578U JP 12363578 U JP12363578 U JP 12363578U JP S5824192 Y2 JPS5824192 Y2 JP S5824192Y2
Authority
JP
Japan
Prior art keywords
test piece
thin plate
plate spring
clamping plate
piece clamping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP12363578U
Other languages
Japanese (ja)
Other versions
JPS5542104U (en
Inventor
貞雄 広津
輝義 飯田
Original Assignee
日新製鋼株式会社
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Filing date
Publication date
Application filed by 日新製鋼株式会社 filed Critical 日新製鋼株式会社
Priority to JP12363578U priority Critical patent/JPS5824192Y2/en
Publication of JPS5542104U publication Critical patent/JPS5542104U/ja
Application granted granted Critical
Publication of JPS5824192Y2 publication Critical patent/JPS5824192Y2/en
Expired legal-status Critical Current

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Description

【考案の詳細な説明】 本考案は片持梁の曲げたわみと荷重との関係を利用して
薄板ばね試験片のヤング率を測定するための薄板ばね試
験装置用試験片締付用板の改良に関するものである。
[Detailed description of the invention] This invention is an improvement of a test piece clamping plate for a thin plate spring testing device for measuring the Young's modulus of a thin plate spring test piece using the relationship between the bending deflection of a cantilever beam and the load. It is related to.

一般に薄板ばね材(通常0.2〜2.Qmm厚)のヤン
グ率を測定する場合に、一端を固定し自由端側に集中荷
重を加えてその荷重と曲げたわみとの関係からヤング率
を測定する薄板ばね試験装置が汎用されており、この種
の薄板ばね試験装置において薄板ばね試験片としては幅
lQmm前後のものが使用され、この幅lQmm前後の
薄板ばねは上下の薄板ばね試験装置用試験片締付用板に
よって挟持されて固定端条件を形成されている。
Generally, when measuring the Young's modulus of a thin leaf spring material (usually 0.2 to 2.Q mm thick), one end is fixed, a concentrated load is applied to the free end, and the Young's modulus is measured from the relationship between the load and bending deflection. In this type of thin plate spring testing apparatus, thin plate spring test pieces with a width of about 1Q mm are used, and thin plate springs with a width of about 1Qmm are used for testing on the upper and lower thin plate spring testing apparatus. A fixed end condition is formed by being held between the single clamping plates.

しかしながら従来の薄板ばね試験装置の試験片締付用板
は、薄板ばね試験片との当接面全面が平滑面を威してい
て薄板ばね試験片との接触面積が広いため、薄板ばね試
験片の板厚が0.5〜2.Qmmの如く比較的厚く且つ
湾曲しているような場合には大きな力を作用させても充
分に薄板ばね試験片を締め付けることができず、また試
験片締付用板と薄板ばね試験片との間に金属片やスケー
ルやゴミなどが付着していると締付けが不充分となり、
更に試験を繰り返すうちに固定端がへたって固定端にお
ける締付けが不充分になってヤング率の測定において重
要な固定端から荷重点までの距離が不正確となるなどの
原因で正確なりフグ率の測定を行なうことができなくな
る欠点があった。
However, the plate for clamping the test piece of the conventional thin plate spring test device has a smooth surface on the entire surface that comes into contact with the thin plate spring test piece, and the contact area with the thin plate spring test piece is wide. The plate thickness is 0.5 to 2. If the thin spring test piece is relatively thick and curved, such as Qmm, even if a large force is applied, it will not be possible to tighten the thin spring test piece sufficiently. If there are metal pieces, scale, dirt, etc. in between, the tightening will be insufficient.
Furthermore, as the tests were repeated, the fixed end became fatigued and the tightening at the fixed end became insufficient, making the distance from the fixed end to the load point, which is important in measuring Young's modulus, inaccurate. There was a drawback that measurements could not be performed.

