JPS5821935A - Fault position detecting system for measuring information multiplex transmission system - Google Patents

Abstract

PURPOSE:To detect fault positions, by making the structure duplex between a central processor and an optical branching/connecting device. CONSTITUTION:A central processor selects either a light emitting element EO11 or EO12. The information of light emission is branched into N pieces by a star coupler SC, and these branched pieces of information are received at photodetectors OE21-OE2N provided to various types of measuring devices. The measuring devices send back the prescribed information in an opposite route and based on the received information. If no send-back information is available, the rest light emitting elements are driven by the central processr to collect the information. Fault positions can be decided from the combination of the send-back information and the used light emitting elements.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a measurement information transmission system in which a central processing unit and a plurality of oIIII measurement devices are coupled by an optical transmission line, and information can be transmitted between them by light. be.

Conventionally, optical transmission lines (
Optical fiber) Since Fi is generally expensive, the number of optical transmission lines used is reduced by optically coupling the central processing unit and multiple measuring devices through optical branching and coupling means that branch or couple optical signals. However, in such a system, if any failure occurs in the transmission of the central processing unit or measurement device, the light receiving element, or the transmission path, the transmission will be interrupted. This invention has been made in view of the above, and has the disadvantage that it is not possible to detect in which part the failure has occurred. The purpose of this system is to eliminate such defects, improve system reliability, and facilitate the detection of failure points.

The features of this invention are simply the optical transmission line and the light source.

The purpose of providing redundancy to the light receiving element is to eliminate the above-mentioned risks and to facilitate the detection of failures.

Embodiments of the present invention will be described below with reference to the drawings.

Figure 1 is a system configuration diagram showing an embodiment of this invention, $1
2- is a plotter diagram showing an outline of the measuring device O, 3rd! II is a circuit configuration diagram showing the measuring device 0Ill detail, 4th Fi is the ninth principle diagram explaining the principle of converting the transverse displacement amount into a capacitance value and detecting it, and 5Ia is the operation shown in Figure 3. In the time chart for explanation, No. 611 is a circuit diagram showing another embodiment of the capacitance detection section.

In Figure 1, 0111.0 to 12.0121~0IC
2N is a light receiving element such as a photodiode (FD)%101
1゜1012.1021~l02N is a light emitting diode (
Light emitting elements such as LID), cm ti centralized control room (panel side), SC branches two optical transmission lines into N optical transmission lines, and connects N optical transmission lines to two optical transmission lines. Star coupler (8C) optically coupled to the path, T1~'r) JFi
Measuring device installed on the field side (hereinafter also referred to as Toran Kuromo Tsuta), Ll, L2*L〒1-LT
This is an optical transmission line consisting of N#'i optical fibers.

Measuring device or trans black ivy T1~Tl; Elf! 2
1iIK As its block configuration is shown, the detection unit 1,
Detection section selection circuit 2, frequency conversion circuit 3, counter 4, tie! -5, reference clock generation circuit 6, microprocessor 7 (hereinafter also referred to as μm00M arithmetic circuit), optical transmission circuit (converters 0!21 to 012N in Figure 1, 021 to 021)
E02N K equivalent. ) 8, a power supply circuit 9 based on patch IJK, a keyboard 10, etc. Further, in this measuring device, as shown in FIG. 3, the detection section 1 is constituted by a capacitor C1.02, and the detection section selection circuit 2tj capacitor? C1, C2 $P and temperature measuring conduit? C, CM for selecting thermistor Ra
O8←complementary MOil)! Eve analog switch 8W
2 (ff21.

