JPS58213653A - Glass having low reflectance - Google Patents

Glass having low reflectance

Info

Publication number
JPS58213653A
JPS58213653A JP9220882A JP9220882A JPS58213653A JP S58213653 A JPS58213653 A JP S58213653A JP 9220882 A JP9220882 A JP 9220882A JP 9220882 A JP9220882 A JP 9220882A JP S58213653 A JPS58213653 A JP S58213653A
Authority
JP
Japan
Prior art keywords
integer
glass
group
thin film
low reflectance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9220882A
Other languages
Japanese (ja)
Inventor
Yoshio Oda
小田 「よし」男
Hitoshi Matsuo
仁 松尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AGC Inc
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Priority to JP9220882A priority Critical patent/JPS58213653A/en
Publication of JPS58213653A publication Critical patent/JPS58213653A/en
Pending legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/28Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material
    • C03C17/30Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material with silicon-containing compounds

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Surface Treatment Of Glass (AREA)

Abstract

PURPOSE:A glass, having a low reflectance, prepared by forming a thin film consisting of a fluorosilicate compound of an amine containing a polyfluoroalkyl group on the glass surface, and capable of lasting the performance thereof for a long term. CONSTITUTION:A glass, having a low reflectance, prepared by forming a thin film of <=1mu thickness consisting of a fluorosilicate compound of an amine, containing a polyfluoroalkyl group (Rf), and expressed by formula I (Rf is 1-20C polyfluoroalkyl group which may contain an ether linkage; Q is bifunctional organic group; X, Y and Z are H or monofunctional organic group; a is an integer 1-3; b is 0 or an integer 1-3; c is an integer 1 or 2; d is an integer 4-6; e is 0 or an integer 1 or 2) on the surface thereof. The group Rf in formula I is preferably a group, containing the perfluoroalkyl group or ether linkage, and expressed by formula II and particularly a 4-12C perfluoroalkyl group, and m is an integer 2-10.

Description

【発明の詳細な説明】 本発明はガラス表面の反射性を低下させた低反射率ガラ
スに関し、更に詳しく言へば、ポリフルオロアルキル基
含有アミンのフッ化ケイ酸塩化合物からなる薄膜をガラ
ス表面に形成・した低反射率ガラスに関するものである
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a low reflectance glass in which the reflectivity of the glass surface is reduced. This relates to low reflectance glass formed in

建築物の窓ガラス、車輌の窓ガラス、ガラスドアー、シ
ョーウィンドー、ショーケース、光学レンズ、光学機器
類のガラス、メガネレン′ズなどは太陽光、照明光の反
射によるギラツキや眩しさ、あるいは周囲の景観が映シ
、透視性や透明性に支障をもたらしている。
Building window glass, vehicle window glass, glass doors, show windows, showcases, optical lenses, glass for optical equipment, eyeglass lenses, etc. may be exposed to glare or dazzle due to sunlight, reflections of lighting, or the surroundings. The landscape is causing problems with projection, visibility and transparency.

一方、近年、省エネルギー政策から太陽光の利用が進め
られ、集熱効率を向上させた太陽熱集熱器が開発されて
いて、効率全増大するには集熱部に用いるガラスなどの
透光材料の反射損失を除去又は低減化させ、大量のエネ
ルギーを通過させることが必要となっている。
On the other hand, in recent years, the use of sunlight has been promoted due to energy conservation policies, and solar heat collectors with improved heat collection efficiency have been developed. There is a need to eliminate or reduce losses and allow large amounts of energy to pass through.