本考案はかかる従来の薄板ばね試験装置における試験片
締付用板の欠点を解消し、常に薄板ばね試験片の固定端
の条件を安定せしめることができる薄板ばね試験装置用
試験片締付用板を提供するものである。
The present invention solves the drawbacks of the test piece clamping plate in the conventional thin plate spring testing apparatus, and is capable of always stabilizing the conditions of the fixed end of the thin plate spring test piece. It provides:

更に詳しくは、本考案は板幅が10mm前後の薄板ばね
試験片を片持梁状に保持してヤング率を測定する薄板ば
ね試験装置のチャック部を構成する試験片締付用板にお
いて、薄板ばね試験片との当接面の両端が薄板ばね試験
片の長手方向と直角方向の凸部であることを特徴とする
薄板ばね試験装置用試験片締付用板に関するものである
More specifically, the present invention provides a test piece clamping plate that constitutes a chuck part of a thin plate spring testing device that measures Young's modulus by holding a thin plate spring test piece with a plate width of around 10 mm in a cantilever shape. The present invention relates to a plate for tightening a test piece for a thin plate spring testing device, characterized in that both ends of the contact surface with the spring test piece are convex portions in a direction perpendicular to the longitudinal direction of the thin plate spring test piece.

以下、図面により本考案に係る薄板ばね試験装置用試験
片締付用板の実施例について詳細に説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Examples of the test piece clamping plate for a thin plate spring testing apparatus according to the present invention will be described in detail below with reference to the drawings.

第1図は本考案に係る薄板ばね試験装置用試験片締付用
板の1実施例を用いて薄板ばね試験片を固定した状態を
示す正面図、第2図は第1図の右側面図、第3図は本考
案に係る薄板ばね試験装置用試験片締付用板を用いて薄
板ばね試験片を固定した状態の試験片締付用板部の透視
図、第4図は第3図と同じ状態の他の実施例の透視図で
ある。
Fig. 1 is a front view showing a state in which a thin plate spring test piece is fixed using an embodiment of the test piece clamping plate for a thin plate spring testing device according to the present invention, and Fig. 2 is a right side view of Fig. 1. , FIG. 3 is a perspective view of the test piece clamping plate portion in a state in which a thin plate spring test piece is fixed using the test piece clamping plate for a thin plate spring testing device according to the present invention, and FIG. FIG. 3 is a perspective view of another embodiment in the same state as in FIG.

図面中、1は薄板ばね試験装置本体である。In the drawings, 1 is the main body of the thin plate spring testing device.

この試験装置本体1は、基台1aと、この基台1a上に
直立して設けられた4本の柱1bと、この4本の柱1b
上に水平に設置せしめられた天板1Cと、この天板1C
の中央に貫通穿設せしめられたメネジに螺合せしめられ
ているオネジ1dと、天板1Cの上方でオネジ1dに固
定せしめられているハンドル1eとより戒っている。
This test device main body 1 includes a base 1a, four columns 1b provided upright on the base 1a, and these four columns 1b.
A top plate 1C installed horizontally above and this top plate 1C
The handle 1e is fixed to the male screw 1d above the top plate 1C, and the handle 1e is fixed to the male screw 1d above the top plate 1C.

2は天板1Cの下方でオネジ1dにより下方に向けて押
圧せしめられる上方の試験片締付用板であり、3は下面
を基台1a上に当接して設置せしめられる下方の試験片
締付用板である。
2 is an upper test piece clamping plate which is pressed downward by a male screw 1d below the top plate 1C, and 3 is a lower test piece clamping plate whose lower surface is placed in contact with the base 1a. It is a board for use.

この上下の試験片締付用板2と3とでチャック部が構成
されており、この試験片締付用板2及び3において、上
方の試験片締付用板2は下面に、また下方の試験片締付
用板3は上面にそれぞれ薄板ばね試験片Tとの当接面を
有している。
These upper and lower test piece clamping plates 2 and 3 constitute a chuck part, and in these test piece clamping plates 2 and 3, the upper test piece clamping plate 2 is on the lower surface, and the lower Each of the test piece clamping plates 3 has a contact surface with the thin plate spring test piece T on its upper surface.

この上下の試験片締付用板2と3とのうちのいずれか一
考を本考案に係る薄板ばね試験装置用試験片締付用板と
するのである。
Either one of the upper and lower test piece clamping plates 2 and 3 is used as the test piece clamping plate for the thin plate spring testing apparatus according to the present invention.