8W22) y), the frequency conversion circuit 3 switches the charging and discharging of the capacitors 01 and 02, and the 7rip 70
Analog switches SWI (SWI 1, 8WI 2) for clearing or resetting the knob Ql and the charging voltage of the capacitor C1 or #ic2 are set to a predetermined voltage level (threshold level) t-MJLJ-II-, Predetermined time constant (resistance Bf, capacitor C
It consists of a flip-flop Ql (D type) that is reset after a certain period of time determined by A special circuit (example: JL is a series kit circuit) is required, but when using a C-MOS type 7-lip 7-o plug, such a circuit is not required, and the switching 9 voltage can be used as the casing threshold voltage ・Timer 5/fi 2-stage counter CT2
, CTa, starts counting the clock signal given from the reference clock generation circuit 6 by canceling the reset signal PO3 from the -100M arithmetic circuit 7, and starts counting by the count-up signal from the counter (CTI) 4. stop. μmC0M calculation circuit 7Fi is driven by the clock signal from the reference clock generation circuit 6 and performs various calculations and control operations. For example, the detection section selection circuit 2
Analog switch JiiW2 F (: Sends mode selection signal POI or PO2 to select capacitor C1 measurement mode, capacitor C2 measurement mode, or temperature measurement mode (measurement on resistor R8 and capacitor C5) to prevent leakage. At regular times, a reset signal PO3 is given to the counter 4 and timer 5 to reset them, and at the time of measurement, the reset signal PO3 is released to perform counting operations, and the count-up signal from the counter 4 is used as an interrupt signal. The count output from timer 5 is read through terminals PIO to P115, and predetermined calculations are performed.μ-〇〇M calculation path 7Ktj,
An optical transmission circuit 8 consisting of a light emitting diode LED and a photodiode PD for exchanging information by light with the host computer on the management room side (panel side), and a keyboard 10. A detection circuit 11 for detecting an abnormality in the light emitting diode (when it should not be lit), a standby mode 1 path 12 for intermittently driving the reference clock generation circuit 6 and the μ-〇〇M calculation circuit 7 itself to reduce power consumption are provided. ing. Note that 9 is a ninth battery power supply circuit that supplies power to the necessary parts shown in FIG. 2 and FIG. 3.

The measuring device shown in this example converts the amount of mechanical displacement such as pressure into a capacitance value, and then converts the detection result into a digital amount for measurement. The principle will be explained with reference to FIG.

In the same figure), there is a movable electrode ELV between two fixed electrodes ELp.
is arranged, and the movable electrode ELV moves in the left and right directions (see arrow R) in the figure in response to mechanical displacement such as pressure. In this case, if one of the capacitances CA1+CA2 between the electrodes increases, the other decreases, that is, they are differentially displaced.Here, the area of each electrode is 8. The dielectric constant between the electrodes is 8, the movable electrode E
Let the distance between Lv and the fixed electrode ELF be d, and for example,
As shown by the dotted line, the capacitances CA1 and CA2 when the movable electrode zLy is displaced by jd are calculated as Considering the sum and difference, CA1 + CA2 = tA・2d/(d2−Δ, 1
2) CA2-CA2-tA・2Δd/(d2-jd2
), and therefore, taking the ratio, (CAL - CA2 ) / (CA1 + C people?) - Δ
d/d is obtained, and the displacement Δd is expressed as the capacitance value (CAI CA
2)/(CA1+CA2)K.

Similarly, I! In Figure 4 (B), two fixed electrodes ELF
When the movable electrode ELv is arranged as shown in the figure and is displaced by the dotted line position [jd in the figure due to displacement due to external pressure, etc., the result will be as follows. In this case, capacitance CA1 is fixed, CA
2 is variable, and the respective values are CA1 gAld, CA2- mA/(d+Δd) in the same way as above.
It can be expressed as Therefore, considering these differences, CA 1- CA 2 = l A @Δd/d(d+
Δd), therefore CAl-CA2 and CA2
If we take the ratio, we get (C'Al-CA2-)/CA2-Δd/d, and in any case, the amount of displacement Δd can be expressed as a function of the capacitance value. As is clear from these equations, the amount of displacement is a function only of capacitance, so it is not affected by the dielectric constant or stray capacitance between the electrodes, and therefore the amount of mechanical displacement can be accurately detected by capacitance. It becomes possible to do so.

Next, a measurement operation based on such a detection principle will be explained using mainly FIGS. 3 and 5.

In the initial state, the μm00M arithmetic circuit 7 is not given mode selection signals POI, PO2Fi, and the counter (CTI) 4 and timer 5#'i are reset by the reset signal PO3.Here, as shown in FIG. When the measurement mode signal of the capacitor C1 as shown in () is given and the reset signal PO3 is released as shown in the gs diagram (b), the capacitor C1% (7f 8W21 * SW
Since a path from I1 to resistor R1 and power source VDD is formed, capacitor C1 is charged as shown in FIG. 5(c). When this charging voltage exceeds the threshold voltage vTH of flip-frog Q1 after time t1, flip-frog Q1 is set and an output is obtained from its output terminal Q. This output is given to the resistor Rf and capacitor Cf, and is also applied to the analog switch SWI
It is also given to As a result, switch 8W12 is opened and resistor Rf and capacitor ? A charging circuit using Cf is formed. At this time, swx i is cut to the dotted line position.
Then, the discharge of conte: y t C1 is performed.