従来から、ガラス表面の反射防止法は洋学部品全中心に
開発が進められていて、ガラス表面に金属酸化物、金属
フッ化物、金属窒化物などの薄膜を設ける真空蒸着法あ
るいはスパッタリング法が光学レンズ、メガネレンズ、
フィルターなどに実用化されている。又、ガラス表面に
高分子物質からなる低反射処理剤を塗布、吹付け、ある
いは浸漬することにより処理剤の塗膜を形成する処理剤
及び処理方法が提案されている0 しかしながら、上記方法において、真空蒸着法あるいは
スパッタリング法は装置の機構上及びコスト面から適応
物品は小型精密光学部品に限定され、又連続的製造には
適していない。低反射処理剤の塗膜を吹付は法、浸漬法
などにより形成する方法では、形成された低反射塗膜が
、ガラスの洗浄作業によって剥離するなど、処理剤の耐
久性あるいは耐候性に欠点がある。
Conventionally, anti-reflection methods for glass surfaces have been developed for all Western-style parts, and vacuum evaporation or sputtering methods are used to form thin films of metal oxides, metal fluorides, metal nitrides, etc. on the glass surface for optical lenses. , glasses lenses,
It is put into practical use in filters, etc. Furthermore, a treatment agent and a treatment method have been proposed in which a coating film of the treatment agent is formed by applying, spraying, or dipping a low-reflection treatment agent made of a polymer substance on the glass surface. However, in the above method, The vacuum evaporation method or the sputtering method is limited to small precision optical parts due to the mechanism and cost of the equipment, and is not suitable for continuous manufacturing. Methods of forming low-reflection coatings by spraying, dipping, etc. have drawbacks in the durability or weather resistance of the treatment agents, such as the formed low-reflection coatings peeling off during glass cleaning operations. be.

本発明者は、上記の如き問題点の認識に基づいて、ガラ
スの透視性、透明性を損うことなく、吹付は法、浸漬法
など既知の方法によってガラス表面に低反射処理剤の薄
膜を形成し、その性能が長期にわたり持続され得る低反
射率ガラスを提供すべく種々研究、検討を重ねた結果、
ポリフルオロアルキル基含有化合物(以下、Rff含有
化合物と略す)はフッ素原子の分極率が小さく、従って
屈折率も低く、例えばC8F18の屈折率(25℃、以
下同じ)は1.271、(04F9)3Nは1.290
、(CF、 : CF2/C’F30CF=CF2)の
重合体はLaB5であシ、ガラス表面に薄膜を形成する
ことにより低反射率ガラスが、得られること、又Rff
含有化合物をガラス表面へ強固に接着して低反射性を長
期間吟わたり持続するためには、ガラス表面の5iOH
基と反応する一8i −0−R、−8i−Hal (H
alはハロゲン)の存在が好ましく、ガラス表面に化学
的に接着することが可能となることから、Rff含有化
合物のフッ化ケイ酸塩が優れていること、更にRf基基
含有化合物子アミン塩することによυ、薄膜の硬度ケ著
るしく向上させるという事実を見出したものである。
Based on the recognition of the above-mentioned problems, the present inventor applied a thin film of a low-reflection treatment agent to the glass surface by a known method such as a spraying method or a dipping method without impairing the visibility and transparency of the glass. As a result of various research and consideration in order to provide low-reflectance glass that can be formed and maintain its performance for a long period of time,
Polyfluoroalkyl group-containing compounds (hereinafter abbreviated as Rff-containing compounds) have a small polarizability of fluorine atoms, and therefore a low refractive index. For example, the refractive index of C8F18 (25°C, the same hereinafter) is 1.271, (04F9) 3N is 1.290
, (CF, : CF2/C'F30CF=CF2) polymer is LaB5, low reflectance glass can be obtained by forming a thin film on the glass surface, and Rff
In order to firmly adhere the contained compound to the glass surface and maintain low reflectivity over a long period of time, 5iOH on the glass surface must be
-8i -0-R, -8i-Hal (H
Al is a halogen) is preferable, and the Rff-containing compound fluorosilicate is superior because it enables chemical adhesion to the glass surface. In particular, we have discovered that the hardness of thin films can be significantly improved.

かくして、本発明は上記知見に基づいて完成されたもの
であり、一般式 %式%) で表わされるRf基含肩アミンのフッ化ケイ酸′ 塩化
合物からなる1μ以下の薄膜をガラス表面に形成したこ
とを特徴とする低反射率ガラスを提供するものである。
Thus, the present invention has been completed based on the above findings, and involves forming a thin film of 1 μm or less on a glass surface, consisting of a fluorosilicate compound of an Rf-group shoulder-containing amine represented by the general formula %. The present invention provides a low reflectance glass characterized by the following characteristics.