図示した実施例においては下方の試験片締付用板3を本
考案に係る薄板ばね試験装置用試験片締付用板とした場
合について示しである。
In the illustrated embodiment, the lower test piece clamping plate 3 is a test piece clamping plate for a thin plate spring testing device according to the present invention.

本考案に係る薄板ばね試験装置用試験片締付用板は、板
幅がlQmm前後で板厚が通常0.2〜2.0mmの薄
板ばね試験片Tとの当接面の両端すなわち薄板ばね試験
片Tの挾持固定される部分における固定端と固定端から
最も遠い部分との両端が薄板ばね試験片Tの長手方向と
直角方向の凸部AとBとより或っているものであり、こ
の凸部AとBとは第3図に示す如く薄板ばね試験装置用
試験片締付用板と一体構造のものであってもよいが、凸
部A及び/又はBが摩耗若しくは損傷した場合にその凸
部のみを交換して固定できるように第4図に示す如くネ
ジなどによって簡単に試験片締付用板本体に固定し得る
交換自在な構造であることが好ましい。
The plate for tightening a test piece for a thin plate spring testing device according to the present invention has a plate width of about 1Q mm and a plate thickness of usually 0.2 to 2.0 mm. Both ends of the fixed end and the part furthest from the fixed end of the portion of the test piece T to be clamped and fixed are interposed by convex portions A and B in a direction perpendicular to the longitudinal direction of the thin plate spring test piece T, The protrusions A and B may be integrally constructed with the test piece clamping plate for the thin plate spring testing device as shown in Fig. 3, but if the protrusions A and/or B are worn or damaged. It is preferable to have an exchangeable structure that can be easily fixed to the main body of the test specimen clamping plate with screws or the like, as shown in FIG. 4, so that only the convex portion can be replaced and fixed.

次に本考案に係る薄板ばね試験装置用試験片締付用板の
効果について説明する。
Next, the effects of the plate for tightening a test piece for a thin plate spring testing device according to the present invention will be explained.

薄板ばね試験装置1において試験片締付用板2.3で板
厚t (mm)、幅b (mm)(7)薄板ばね試験片
Tに固定端からl (mm)の距離で集中荷重w(g)
を作用させたときのたわみ量f (mm)は但し E:薄板ばね試験片Tのヤング率(kg/mm2)■:
薄板ばね試験片Tの断面二次モーメン(mm’) で表わされるから で薄板ばね試験片Tのヤング率Eを求めることができる
わけである。
In the thin plate spring test device 1, the plate 2.3 for clamping the test piece has a thickness t (mm) and a width b (mm) (7) A concentrated load w is applied to the thin plate spring test piece T at a distance of l (mm) from the fixed end. (g)
The amount of deflection f (mm) when applied is E: Young's modulus of thin plate spring test piece T (kg/mm2) ■:
The Young's modulus E of the thin plate spring test piece T can be determined because it is expressed by the cross-sectional moment of inertia (mm') of the thin plate spring test piece T.

このヤング率を求める式からも判るように薄板ばね試験
片Tの固定端から荷重点までの距離lは3乗の項で効い
てくるので固定が確実に行なわれていなかったり固定端
における試験片締付用板がへたっていたりすると計算で
求める距離lに比べて実際に試験したときの距離lが大
きいのでたわみ量が大きくなって計算で求めたヤング率
は実際のヤング率よりかなり小さな値となってしまい正
確なりフグ率の測定が不可能となるのである。
As can be seen from the formula for calculating Young's modulus, the distance l from the fixed end of the thin plate spring test specimen T to the load point is affected by the cube of the term. If the tightening plate is bent, the distance l during the actual test is larger than the calculated distance l, so the amount of deflection increases, and the calculated Young's modulus is much smaller than the actual Young's modulus. This makes it impossible to accurately measure the blowfish rate.