When the charging pressure of the capacitor Cf reaches a predetermined value K at a predetermined time tct* as shown in Fig. 111115 (e),
The 7-lip 70-tube Q1 is cleared, and as a result, from the 7-lip frog Q1, a constant width (tc) as shown in FIG.
output pulses are obtained. In addition, 7 lip-flop Q1
Since the analog switch SWI is also turned off by the reset, the switch 8W12tj returns to the third (2) position shown in the figure, forming a discharge circuit for the capacitor TCf. Since the above-mentioned time t1 is proportional to the size of the capacitor C1 and the resistor R, there is no constant from the output of the FFQQ1. This means that a pulse signal with a frequency proportional to the capacitance value of CI can be obtained. This pulse signal is counted by the counter 4, and when it reaches a predetermined number, it emits a pulse (count UP output) as shown in the 5th line to stop counting by the timer 5 (see Figure I!5 (G)). ). The timer 5 counts the positive pulses from the pulse generating circuit 6 upon the release of the reset signal PO3, and the counting result is calculated from the μ-C which received the UP signal from the counter 4.
The OM calculation circuit 7 selects terminals PIO~P! It is read and lost through 15.

Now, if the threshold voltage of the above-mentioned 7-lip tube Ql is 1H, it can be expressed as tl VTR-VDD (1-e-"l), and therefore the charging time of capacitor C1 is 11 (as shown in Fig. 5). ) is expressed as follows.

is expressed as 9, similarly to the above time tc4. Note that since the values of Rf and Cf are known, this tc is a constant value.

Therefore, by counting the number of Q-pulses from the reference clock generation i-path 6 until the charging and discharging operations of the capacitor C1 are counted n times, the charging and discharging time TI by the capacitor C1 can be determined by counting the count output of the timer 5.
can be found.

This charging/discharging time T1 is clear from Fig. 5), one charge (tl) is n times, while discharging (tc)
Fi - 1 time, so T1 - nJ + (n 1) tc...
・・・・・・・・・・・・・・・It can be obtained as (1). In addition, counting fcn times in this way is
This is to increase the resolution of the time measurement counter (CT2°CTa), and the number m thereof is appropriately selected depending on the output frequency of the reference clock generation circuit 6, the resistance value of the resistor R, the capacitance value of the capacitor C1, etc.

In this way, the charging and discharging time T1 of the capacitor C1 is measured, and the charging and discharging time T1 of the capacitor C1 is measured.
Only. ), the switch 8W21 is switched by the command signal POI or PO2 from the μm00M arithmetic circuit 7 to set the measurement mode of CONT +jc2, and the charging/discharging time of the capacitor C2 is measured.

Since the mode of operation here is completely the same, the explanation will be omitted, but the time chart thereof is shown in the right half of FIG. 5 as the KC2 mode. In this case, the charging/discharging time 〒2 is calculated as T2 = nt2 + (
11-1) tc...river, river, old...scream, groan value).

p-C0M performance jllll road 7 Tetj above (1),
(The following calculation is performed using equation 10.

Equation 1) for TI +72-2(n-1)t is proportional to displacement, as is clear from the explanation in the previous principle diagram, so μmC0M equation j! It can be seen that in path 7, the displacement can be measured by performing the calculations described above.

In addition, in the above, by differentially changing the capacitance of capacitor C15C2, the amount of mechanical displacement, for example, the differential pressure ΔP
However, as shown in Figure $1!6, one of the capacitors (C2) is fixed, and the other (CI
) can be measured in the same way, as is clear from the explanation of the principle diagram above. However, in this case, the pressure P is calculated instead of the above-mentioned differential pressure ΔP, and the calculation formula can be expressed as follows in the same manner as above.

In the above embodiment, the amount of mechanical displacement was converted into a capacitance value and detected, but it is also possible to convert this into a resistance frequency or voltage and detect it. FIG. 9 is a diagram showing another embodiment of the detection unit, and the seventh
LV and l are converted into resistance, FIG. 8 shows the case where they are converted into frequency, and the ninth factor is converted into voltage and detected.

