JPS58205125A - Aiming mechanism - Google Patents

Aiming mechanism

Info

Publication number
JPS58205125A
JPS58205125A JP8809582A JP8809582A JPS58205125A JP S58205125 A JPS58205125 A JP S58205125A JP 8809582 A JP8809582 A JP 8809582A JP 8809582 A JP8809582 A JP 8809582A JP S58205125 A JPS58205125 A JP S58205125A
Authority
JP
Japan
Prior art keywords
reticle
aiming
sighting
parallax
reticles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8809582A
Other languages
Japanese (ja)
Inventor
Itsuro Nakatomi
中富 逸郎
Kunio Ando
邦郎 安藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujinon Corp
Technical Research and Development Institute of Japan Defence Agency
Original Assignee
Fujinon Corp
Technical Research and Development Institute of Japan Defence Agency
Fuji Photo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujinon Corp, Technical Research and Development Institute of Japan Defence Agency, Fuji Photo Optical Co Ltd filed Critical Fujinon Corp
Priority to JP8809582A priority Critical patent/JPS58205125A/en
Publication of JPS58205125A publication Critical patent/JPS58205125A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/14Viewfinders

Landscapes

  • Physics & Mathematics (AREA)
  • Astronomy & Astrophysics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Telescopes (AREA)

Abstract

PURPOSE:To perform accurate sighting operation, by correcting the position of the eye to an ocular during sighting so that the aiming point of a sighting reticle coincides with the parallax correction mark of a parallax correction reticle. CONSTITUTION:The sighting reticles 20 and parallax correction reticle 25 are arragned between an objective system 10 and an ocular system 30 on the optical axis. The parallax correction reticle 25 uses an annular pattern and the sighting reticle 20 uses a cross line; when the centers of both reticles 25 and 20 coincide with each other, the annular pattern and cross line pattern are put together and the pattern shown in a figure is observed. In this case, the position of the naked eye is on the optical axis and the position of the naked eye during sighting operation is therefore set on the optical axis easily while the patterns consisting of both reticles 245 and 20 is observed, performing accurate parallax-free sighting operation.

Description

【発明の詳細な説明】 本兄明は照準装置に関するもので、特に照準に用いられ
るレチクルの構成に係るものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an aiming device, and particularly to the structure of a reticle used for aiming.

競@による射撃を正確に行なうためには、−゛叡V(照
準眼鏡と叶はfる光学的な照準装置か用いらハる。この
ような照準装置は基本的−(&工!1図のような構成か
ら成るものであり、ス、1+91Jレンズ糸1、z1物
レンズ系1の焦点面に配置鉦さt″Lだ照準レチクル2
及び接眼レンズ系3とV+している。そして接眼レンズ
系3のPIl t)411焦点は対物レンズ1の焦点面
そし℃レチクルの位置と合わされ毛いるので、接眼レン
ズ3の図中右方から覗くことにより照準物体υ〕凛とレ
チクル0】揮とを合わせて観察できる口とIi(7,c
す、ここで照準動作が可能となる。
In order to shoot accurately, the sighting glasses and blade must be used with an optical sighting device.Such a sighting device is basically It consists of the following configuration: S, 1+91J lens thread 1, z1, located on the focal plane of object lens system 1, aiming reticle 2
and the eyepiece lens system 3. The PIl t) 411 focal point of the eyepiece system 3 is aligned with the focal plane of the objective lens 1 and the position of the reticle. The mouth and Ii (7, c
Aiming operations are now possible.

なi6、具体的には照準物体の像を正立像とじ−(曜祭
でざるようにする1こめ、正立レンズ系あるいは正立プ
リズム糸が必璧であるか、説明υ)閉略化のためこノ1
を省略し又ある。
i6, specifically, to make the image of the aiming object into an erect image (1) to make the image of the aiming object into an erect image (1, whether an erect lens system or an erect prism thread is necessary, explanation υ) of closed simplification Tameko no 1
There is also an omission.

この照準装置によハは、対物レンズ系IKよる照準物体
像が照準レチクル2のレチクルi++ (図中X印で示
す。)に児全に合致(、壬いれは、接眼レンズ系3より
覗く肉眼σ)(1/[が少々変わったとし又も、照準物
体の像とレチクル面との相対的なズレは生じない1こめ
、輸剋竿動作にはあまり差支えないものである。
With this aiming device, the aiming object image by the objective lens system IK perfectly matches the reticle i++ of the aiming reticle 2 (indicated by the X mark in the figure). Even if σ)(1/[ is slightly changed, there will be no relative deviation between the image of the aiming object and the reticle surface, so it will not affect the movement of the reticle very much.