かかる欠点を除去するために薄板ばね試験装置本体1の
天板1Cに螺合しているオネジ1dをハンドル1eを廻
わすことによって締め付けた際にこのオネジ1dの下端
で押圧されて試験片締付用板2と3とによって挟持固定
される薄板ばね試験片Tの固定部における圧縮応力を高
めるために試験片締付用板2と3とのうちの一考の両端
に凸部AとBとを設けて薄板ばね試験片Tを押圧挾持す
る面積を小さくシ、オネジ1dによる同じ押圧力で大き
な圧縮応力を作用せしめて薄板ばね試験片Tの湾曲や挟
持固定部に入り込んだ金属片、スケール、ゴミ等を完全
に偏平化せしめると共に試験片締付用板の固定端のへた
りによる影響を除去せしめたものが本考案に係る薄板ば
ね試験装置用試験片締付用板である。
In order to eliminate this drawback, when the male screw 1d screwed into the top plate 1C of the thin plate spring testing device main body 1 is tightened by turning the handle 1e, the lower end of this male screw 1d is pressed and the test piece is tightened. In order to increase the compressive stress at the fixing part of the thin plate spring test piece T which is clamped and fixed by the test piece clamping plates 2 and 3, convex parts A and B are provided at both ends of one of the test piece clamping plates 2 and 3. The area for pressing and clamping the thin plate spring test piece T is reduced by applying a large compressive stress with the same pressing force by the male screw 1d, thereby preventing the thin plate spring test piece T from bending, metal pieces, scales, etc. that have entered the clamping fixing part. The test piece clamping plate for a thin plate spring testing device according to the present invention completely flattens dust, etc. and eliminates the influence of the sagging of the fixed end of the test piece clamping plate.

この本考案において凸部AとBとは同一高さで薄板ばね
試験片Tとの当接面は平滑でなければならず、その高さ
は0.1〜10.0mm、幅は3〜10mm程度が好ま
しく、試験片締付用板の剛性を考慮すると凸部A、!−
Bとの板ばね試験片Tとの当接面積は、試験片締付用板
の平面積の約215程度が好ましい。
In this invention, the convex parts A and B must have the same height and the contact surface with the thin plate spring test piece T must be smooth, and the height should be 0.1 to 10.0 mm and the width should be 3 to 10 mm. Considering the rigidity of the test piece clamping plate, the convex portion A,! −
The contact area between B and the leaf spring test piece T is preferably about 215 times the planar area of the test piece clamping plate.

これは高さがQ、1mm未満であると凸部AとBとの間
にスケールが付着したような場合に凸部AとBとを設け
た効果が失なわれてしまうと共に繰返し使用している間
に凸部A、Bが損耗して凸部AとBとを設けた効果が失
なわれてしまって好ましくないからであり、また高さが
10.0mmを超えると凸部A、Bの幅が狭い場合に凸
部A、Bが締付圧力によっては湾曲して固定端を形成す
ることができなくなって好ましくないからである。
This is because if the height is less than 1 mm, the effect of providing the protrusions A and B will be lost in the case where scale adheres between the protrusions A and B, and it will not be possible to use the protrusions repeatedly. This is because the protrusions A and B will wear out during the process, and the effect of providing the protrusions A and B will be lost, which is undesirable. Also, if the height exceeds 10.0 mm, the protrusions A and B This is because if the width of the convex portions A and B is narrow, the convex portions A and B may curve depending on the tightening pressure and cannot form a fixed end, which is undesirable.

また、幅はあまり狭くすると繰返し使用している間に凸
部A、Bの損耗が著しく短期間で凸部AとBとを設けた
効果が失なわれてしまうと共に締付圧力によって凸部A
、Bの高さが高い場合に凸部A、Bが湾曲して固定端を
形成することができなくなって好ましくないので3mm
以上は必要であり、一方幅をあまり広くすると単位面積
当りの締付圧力が小さくなって従来の平滑な締付用板と
の差違がなくなってしまって好ましくないため幅は19
mm以下が好ましいのである。
In addition, if the width is too narrow, the protrusions A and B will wear out significantly during repeated use, and the effect of providing the protrusions A and B will be lost in a short period of time, and the tightening pressure will cause the protrusions A
, 3 mm because if the height of B is high, the protrusions A and B will curve and become unable to form a fixed end, which is not preferable.
The above is necessary, but on the other hand, if the width is too wide, the tightening pressure per unit area will decrease and there will be no difference from the conventional smooth tightening plate, which is undesirable, so the width is 19.
It is preferable that the thickness be less than mm.