上記一般式において、RfUf素数1〜20個のポリフ
ルオロアルキル基であって、パーツ望ましく、特に炭素
数4〜12個のパーフルオロアルキル基、mは2〜10
の整数であるのが好適である。Qは二価の有機基、X、
Y及び2は水素原子又は−価の有機基であり、al”l
:1〜3の整数、bはO又は1〜3の整数、Cは1又は
2の整数、dは4〜6の整数、eは0又tI′il〜2
の整数である。
In the above general formula, RfUf is a polyfluoroalkyl group having 1 to 20 prime numbers, preferably a perfluoroalkyl group having 4 to 12 carbon atoms, m is 2 to 10
Preferably, it is an integer of . Q is a divalent organic group,
Y and 2 are hydrogen atoms or -valent organic groups, al"l
: an integer of 1 to 3, b is O or an integer of 1 to 3, C is an integer of 1 or 2, d is an integer of 4 to 6, e is 0 or tI'il~2
is an integer.

而して、上記のR4基含有アミンは種々の方法あるいは
経路で入手され得るが、特公昭45−35523号公報
、特開昭52’−118406号公報、あるい−二米国
特許第2,803,656号などに記載されている方法
により合成することができる。例えはRfOH2CH2
f−とNH(CH3ン、をピリジン溶媒中で反応させる
ことにより RfCH2C12N(CH3)2が合成さ
れ、又R1−Coo CH3をNH2(CH2)3N(
C’H3)2とアルコール溶媒中で反応することによυ
RfCONH(CH2)3N(CH3)2が合成される
The above-mentioned R4 group-containing amine can be obtained by various methods or routes; , No. 656, etc. For example, RfOH2CH2
RfCH2C12N(CH3)2 is synthesized by reacting f- and NH(CH3-) in a pyridine solvent, and R1-Coo CH3 is synthesized by reacting NH2(CH2)3N(
By reacting with C'H3)2 in an alcoholic solvent, υ
RfCONH(CH2)3N(CH3)2 is synthesized.

かかるRff含有アミンをフッ化ケイ酸と反応させるこ
とにより Rff含有アミンのフッ化ケイ酸塩化合物が
得られるが、反応は、例えばRff含有アミンをア、七
トン中で攪拌しながら、フッ化ケイ酸水溶液2o〜10
0℃の温度にて滴下することにより行なわれ、1分〜1
0時間で完結する。
A fluorosilicate compound of an Rff-containing amine can be obtained by reacting such an Rff-containing amine with fluorosilicic acid. Acid aqueous solution 2o~10
It is carried out by dropping at a temperature of 0°C, and is carried out for 1 minute to 1 minute.
Completed in 0 hours.

上記一般式のRf基含有アミンのフッ化ケイ酸塩化合物
としては、例えば (RfCH2CH2CH2,)2 ’ SI Fa”θ
Examples of the Rf group-containing amine fluorosilicate compound of the above general formula include (RfCH2CH2CH2,)2' SI Fa"θ
.

0 (RfCH2CH,N(CH3)2H):$、 sa、
F62θ。
0 (RfCH2CH,N(CH3)2H): $, sa,
F62θ.

(Rfconu(CH2)3N(CH3)2H)226
)、 sIF、”’。
(Rfconu(CH2)3N(CH3)2H)226
), sIF,”'.

(RfSO2NH(CH2)3N(CH3)2H)、”
 SiF、”’ 。
(RfSO2NH(CH2)3N(CH3)2H),”
SiF,”'.

(Rf C0NH(CH2)2NH2(CH2)35i
(OC2H5)3)2”■−84F、”θ。
(Rf C0NH(CH2)2NH2(CH2)35i
(OC2H5)3)2”■-84F,”θ.

咄 (RfCH2CH2N(CH3)2H)21  (Si
F4 (OH)2 )2e+(RfCH2CH21J(
(:H3)2H)22■・(SiF、 (OCOCH8
)2)20が挙げられる。
咄(RfCH2CH2N(CH3)2H)21 (Si
F4 (OH)2 )2e+(RfCH2CH21J(
(:H3)2H)22■・(SiF, (OCOCH8
)2)20 are mentioned.