In these figures, Condan? The capacitance value of C and the resistance value of resistor RC are both known, and switch SWI
1, 8W21 and flip-flop Q1 are similar to those shown in the third embodiment.O The detection principle in FIGS. 7(a) to (e)K is exactly the same as the capacitive detection principle. , the charging efficiency is calculated by using the fact that the discharge time is proportional to the product of the resistor and the capacitor, and the resistance value is determined by \. That is, in the same figure (a) K: What is shown is switch 8W21
Move it to the RX side and find its charge/discharge time 〒1, then turn the RC
Turn it to the side, calculate the charging/discharging time T2 in the same way, and calculate the resistance value of RX by the following calculation.

Similarly, what is indicated by the same (O) is the conduit in the previous example? Since it corresponds to replacing C1a and C2 with resistors R1 and R2, it can be expressed in exactly the same way as the arithmetic expression.

The case shown in Figures 9 and 7 is a case where the line resistance R4 fluctuates. Then, by sequentially switching the switches 8W21, Rz + 2R4.

2Rj and RCK charging/discharging time Tl.

Find T2 and T Measure the resistance value RX using the calculation formula.

In FIG. 8, since the frequency has already been converted by the detection section, the frequency conversion circuit as in the embodiment of FIG. 3 is not necessary, and the output from the detection section is appropriately amplified and introduced directly into the counter. Ru. In this case, the frequency (N/ri) can be found by calculating how much time T takes until the counter counts the predetermined number N.

Figure 1!9 shows the case of converting to voltage E1 and detecting it. A constant current (I) is passed through the consonde CK to charge it, and the charged voltage proportional to the required current is detected by the operational amplifier OP.
2, and input (measured) voltage E1 amplified by operational amplifier OPI into the other input of operational amplifier OP2. When the number exceeds 7, the 7 lip flop Q1 is set to 7. While charging by the capacitor C is carried out in a constant manner, the measured input voltage level gl varies, so that nine frequency signals can be obtained depending on the voltage value K. At this point, switch SW21 is set to state 1 as shown in the figure.
If the time measurement output when the output is at 1 is T2, and when the output is switched to the opposite side from that shown in the figure, it is T1, then T2 - Tl
-CX/I @El The voltage El can be found by the calculation 0, where ■ is the constant voltage given to the capacitor C' R5
Is Cz Condan? This is the capacitance value of C.

The nine measuring devices or transmitters configured as described above split light into 2:N and N as shown in Figure 1.
:2 is connected to the central processing unit in the central control room via a star coupler. That is, the optical transmission line L
1*L2 is duplexed, and along with the duplexing, the central processing unit in the control room CE has two pairs of emitters and light-receiving elements EOII.
, EO12 and 0111, 0E12 are provided.

and \, the fault location detection method will be explained with reference to FIG. 1 again.

First, the light emitting element E011 or EO12 in the control room CE
select one of them and issue the appropriate information. The information is given to the star coupler 8C via one of the optical transmission lines L1*L2, and is branched into N pieces at and\. ! 'DI! The information branched to I is further received by the light receiving elements 0E21 to 0E2N of each transmitter via the optical transmission lines LTI to l7rNt. Based on this received information, each transmitter transmits the necessary information to the light emitting element E.
Go to the control room C via O21-EO2N and take the opposite route to the above.
Since the information is returned to I, the central processing unit in the control room CE determines whether or not predetermined information based on the above command information is returned, and the machine diagnoses the location of the failure point based on the content of the returned information. Now, for example, the light receiving element 0) C1l on the central II & coral device side
Assume that the engine is malfunctioning. However, here it is assumed that two or more failure locations do not occur in the same 11 locations.

In this case, when command information is sent from the blind light emitting element 1011, the returned information is transmitted from the transotters T1 to TN to the optical transmission line Ll via the star cube 'y8C.

Since the information is returned to L2, the light receiving element 01812 receives the returned information, but the light receiving element 01CII cannot receive it because it is out of order. The same goes for the case where the Yabari 9 light receiving element 01CII cannot receive the return information.For example, if the light emitting element Foil is out of order, select the bare light emitting element E011 and send the command information. Even if the light emitting element is originally malfunctioning, the light receiving element ogt1.ox12 will be able to receive the information. Only when the light emitting element EO12 is selected and the command information is emitted, both light receiving elements 0E11 and 0E12 will be able to receive the information. information will be received.