しかしながら現実にかがる照準眼鏡を製iしまた使用す
る場合には、必すしも上述のよ、ウニ対物レンズ系の結
像位置とレチクル面の位置とは合致しないことがある。
However, when actually manufacturing and using sighting glasses, the image formation position of the objective lens system and the position of the reticle surface may not necessarily match, as described above.

例えばH(n時におけるレチクルの設置課差、まりtA
 111xどの影響による対物レンズ糸の焦点位置とし
For example, H
111x Which influence is the focus position of the objective lens thread?

チクルとの相対的なすれなどの他、使用するうえでは照
準物体までの距Sによって対物レンズ系の結像位置が変
わることから、照準物体距離に応じ1照準物体の像とレ
チクル面とσ)間には相対的なズレが生じ工くることV
Cなる。第2図はこのような理由から照準物体J】イ象
4とレチクル2のレチクル面との間にスレが生じた場合
を示すもので、第1図と共通した部材には共通符号を付
しである。このようIC照fs物体の像4とレチクル面
とが合致していないJ#酋には、嬌眼レンズ系3よりこ
れらケ覗くと、肉眼の位置に応じてこの両者°間に視差
が生ずることになる。これを第3図により説明する。第
3図は肉[Eの網膜中心の光軸が接眼レンズ系30元軸
よりhだけ上方にずれている場合をモデル的に図示した
もので、図中点Qはレチクル面が接眼レンズ系30光軸
と父わる点を示し、点Pは照準物体の像が接眼レンズ糸
30光軸と交わる点を示している1、いま点Pが接眼レ
ンズ系3の焦点位置に一玖しているとすれは、点Pな通
り接眼レンズ禾3中の点R1すなわち肉眼の網膜中心と
ほぼ同じ高さで接眼レンズ糸3に入射した光□ 紛は、接眼レンズ系30光軸と平行な光線Tとして網膜
中心P′の位置に達することになる3、一方、点Pより
Xだけ離れた点Qを通り、接眼レンズ系3中の点Rの近
傍を通る光線は、接眼レンズ系3を通った後、光線Sと
なり、網膜上でP′とは異なるQ′の位置に達する。
In addition to the relative slippage with the tickle, the imaging position of the objective lens system changes depending on the distance S to the aiming object, so the image of the aiming object and the reticle surface σ) depend on the aiming object distance. There will be a relative gap between
C becomes. For this reason, Figure 2 shows a case where scratches occur between the aiming object 4 and the reticle surface of the reticle 2, and parts common to those in Figure 1 are given common symbols. It is. In this case, when the image 4 of the IC illumination object and the reticle surface do not match, when you look into them through the eye lens system 3, a parallax will occur between the two depending on the position of the naked eye. become. This will be explained with reference to FIG. Figure 3 is a model diagram of the case where the optical axis at the center of the retina of the eyepiece [E] is shifted upward by h from the axis of the eyepiece system 30, and point Q in the figure shows that the reticle surface is located at the eyepiece system 30. Point P indicates the point where the image of the aiming object intersects the optical axis of the eyepiece thread 30.1, Now point P is at the focal position of the eyepiece system 3. The deviation is the light incident on the eyepiece thread 3 at a point R1 in the eyepiece lens 3, i.e., at approximately the same height as the center of the retina of the naked eye, as is the point P. 3. On the other hand, a ray that passes through point Q, which is X apart from point P, and passes near point R in eyepiece system 3, after passing through eyepiece system 3, reaches the position of retinal center P'. , becomes a ray S and reaches a position Q' on the retina, which is different from P'.