かくして得〜られるRf基含有アミンのフッ化ケイ酸塩
化合物は、ガラスの低反射処理剤として優れた効果金示
すが、更に撥水撥油剤としての効果も優れている。該化
合物は単独で用い得るが、エチルシリケート、クロロシ
ラン、シランカップリング剤などを1種又は2棟以上混
合することも可能である。ガラス表面への使用形態は常
法に従って、溶剤溶液、溶媒分散液、乳濁液、エアゾー
ルなど任意の形態に調製され得るが・更に他めRf基含
有重合体、プレンダーなどを混合してもよく、又、帯電
防止剤、架橋剤など適宜添加剤を添加することもできる
The thus obtained Rf group-containing amine fluorosilicate compound exhibits excellent effects as a low-reflection treatment agent for glass, and is also excellent as a water and oil repellent. These compounds can be used alone, but it is also possible to mix one or more of ethyl silicate, chlorosilane, silane coupling agents, etc. The form of use on the glass surface can be prepared in any form such as a solvent solution, solvent dispersion, emulsion, or aerosol according to a conventional method, but it may also be mixed with other Rf group-containing polymers, blenders, etc. Additionally, appropriate additives such as antistatic agents and crosslinking agents may be added.

Rf基含有アミンのフッ化ケイ酸塩化合物からなる低反
射処理剤は溶剤に対してo、 i〜20重量%の溶剤溶
液として調製するのが好ましい。
The low-reflection treatment agent made of a fluorosilicate compound of an Rf group-containing amine is preferably prepared as a solution in a solvent containing 0.1 to 20% by weight based on the solvent.

而して、かかる溶剤溶液型低反射処理剤のガラス表面へ
の薄膜形成方法は、既知の吹付は法。
The method for forming a thin film of such a solvent-based low-reflection treatment agent on the glass surface is the known spraying method.

浸漬法などが採用され得るが、低反射率ガラスとして望
ましい薄膜の厚さは1μ以下、好ましく FiO,1〜
0.5μで、ある。形成される薄膜の厚さは処理条件に
よって決定され、例えば浸漬法では処理剤濃度と引上速
度の関係で決定される。
Although a dipping method or the like may be adopted, the thickness of the thin film desired as a low reflectance glass is 1μ or less, preferably FiO, 1~
It is 0.5μ. The thickness of the thin film formed is determined by the processing conditions; for example, in the case of a dipping method, it is determined by the relationship between the processing agent concentration and the pulling speed.

ガラス表面に薄膜を形成せしめた後、100%相対湿度
下、100℃以上の温度で20分間以上キユアリング処
理を施こすことにより、薄膜のガラス表面への接着を強
固なものとし、好適     □な低反射率ガラスが得
られる。
After forming a thin film on the glass surface, a curing treatment is performed at a temperature of 100°C or higher for 20 minutes or more under 100% relative humidity to strengthen the adhesion of the thin film to the glass surface, making it suitable for use at low temperatures. A reflectance glass is obtained.

本発明の低反射率ガラスの可視光における反射率fi 
0.5〜0.7%であり、通常のソーダ石灰ガラスの反
射率4.2%に対し優fLだ効果が認められる。更に、
形成された薄膜の硬度は鉛筆硬度3H〜4Hであり、R
f基含有シラン化合物のみの塗膜の4Bに対し顕著な向
上が認められる。
Reflectance fi of the low reflectance glass of the present invention in visible light
The reflectance is 0.5 to 0.7%, and an excellent fL effect is recognized compared to the reflectance of ordinary soda lime glass, which is 4.2%. Furthermore,
The hardness of the formed thin film is a pencil hardness of 3H to 4H, and R
A remarkable improvement is observed compared to 4B, which is a coating film containing only an f group-containing silane compound.

本発明の低反射率ガラスの用途は特に限定されることな
く、種々の例が挙げられ、例えば、建築物の窓ガラス、
車輌の窓ガラス、ガラスト。
The use of the low reflectance glass of the present invention is not particularly limited, and various examples include, for example, window glass of buildings,
Vehicle window glass, glass.

アー、ショーウィンドー、ショーケース5.光学機器類
のガラス、太陽光集光用ガラスなどに用いることができ
る。
Ah, show window, showcase 5. It can be used for glass for optical instruments, glass for sunlight condensing, etc.