実施例 板厚Q、5mm、幅10mm、長さ150 mmLニア
)、”ffe状で冷間圧延率0.20.30.60.7
0%のSUS 301材を約400℃で1時間加熱して
時効処理しこの素材のヤング率を測定するに当り、平面
形状が長さ60mm、幅5Qmmの試験片締付用板の両
端に高さ0゜5mm、長さ60mm、幅lQmmの凸部
を設けた本考案に係る薄板ばね試験装置用試験片締付用
板を下方の試験片締付用板として使用した場合と、上記
平面形状の試験片当接面側全面が平滑な従来の薄板ばね
試験装置用試験片締付用板を使用した場合とについてそ
れぞれ2名の測定者によって測定した。
Example Plate thickness Q: 5 mm, width: 10 mm, length: 150 mm (near), "ffe" cold rolling rate: 0.20.30.60.7
0% SUS 301 material was heated at about 400°C for 1 hour for aging treatment, and when measuring the Young's modulus of this material, a high plate was placed at both ends of a test piece clamping plate with a planar shape of 60 mm in length and 5 Q mm in width. A case where the plate for tightening a test piece for a thin plate spring testing device according to the present invention having a convex portion with a height of 0°5 mm, a length of 60 mm, and a width of 1 Q mm is used as a lower plate for tightening a test piece, and the above planar shape. Measurements were made by two testers for each case using a conventional test piece clamping plate for a thin plate spring testing device whose entire surface on which the test piece abuts is smooth.

この測定方法は両方ともJIS H3130(ばね用ベ
リリウム銅、りん青銅及び洋白の板及び条)に規定され
ている繰返したわみ式試験方法に準じて固定端から集中
荷重を作用される位置までの距離lを薄板ばね試験片T
の板厚の100倍となるように、すなわちl−50mm
となるようにして集中荷重として125gの重錘を使用
してそのたわみ量を測定してヤング率′を求める方法を
採用した。
Both of these measurement methods are based on the repeated deflection test method specified in JIS H3130 (Beryllium copper, phosphor bronze, and nickel silver plates and strips for springs), and the distance from the fixed end to the position where concentrated load is applied. l is a thin plate spring test piece T
so that it is 100 times the thickness of the plate, i.e. l-50mm
A method was adopted in which Young's modulus was determined by using a 125 g weight as a concentrated load and measuring the amount of deflection.

その結果は、第5図の△印(圧延方向に平行に薄板ばね
試験片Tを採取した場合)及び印(圧延方向に直角に薄
板ばね試験片Tを採取した場合)に示す如〈従来の平滑
な試験片締付用板を使用した場合には測定値のばらつき
が±1000 kg/ m m2前後もあり且つその測
定値がかなり小さな値の範囲であってしかも大きく相違
していたものが、本考案に係る試験片締付用板を使用し
た場合には○印で示す如くばらつきが±200kg/m
m2前後となって測定精度が向上したと共に、測定値も
従来の試験片締付用板を使用した場合より本考案に係る
試験片締付用板を使用した場合の方が約3000 kg
/mm2も高い値を示しておりこの値は引張試験や振動
法によって求めたヤング率に近い値を示していてより正
確な測定結果であることが判った。
The results are as shown in Fig. 5 marked with △ (when the thin plate spring test piece T is taken parallel to the rolling direction) and mark (when the thin plate spring test piece T is taken perpendicular to the rolling direction). When a smooth test piece clamping plate was used, there was a variation in the measured values of around ±1000 kg/m m2, and the measured values were within a fairly small range of values, but the differences were large. When using the test piece clamping plate according to the present invention, the variation is ±200 kg/m as shown by the circle.
The measurement accuracy was improved as it became around m2, and the measured value was about 3000 kg when using the test piece clamping plate according to the present invention than when using the conventional test piece clamping plate.
/mm2 also showed a high value, and this value was close to the Young's modulus determined by a tensile test or vibration method, and was found to be a more accurate measurement result.