この時の光−8,Tのなす角θは、Xが小さい場合には
接眼レンズ系3の焦点距4をf6とすれば θ申h−x/(f’e )”     ・・・・・・(
1)として表すことができ、これが視差となって現れ、
また照準眼鏡系の惜4Mとすると、07Mが実視界に8
ける視差となり、これが照準誤差を生じさせる原因とな
り。なお山武に2いてh=o、すなわち肉眼が光軸上に
あるようにすれば0=0となって視差は生じないが、実
際の使用上においては肉眼を止蓚に光軸上に合わせ、固
定することはその確認ができないことから非常に困難で
ある。
At this time, the angle θ formed by the light -8 and T is, if X is small and the focal length 4 of the eyepiece lens system 3 is f6, then the angle θ is h−x/(f'e)”・(
1), which appears as parallax,
Also, if the aiming glasses are 4M, 07M will be 8 in the actual field of view.
This causes parallax, which causes aiming errors. Note that if you set h=o at Yamatake 2, that is, if the naked eye is on the optical axis, 0=0 and no parallax will occur, but in actual use, if you set the naked eye on the optical axis, It is very difficult to fix it because it cannot be confirmed.

なお$3図は理解を容易とするため、モデル的に図示し
たので点2点Qの間隔Xは誇舐して示しているが、実際
にはレチクルと照準物体の像とは接眼レンズ系3なdし
た場合両者ともぼけが目立たない範囲内で位vjtf&
定されるのでx O) 114は非常に小さく、従って
光線SはR八(J)ごく近傍を通ることになる。
In order to make it easier to understand, Figure 3 is shown as a model, so the distance X between the two points Q is exaggerated, but in reality, the images of the reticle and the aiming object are the same as those of the eyepiece system 3. If both are set within a range where the blur is not noticeable,
Since x O) 114 is very small, the ray S will pass very close to R8(J).

本発明は以上のような従来の照準装置のも)欠点6屏(
内ずべく、照準眼鏡系の光軸上に肉眼位置合わせ、そこ
で固定しやすいように改反したものである。本発明のか
かる目的は、照準装置におけるI′JT鋼照準レチクル
を、照準月JL・ナタ)vとfJ!差匡正用レチクルと
で構成し、−の両力のレチクルをそれぞれ元軸上に、し
か4m眼レンズ示のぼけが許容される範囲内−C!Lい
に−して配置するという構成により達成さ7Lる。以上
、麻何図面を参照しつつ本発明の−・実施例について詳
述する。
The present invention solves six drawbacks of the conventional aiming device as described above.
It has been modified so that it can be easily aligned with the naked eye on the optical axis of the sighting glasses system and fixed there. Such an object of the present invention is to provide an I'JT steel sighting reticle in a sighting device to a sighting moon (JL, Nata) v and fJ! It consists of a reticle for correction and correction, and the reticle for both forces of - is on the original axis, but the blur of the 4m eye lens is within the allowable range -C! This is achieved by arranging the 7L. The embodiments of the present invention will now be described in detail with reference to the drawings.

第4図は本発明の一実施例を示すものであり、対物レン
ズ系10と接眼レンズ系30との間にはその光軸上に照
準用レチクル20と視点匡正用レチクル25とが配置さ
れている。
FIG. 4 shows an embodiment of the present invention, in which an aiming reticle 20 and a viewpoint correction reticle 25 are arranged on the optical axis between the objective lens system 10 and the eyepiece system 30. There is.

yllえはこれらのレチクルに関し、視差匡正用レチク
ル25として第5図(4)のような円環バター/を用い
、照準用レチクルとして第5図(B) K示すような十
字線を用いると、この両レチクルの中心が合致されると
第5図(C)のパターンが観察できる。そしてこの第5
図(C)のパターンが観察されるためには、その肉眼の
位置は光軸上にあることになる。従って照準動作時にお
ける肉眼の位置は、両レチクルによって得られるパター
ンを観察しながら容易に元軸上に決められることKなり
、伐左のない正確な照準が行ない得る。
Regarding these reticles, if a circular butter as shown in Fig. 5 (4) is used as the parallax correction reticle 25 and a crosshair as shown in Fig. 5 (B) K is used as the aiming reticle, When the centers of both reticles are aligned, the pattern shown in FIG. 5(C) can be observed. And this fifth
In order for the pattern shown in Figure (C) to be observed, the position of the naked eye must be on the optical axis. Therefore, the position of the naked eye during aiming operation can be easily determined on the original axis while observing the patterns obtained by both reticles, and accurate aiming can be performed without left or right cutting.

