JPS58213380A - パタ−ン検査装置 - Google Patents

パタ−ン検査装置

Info

Publication number
JPS58213380A
JPS58213380A JP57094958A JP9495882A JPS58213380A JP S58213380 A JPS58213380 A JP S58213380A JP 57094958 A JP57094958 A JP 57094958A JP 9495882 A JP9495882 A JP 9495882A JP S58213380 A JPS58213380 A JP S58213380A
Authority
JP
Japan
Prior art keywords
pattern
inspection
maximum
symmetry
determining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57094958A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0115909B2 (enrdf_load_stackoverflow
Inventor
Michiaki Miyagawa
宮川　道明
Tadayuki Yamada
忠幸 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Fuji Electric Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd, Fuji Electric Manufacturing Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP57094958A priority Critical patent/JPS58213380A/ja
Publication of JPS58213380A publication Critical patent/JPS58213380A/ja
Publication of JPH0115909B2 publication Critical patent/JPH0115909B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP57094958A 1982-06-04 1982-06-04 パタ−ン検査装置 Granted JPS58213380A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57094958A JPS58213380A (ja) 1982-06-04 1982-06-04 パタ−ン検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57094958A JPS58213380A (ja) 1982-06-04 1982-06-04 パタ−ン検査装置

Publications (2)

Publication Number Publication Date
JPS58213380A true JPS58213380A (ja) 1983-12-12
JPH0115909B2 JPH0115909B2 (enrdf_load_stackoverflow) 1989-03-22

Family

ID=14124434

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57094958A Granted JPS58213380A (ja) 1982-06-04 1982-06-04 パタ−ン検査装置

Country Status (1)

Country Link
JP (1) JPS58213380A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009236786A (ja) * 2008-03-27 2009-10-15 Ohm Denki Kk 貫通孔の検査方法および貫通孔の検査装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009236786A (ja) * 2008-03-27 2009-10-15 Ohm Denki Kk 貫通孔の検査方法および貫通孔の検査装置

Also Published As

Publication number Publication date
JPH0115909B2 (enrdf_load_stackoverflow) 1989-03-22

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