本発明の低反射率ガラスの評価法は次の通りである。即
ち、反射率は自記分光光度計正反射光測定付属装置(日
立製作所製:323型)を使用して波長540mμの入
射角5°における反射率を測定することにより行ない、
薄膜の厚さは1タリステツプ” (Rank Tayl
or Hobson社製〕を使用して針圧全測定するこ
とによシ行ない、更に薄膜の硬度は鉛筆引かき試験機(
:rxs −に5401 )?使用して鉛筆硬度を測定
することによシ行なった〇 以下に、本発明を実施例によシ具体的に説明するが、本
発明はこの実施例のみに限定されるものではない。
The method for evaluating the low reflectance glass of the present invention is as follows. That is, the reflectance was determined by measuring the reflectance at a wavelength of 540 mμ at an incident angle of 5° using a self-recording spectrophotometer specular reflection light measurement accessory (manufactured by Hitachi, Model 323).
The thickness of the thin film is 1 step” (Rank Tail)
The hardness of the thin film was measured using a pencil scratch tester (
:rxs-5401)? The present invention will be specifically explained below with reference to Examples, but the present invention is not limited to these Examples.

実施例1 CnF2n+1CH2CH2N(CH3)2(但し、n
は 6.8゜10、.12の混合物であり、平均値9.
0 ) 108.2F(0,2モル〕、アセトーン1,
002を攪拌機金装着した5 00 ml三つロフラス
コに入れ、5℃にて攪拌しなからH2S1.F660%
水溶液482(0,2モル)を滴下し、5時間攪拌し、
反応させた。反応終了後、反応液1B、68fffiア
セトンで稀釈して100fとした溶剤溶液を調製したO 別に、洗剤及びアセトンで洗浄し、1%塩酸溶液に浸漬
後、乾燥したガラス板(ソーダ石灰ガラ、r、 3 X
 3 cm ) ′f、用意して、300 rttlの
ビーカー中に2002入った上記調製法みの溶剤溶液中
に浸漬し、引上速度1Q、 Qcrn/分で引上けた後
、100%相対湿度中、160℃で1時間キユアリング
した。処理後、ガラス表面に形成された薄膜の厚さ音測
定し、次に反射率及び薄膜の硬度を測定した。測定結果
を第1表に示す。
Example 1 CnF2n+1CH2CH2N(CH3)2 (however, n
is 6.8°10,. 12, with an average value of 9.
0) 108.2F (0.2 mol), acetone 1,
002 was placed in a 500 ml three-neck flask equipped with a stirrer, stirred at 5°C, and then mixed with H2S1.002. F660%
Aqueous solution 482 (0.2 mol) was added dropwise, stirred for 5 hours,
Made it react. After the reaction was completed, a solvent solution was prepared by diluting reaction solution 1B with 68fffi acetone to make 100fO. Separately, a glass plate (soda-lime glass, r , 3 X
3 cm) 'f, prepared, immersed in a 2002 solution of the above preparation method in a 300 rttl beaker, pulled up at a pulling rate of 1Q, Qcrn/min, and then placed in 100% relative humidity. , and cured at 160°C for 1 hour. After the treatment, the thickness of the thin film formed on the glass surface was measured, and then the reflectance and hardness of the thin film were measured. The measurement results are shown in Table 1.

実施例2〜5 実施例1のRf基含有化合物を他のRf基含有化合物に
変えた他は実施例1と同様の方法で溶剤溶液を調製し、
実施例1と同様の方法でガラス板に処理した後、薄膜の
厚さ9反射率及び、薄膜の硬度r測定した。測定結果を
第1弐に示す。
Examples 2 to 5 Solvent solutions were prepared in the same manner as in Example 1 except that the Rf group-containing compound in Example 1 was replaced with another Rf group-containing compound,
After a glass plate was treated in the same manner as in Example 1, the thickness (9) of the thin film, the reflectance (9), and the hardness (r) of the thin film were measured. The measurement results are shown in Part 2.