これは薄板ばね試験片Tを圧延方向と平行に採取した場
合の結果(△印)が特に高圧延率になると小さな値にな
っていることから圧延によって湾曲していて且つ加工硬
化して硬さがHv530前後となっているため、従来の
薄板ばね試験装置用試験片締付用板では薄板ばね試験片
Tとの接触面積が10 X 60600mm2と大きい
ので圧延による湾曲ぐせを完全に矯正するまでに圧着し
て固定端を形成できなかったのに対し、本考案に係る試
験片締付用板の場合には薄板ばね試験片Tとの接触面積
は10×10×2−22−2O0と小さいので圧延によ
る湾曲ぐせを矯正できて固定端とみなし得る条件が形成
できたことを○印が示していると考えられる。
This is because the result (△ mark) when a thin plate spring test piece T is taken parallel to the rolling direction becomes a small value especially at a high rolling rate. is around Hv530, so the contact area with the thin plate spring test piece T is as large as 10 x 60,600 mm2 in the conventional plate for tightening the test piece for the thin plate spring testing device, so it is difficult to completely correct the curved curl caused by rolling. Whereas it was not possible to form a fixed end by crimping, in the case of the test piece clamping plate according to the present invention, the contact area with the thin plate spring test piece T was as small as 10 x 10 x 2-22-2O0. It is considered that the ○ mark indicates that the curved curl caused by rolling was corrected and a condition that can be considered as a fixed end was created.

また圧延率が低い場合には上述した圧延による湾曲の影
響が少なく且つ硬さも低い値を示すので薄板ばね試験片
Tの湾曲の影響は少ないがそれでも薄板ばね試験片Tを
締め付けて固定端を形成するには薄板ばね試験片Tと薄
板ばね試験装置用試験片締付用板との接触面積が従来の
締付用板は大きいので締付応力が小さくなって完全な固
定端を形成できずにヤング率が小さな値としてしか求め
られないことが判った。
In addition, when the rolling rate is low, the influence of curvature due to rolling mentioned above is small and the hardness also shows a low value, so the influence of curvature of the thin leaf spring test piece T is small, but the thin leaf spring test piece T is still tightened to form a fixed end. In order to do this, the contact area between the thin plate spring test piece T and the test piece clamping plate for the thin plate spring testing device is large in the conventional clamping plate, so the clamping stress is small and a perfect fixed end cannot be formed. It has been found that the Young's modulus can only be determined as a small value.