なお、この第4図の構成において、円レチクル20.2
5はいずれも接眼レンズ系30より鍜祭されることにな
るので、これらのレチクルの配置位置は接眼レンズ系3
0からみてそのぼけが許容できる範囲内にする必要があ
る。また視差匡正をしやす(するためには、これら両レ
チクル20.25とをできるだけ離しておく。がよい。
In addition, in the configuration shown in FIG. 4, the circular reticle 20.2
5 will be exposed to the eyepiece system 30, so the placement positions of these reticles will be the same as the eyepiece system 3.
The blur needs to be within an acceptable range when viewed from 0. Also, in order to easily correct the parallax, it is best to keep the two reticles 20 and 25 as far apart as possible.

   ′古□・□第6図は本発明の他の実施例を示す。Figure 6 shows another embodiment of the present invention.

この実施例においては視差匡正用レチクルとして投影光
4律によるものを利用している。諏6図において、対物
レンズ系10、接眼レンズ系30は第4図の実施例のも
のと同等のものであり、また20mは照準用レチクル、
25aは視差匡正用レチクル、4θは投影レンズ系、b
Oは照明系、6Gはハーフミラ−そして251′は視差
匡正用レチクル25mの投影レンズ系40による儂を示
している。このように構成しても接眼レンズ系30な介
して両しナクルを鍜祭でさ、所期の目的を達成し得ると
同時に、この構成によれば視差匡正用し・ナクルを#l
巌表示として接眼Vンズ系30かし観察でさるようにな
るので、照準用レチクル20mと視差匡正用レチクルの
像25亀′とta:4a致させることかさらに容易化さ
れる。
In this embodiment, a reticle based on four laws of projection light is used as a reticle for correcting parallax. In Fig. 6, the objective lens system 10 and the eyepiece system 30 are the same as those in the embodiment shown in Fig. 4, and 20 m is an aiming reticle;
25a is a reticle for correcting parallax, 4θ is a projection lens system, b
0 is an illumination system, 6G is a half mirror, and 251' is a projection lens system 40 of a parallax correcting reticle 25 m. Even with this configuration, it is possible to achieve the desired purpose by using the eyepiece lens system 30 to illuminate both lenses.
Since the image can be seen by observing the eyepiece V-lens system 30, it is further facilitated to align the sighting reticle 20m and the image 25' of the parallax correcting reticle ta:4a.

また第6図の実施例において、20mを視走比土用レチ
クルど□ル、照準用レチクルを光11: 1式としてもよく、いずれにせよこれらのレチクルの両
方が接眼レンズ系30のボケの許容md内で銃祭できる
ようにしておくことが心安である。
Further, in the embodiment shown in FIG. 6, the 20 m visual field reticle may be used as a reticle, and the aiming reticle may be used as an optical 11:1 type, and in any case, both of these reticles may be It is safe to have a gun festival within the allowable md.

以上に述べたようK、本発明による照$装置においては
、照準動作を行う際の肉眼の位置を、容易に光軸に合わ
せ、固定することができるので、正確な照準を行なおう
とするうえで非常に実用的である。なお本発明は照準眼
鏡系においてレチクルを光軸に垂直な面内で移動させる
ボアサイトを行なった場合にも有効に利用できることは
百うまでもない。
As mentioned above, in the sighting device according to the present invention, the position of the naked eye can be easily aligned and fixed with the optical axis when aiming, so it is easy to aim accurately. It is very practical. It goes without saying that the present invention can also be effectively utilized when performing boresight in which the reticle is moved in a plane perpendicular to the optical axis in a sighting eyeglass system.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の照準装置の一例を示jJ)Aj!M構成
図である。 第2図は第1図装置にお(・て照準視差が生ずる場合の
状態図である。 第3図は第2図の状態において視差が発生する様子を説
明する説明図である。 第4図は本発明装置の一実施例を示す原理構成図である
。 第5図(At、 (Bl、(C)はそれぞれ照準用レチ
クル、視差匡正用レチクル、そして両レチクルの中心が
合致した際におけるレチクル観察パターンな示す図であ
る。 第6図は本発明装置の他の実施例を示す原理構成図であ
る。 1.10・・・対物レンズ系、2・・・照準レチクル、
3.30・・・接眼レンズ系、4・・・対物レンズ系に
よる像面、20a・・・照準用レチクル、25a・・・
視差匡正用レチクル、 40・・・投影レンズ系、  50・・・照明系、60
・・・ハーフミラ−0 第1図 wIPJd 図 (/’l)       (5)        (C
)翳 5開 第 6 図
Figure 1 shows an example of a conventional aiming devicejJ) Aj! It is a configuration diagram of M. FIG. 2 is a state diagram when aiming parallax occurs in the device shown in FIG. 1. FIG. 3 is an explanatory diagram explaining how parallax occurs in the state shown in FIG. 2. 5 is a principle configuration diagram showing an embodiment of the device of the present invention. FIG. Fig. 6 is a diagram showing the observation pattern. Fig. 6 is a principle configuration diagram showing another embodiment of the device of the present invention. 1.10... Objective lens system, 2... Aiming reticle,
3.30... Eyepiece system, 4... Image plane by objective lens system, 20a... Reticle for aiming, 25a...
Reticle for correcting parallax, 40... Projection lens system, 50... Illumination system, 60
...Half mirror-0 Figure 1 wIPJd Figure (/'l) (5) (C
) Shadow 5 Open Fig. 6