Furthermore, for example, considering a case where the transmission line Ll is out of order, in this case as well, when the light emitting element EOII is selected, the light receiving elements OEI 1 and 0E12 cannot receive information, but when the light emitting element 1012 is selected, the light receiving element OEI 1 and 0E12 cannot receive information. 0E12
Predetermined information is received only by the user. Similarly, below,
These failure positions and light receiving element 0E11.0IC1
The relationship between the presence (0), absence (X), and & of the received information received by 2K> is summarized as shown in the following table. Note that (→ is the case when the light emitting element E011 is selected and the command information is sent out).
This is the case when the fl/Ii light emitting device has a total of O129 light emitting devices.

Table As is clear from the table above, the pairing of the presence or absence of received information in the light receiving elements 01CII and 0112 differs depending on the fault location, so the central processing unit in the control room CE should check this pattern. It is possible to know whether a failure is occurring at the location. In addition, the optical transmission line LTI""L
TN=light emitting element E021 to KO2'N.

Transmitter 1 including light receiving elements 0E21 to 0N2N
~In the TN system, which transmission line (LTI~I, TN)
Yuko Matake (0121~2N, KO21~2N)
Although it is not possible to determine whether a failure has occurred in the star coupler SC, by checking the contents of the returned information, it is possible to know in which transformer system beyond the star coupler SC a failure has occurred.

As described above, according to the present invention, the optical transmission line is duplicated, and two pairs of light emitting and light receiving elements are provided in the central processing unit in the management room in response to the duplexing, thereby increasing the reliability of the system. This improves the accuracy and makes it extremely easy to detect the location of a fault.

[Brief explanation of the drawing]

Fig. 1 is a system configuration diagram showing an embodiment of this invention;
The figure is a block diagram showing the outline of the measuring device t (transmitter), Figure 3 is a circuit diagram showing the details of the measuring device (transmitter), and Figure 4 is converting the amount of mechanical displacement into a capacitance value. A principle diagram for explaining the principle of conversion and detection, Figure 5 is a time chart for explaining the operation of Figure 3, and Figure 6 is a diagram for explaining the principle of conversion and detection.
The figure is a circuit diagram showing another embodiment of the capacitance value detection section, FIG. 7 is a circuit diagram showing an embodiment of the resistance detection section, FIG. 8 is a circuit diagram showing an embodiment of the frequency detection section, and FIG. 9 is a circuit diagram showing an embodiment of the frequency detection section. FIG. 2 is a circuit diagram showing an example of a voltage detection section. Description of symbols 1...detection section, 2...detection section selection circuit, 3...frequency conversion circuit, 4...counter, 5...timer,
6...Reference clock pulse generation circuit, 7...μmC
0M operation
-・Centralized control room, OEl 1゜0K12, 0E21~
0E2N...Photodetector, EOII, KO12・]1C
021~KO2N...Light emitting element, L11L2#LT
11LTN--Optical transmission line, 8C...Coupler, T1~
TN-・Measuring device (transformer claw), 8W1,
8W2...analog switch, CTI~CT3-・counter, Ql...7 lipfrog, OPI,
OF2...Operation amplifier agent Akira Namiki, patent attorney
Husband's agent: Kiyoshi Matsuzaki, patent attorney

Claims (1)

[Claims] In order to split the light in one direction and combine the light in the working meat, the central 461m device on the 1st side and the fixed device of Fengyu are optically coupled through the optical splitting scissors and the combining means, and the central processing In a measurement information multiplex transmission system in which each measurement information from a certain device is multiplexed and transmitted based on an O command from the device,
The optical transmission path between the central processing unit and the light-separating and combining means is duplicated, and two pairs of light-emitting and light-receiving elements are provided in the central processing unit in accordance with the duplexing, and the light-emitting element is connected to the central processing unit. A command is issued to each measuring device by alternately selecting one of the above, and the information returned from the stand measuring device based on the armpit command is sent to the light receiving element in the central processing unit via the optical branch, coupling means, and optical transmission line. 1. A failure location detection method in a measurement information multiplex transmission system, characterized in that the location of the failure can be detected by checking whether or not the information is received or the contents of the reception.