以上詳述した如く本考案に係る薄板ばね試験装置用試験
片締付用板は、従来の薄板ばね試験装置用試験片締付用
板の両端に凸部を設けるだけであるから安価且つ容易に
製作できるものであるにもかかわらず、ヤング率の測定
精度を向上せしめ得ると共に測定値自体もより正確な値
に近付けることが可能であり、一方の薄板ばね試験装置
用試験片締付用板のみに本考案に係る試験片締付用板を
使用するものであるから試験片の締付時に薄板ばね試験
片の片面は本考案に係る試験片締付用板でない側の試験
片締付用板の平滑な試験片当接面全面に当接して締め付
けられるので薄板ばね試験片の締付作業時に何ら障害は
発生しないのであり、その実用的価値は非常に大きなも
のがある。
As detailed above, the plate for tightening a test piece for a thin plate spring testing apparatus according to the present invention is inexpensive and easy to use since it simply has convex portions at both ends of the plate for tightening a test piece for a conventional thin plate spring testing apparatus. Although it can be manufactured, it is possible to improve the measurement accuracy of Young's modulus and bring the measured value itself closer to the accurate value. Since the test piece clamping plate according to the present invention is used, when tightening the test piece, one side of the thin plate spring test piece is the same as the test piece clamping plate on the side other than the test piece clamping plate according to the present invention. Since it can be tightened by contacting the entire smooth test piece contact surface of the thin plate spring test piece, no trouble occurs during the tightening work of the thin plate spring test piece, and its practical value is extremely large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案に係る薄板ばね試験装置用試験片締付用
板の1実施例を用いて薄板ばね試験片を固定した状態を
示す正面図、第2図は第1図の右側面図、第3図は本考
案に係る薄板ばね試験装置用試験片締付用板を用いて薄
板ばね試験片を固定した状態の試験片締付用板部の透視
図、第4図は第3図と同じ状態の他の実施例の透視図、
第5図は本考案に係る薄板ばね試験装置用試験片締付用
板を用いた場合と用いない場合におけるヤング率測定結
果を示す図である。 1・・・・・・薄板ばね試験装置本体、1a・・・・・
・基台、1b・・・・・・柱、1C・・・・・・天板、
1d・・・・・・オネジ、1e・・・・・・ハンドル、
2・・・・・・上方の試験片締付用板、3・・・・・・
下方の試験片締付用板、A、B・・・・・・凸部、T・
・・・・・薄板ばね試験片。
Fig. 1 is a front view showing a state in which a thin plate spring test piece is fixed using an embodiment of the test piece clamping plate for a thin plate spring testing device according to the present invention, and Fig. 2 is a right side view of Fig. 1. , FIG. 3 is a perspective view of the test piece clamping plate portion in a state in which a thin plate spring test piece is fixed using the test piece clamping plate for a thin plate spring testing device according to the present invention, and FIG. A perspective view of another embodiment in the same state as
FIG. 5 is a diagram showing Young's modulus measurement results when using and not using the test piece clamping plate for a thin plate spring testing device according to the present invention. 1...Thin plate spring testing device main body, 1a...
・Base, 1b...Column, 1C...Top plate,
1d...Male thread, 1e...Handle,
2... Upper test piece clamping plate, 3...
Lower test piece clamping plate, A, B...Convex portion, T.
...Thin leaf spring test piece.

Claims (1)

【実用新案登録請求の範囲】 1 板幅がlQmm前後の薄板ばね試験片を片持梁状に
保持してヤング率を測定する薄板ばね試験装置のチャッ
ク部を構成する試験片締付用板において、薄板ばね試験
片との当接面の両端が薄板ばね試験片の長手方向と直角
方向の凸部であることを特徴とする薄板ばね試験装置用
試験片締付用板。 2 凸部が試験片締付用本体に対して交換自在である実
用新案登録請求の範囲第1項に記′載の薄板ばね試験装
置用試験片締付用板。
[Scope of Claim for Utility Model Registration] 1. In a test piece clamping plate constituting a chuck part of a thin plate spring testing device that measures Young's modulus by holding a thin plate spring test piece with a plate width of about 1Q mm in a cantilever shape. A plate for tightening a test piece for a thin plate spring testing device, characterized in that both ends of the contact surface with the thin plate spring test piece are convex portions in a direction perpendicular to the longitudinal direction of the thin plate spring test piece. 2. A plate for tightening a test piece for a thin plate spring testing device as set forth in claim 1 of the utility model registration claim, in which the convex portion is replaceable with respect to the main body for tightening the test piece.
JP12363578U 1978-09-11 1978-09-11 Test piece clamping plate for thin plate spring testing equipment Expired JPS5824192Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12363578U JPS5824192Y2 (en) 1978-09-11 1978-09-11 Test piece clamping plate for thin plate spring testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12363578U JPS5824192Y2 (en) 1978-09-11 1978-09-11 Test piece clamping plate for thin plate spring testing equipment

Publications (2)

Publication Number Publication Date
JPS5542104U JPS5542104U (en) 1980-03-18
JPS5824192Y2 true JPS5824192Y2 (en) 1983-05-24

Family

ID=29082919

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12363578U Expired JPS5824192Y2 (en) 1978-09-11 1978-09-11 Test piece clamping plate for thin plate spring testing equipment

Country Status (1)

Country Link
JP (1) JPS5824192Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4427423A (en) * 1982-02-22 1984-01-24 Corning Glass Works High aspect ratio solid particulate filtering apparatus and method of filtering

Also Published As

Publication number Publication date
JPS5542104U (en) 1980-03-18

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