Claims (1)

【特許請求の範囲】[Claims] (1)  少なくとも対物レンズ糸と接眼レンズ糸と照
準レチクルン有する照準装置においも対物レンズ糸の焦
点thIic配置される照準レチクルを照準用レチクル
と視差匡正用レチクルとから購成し、前記照準用レチク
ルと視差匡正用レチクルとは接眼レンズ糸を曲して観察
した時、共にぼけか許容され1見える軛囲内で光軸上に
互いに離して配直し、照準時には照準用レチクルの照準
点と祝に匡正用レチクルの視差1正用マークとが重なる
様に接眼レンズに対する眼の位置を1正することにより
正確な照準動作を竹な女るようにしたことを特徴とする
照準装置、(21AI記照準用レチクルもしくは視差匡
正用レチクルの一万を投影光学系を用いた元種式レチク
ルにしたことを特徴とする特許請求の範囲第(1)項に
記載の照準装置。
(1) In an aiming device having at least an objective lens thread, an eyepiece thread, and an aiming reticle, an aiming reticle in which the focal point thIic of the objective lens thread is arranged is purchased from among an aiming reticle and a parallax correction reticle, and the aiming reticle and the aiming reticle are Parallax correction reticles are arranged so that when the eyepiece thread is bent and observed, they are spaced apart from each other on the optical axis within a range of 1 visible blur, and when aiming, they are used to correct the aiming point of the aiming reticle. An aiming device, characterized in that the position of the eye relative to the eyepiece is corrected by 1 so that the parallax mark on the reticle overlaps with the 1st parallax mark, so that accurate aiming operation can be performed in a straight forward manner (21 AI aiming reticle Alternatively, the aiming device according to claim 1, wherein 10,000 of the parallax correcting reticles are original type reticles using a projection optical system.
JP8809582A 1982-05-26 1982-05-26 Aiming mechanism Pending JPS58205125A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8809582A JPS58205125A (en) 1982-05-26 1982-05-26 Aiming mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8809582A JPS58205125A (en) 1982-05-26 1982-05-26 Aiming mechanism

Publications (1)

Publication Number Publication Date
JPS58205125A true JPS58205125A (en) 1983-11-30

Family

ID=13933306

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8809582A Pending JPS58205125A (en) 1982-05-26 1982-05-26 Aiming mechanism

Country Status (1)

Country Link
JP (1) JPS58205125A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010151747A (en) * 2008-12-26 2010-07-08 Takenaka Engineering Co Ltd Sighting device of infrared sensor
JP2015132739A (en) * 2014-01-14 2015-07-23 株式会社ライト光機製作所 sighting telescope reticle mechanism
JP2019207372A (en) * 2018-05-30 2019-12-05 株式会社ニコン Reticle, reticle unit, rifle scope, and optical equipment

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS475088U (en) * 1971-02-08 1972-09-14

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS475088U (en) * 1971-02-08 1972-09-14

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010151747A (en) * 2008-12-26 2010-07-08 Takenaka Engineering Co Ltd Sighting device of infrared sensor
JP2015132739A (en) * 2014-01-14 2015-07-23 株式会社ライト光機製作所 sighting telescope reticle mechanism
JP2019207372A (en) * 2018-05-30 2019-12-05 株式会社ニコン Reticle, reticle unit, rifle scope, and optical equipment

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