比較例1 実施例1のCnF2n+I CH2CH2N(CH3)
2 (但し、nは6.8.10.12の混合物であり平
均値9.0〕10ffアセトンで稀釈して1002とし
、実施例1と同様の方法でガラス板に処理した後、薄膜
の厚さ、反射率及び薄膜の硬度を測定した。
Comparative Example 1 CnF2n+I CH2CH2N(CH3) of Example 1
2 (where n is a mixture of 6.8.10.12 and has an average value of 9.0) It was diluted with 10ff acetone to give 1002, and after being treated on a glass plate in the same manner as in Example 1, the thickness of the thin film was determined. The reflectance and hardness of the thin film were measured.

測定結果を第1表に示す。The measurement results are shown in Table 1.

比較例2 実施例1で使用したと同様のガラス板を用意し、反射率
を測定した。測定結果を第1表に示す。
Comparative Example 2 A glass plate similar to that used in Example 1 was prepared, and its reflectance was measured. The measurement results are shown in Table 1.

Claims (2)

【特許請求の範囲】[Claims] (1)一般式((RfQ )a Pxb Y<−a−b
 ’。・湾−6・(Si Fa Ye )2e(但し、
上記一般式において、Rfは炭素数1〜20個のポリフ
ルオロアルキル基でエーテル結合i1個以上含んでいて
もよい、Qは二価の有機基、X、Y及び2は水素原子又
は−価の有機基であシ、aは1〜3の整数、bはO又は
1〜3の整数、Cは1又は2の整数、dは4〜6の整数
、eは0又は1〜2の整数を示す。) で表わされるRf基含有アミンのフッ化ケイ酸塩化合物
からなる1μ以下の薄膜をガラス表面に形成したことを
特徴とする低反射率ガラス。
(1) General formula ((RfQ)a Pxb Y<-a-b
'.・Wan-6・(Si Fa Ye) 2e (However,
In the above general formula, Rf is a polyfluoroalkyl group having 1 to 20 carbon atoms and may contain one or more ether bonds, Q is a divalent organic group, and X, Y and 2 are hydrogen atoms or -valent organic groups. is an organic group, a is an integer of 1 to 3, b is O or an integer of 1 to 3, C is an integer of 1 or 2, d is an integer of 4 to 6, e is 0 or an integer of 1 to 2 show. 1. A low reflectance glass characterized by forming a thin film of 1 μm or less made of a fluorosilicate compound of an Rf group-containing amine represented by the following formula on the glass surface.
(2)  Rfが炭素数1〜20個のパーフルオロアル
キル基である特許請求の範囲第1項記載の低反射率ガラ
ス。 は1以上の整数〕である特許請求の範囲第1項記載の低
反射率ガラス。
(2) The low reflectance glass according to claim 1, wherein Rf is a perfluoroalkyl group having 1 to 20 carbon atoms. is an integer of 1 or more]. The low reflectance glass according to claim 1.
JP9220882A 1982-06-01 1982-06-01 Glass having low reflectance Pending JPS58213653A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9220882A JPS58213653A (en) 1982-06-01 1982-06-01 Glass having low reflectance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9220882A JPS58213653A (en) 1982-06-01 1982-06-01 Glass having low reflectance

Publications (1)

Publication Number Publication Date
JPS58213653A true JPS58213653A (en) 1983-12-12

Family

ID=14048022

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9220882A Pending JPS58213653A (en) 1982-06-01 1982-06-01 Glass having low reflectance

Country Status (1)

Country Link
JP (1) JPS58213653A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63296002A (en) * 1987-05-28 1988-12-02 Seiko Epson Corp Surface reforming method for inorganic coating film
US5851674A (en) * 1997-07-30 1998-12-22 Minnesota Mining And Manufacturing Company Antisoiling coatings for antireflective surfaces and methods of preparation
US6277485B1 (en) 1998-01-27 2001-08-21 3M Innovative Properties Company Antisoiling coatings for antireflective surfaces and methods of preparation

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63296002A (en) * 1987-05-28 1988-12-02 Seiko Epson Corp Surface reforming method for inorganic coating film
US5851674A (en) * 1997-07-30 1998-12-22 Minnesota Mining And Manufacturing Company Antisoiling coatings for antireflective surfaces and methods of preparation
US6277485B1 (en) 1998-01-27 2001-08-21 3M Innovative Properties Company Antisoiling coatings for antireflective surfaces and methods of preparation

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