JPS58200509A - Method of regulating resistance value of thin film resistor - Google Patents

Method of regulating resistance value of thin film resistor

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Publication number
JPS58200509A
JPS58200509A JP57083585A JP8358582A JPS58200509A JP S58200509 A JPS58200509 A JP S58200509A JP 57083585 A JP57083585 A JP 57083585A JP 8358582 A JP8358582 A JP 8358582A JP S58200509 A JPS58200509 A JP S58200509A
Authority
JP
Japan
Prior art keywords
thin film
resistance value
film resistor
cutting
adjusting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57083585A
Other languages
Japanese (ja)
Inventor
上間 恒明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aerojet Rocketdyne Holdings Inc
Original Assignee
Gencorp Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gencorp Inc filed Critical Gencorp Inc
Priority to JP57083585A priority Critical patent/JPS58200509A/en
Publication of JPS58200509A publication Critical patent/JPS58200509A/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は薄膜抵抗体の抵抗値を高い精度で所定の値に調
整する方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for adjusting the resistance value of a thin film resistor to a predetermined value with high accuracy.

従来の薄膜抵抗体の抵抗値調整は、予め設計値より小さ
い抵抗値に設定した薄膜抵抗体なレーザで熱的に切削し
たりサンドブラストで機械・的に切削した後測定装置で
抵抗値を測定して所定の値に調整するといういわゆるレ
ーザトリミング法やサンドブラスト法によって行なわれ
ていた。しかし、これらの方法は装置の切削精度や測定
精度に限界があるため、高い精度で所定の抵抗値に調整
することができなかった。
Conventionally, the resistance value of a thin film resistor is adjusted by thermally cutting the thin film resistor with a laser or mechanically cutting it with sandblasting, and then measuring the resistance value with a measuring device. This was done by the so-called laser trimming method or sandblasting method, in which the material was adjusted to a predetermined value. However, these methods are unable to adjust the resistance to a predetermined value with high accuracy because of limitations in the cutting accuracy and measurement accuracy of the devices.

本発明は上述の点に鑑みなされたもので、予め抵抗値の
判明している複数の抵抗・体を互いに並列に設けるとと
もに切断用導体で連結しておき、設定された抵抗値に応
じて順次切断用導体を切断することによって、全体の抵
抗値を所定の値に調整するようにしたものである。
The present invention has been made in view of the above-mentioned points. A plurality of resistors/bodies whose resistance values are known in advance are provided in parallel with each other and connected by a cutting conductor. By cutting the cutting conductor, the overall resistance value is adjusted to a predetermined value.

以下、本発明の一実施例を図面に基づいて説明する。Hereinafter, one embodiment of the present invention will be described based on the drawings.

第1図は端子(&l (B)間に形成された薄膜抵抗体
(ltJ (りの構成回路を示すもので、この薄膜抵抗
体(RAB)は大きな抵抗値を有する抵抗(Ro)(R
o)の間に調整用薄膜抵抗体(r)を直列に挿入してな
るものである。
Figure 1 shows the configuration circuit of a thin film resistor (ltJ) formed between the terminals (&l (B). This thin film resistor (RAB) is a resistor (Ro) (R
A thin film resistor (r) for adjustment is inserted in series between the resistors (r) and (o).

この調整用薄膜抵抗体(r)は、第(2n −1)番目
が抵抗値Rを有する抵抗帖)で、’fH2n番目が抵抗
値xR(x\l)を有する抵抗(xR)となるように交
互に直列接続したIJ1直列回路と、この第1曲列回路
の抵抗帆)と(xR)の接続順序を逆にし、第(2n−
1)番目が抵抗(XR)で、Qzn番目か抵抗(xR)
となるような第2直崗回路とを並列に接続し、かつ前記
抵抗値の異なる抵抗(田と(xR)とが互いに並列接続
となるように、前記第1直列回路と第2直列回路のそれ
ぞれの接続点を切断用導体(1)(2)・・・(n−1
)で接続してなるものである。
This thin film resistor for adjustment (r) is such that the (2n - 1)th resistor has a resistance value R, and the 'fH2nth resistor (xR) has a resistance value xR (x\l). The IJ1 series circuit which is alternately connected in series with
1) The th is the resistance (XR), and the Qznth is the resistance (xR)
The first series circuit and the second series circuit are connected in parallel, and the resistors (xR) having different resistance values are connected in parallel with each other. Cutting conductor (1) (2)...(n-1) at each connection point
).

このように形成された薄膜抵抗体(RAB)の端子(3
)(8)間の抵抗値RABは で表わされる。
The terminal (3) of the thin film resistor (RAB) formed in this way
) (8) The resistance value RAB is expressed by .

1番目の切断用導体(1)をレーザやサンドブラスト等
を用いて切断した場合の端子Wl (B1間の抵抗値R
AB 1は で表わされる。
Terminal Wl (resistance value R between B1) when the first cutting conductor (1) is cut using a laser, sandblasting, etc.
AB 1 is represented by .

したがって、1番目の切断用導体(11を切断したこと
による薄膜抵抗体(RAB)の抵抗値の増加分ΔR1は
、 となる。
Therefore, the increase ΔR1 in the resistance value of the thin film resistor (RAB) due to cutting the first cutting conductor (11) is as follows.

つぎに、1.3番目の切断用導体(1) (31を切断
した場合の端子(A) 031間の抵抗値RAT313
はで表わされるので、増加分ΔR□ は となる。
Next, the resistance value RAT313 between the terminal (A) 031 when the 1.3rd cutting conductor (1) (31 is cut)
Since it is expressed as , the increment ΔR□ becomes.

同様にして1,3.5番目の切断用導体(1)(31+
51を切断した場合の増加分ΔR,3,は 、となる。
Similarly, the 1st, 3.5th cutting conductor (1) (31+
The increase ΔR,3, when cutting 51 is as follows.

上述のように、切断用導体(11(3)・・・(2n 
 1)と1を単位として、その切断数を乗じた値だけ増
加する、このため、調整用薄膜抵抗体(rlの設Hの段
階でXとRを適当に決めてΔR1の大きさを予め設定し
ておけば、抵抗値調整の際切断すべき数体)を過( 宜に選ぶことにより、ΔR1のに倍の抵抗値だけ増( 加するように直線的に調整できる。したがって、第1図
に示すような薄膜抵抗体(RAB )を形成した後、端
子(A)031間の抵抗値を劇定し、増加すべき抵抗値
の大きさが判れば、この抵抗値をΔR,で割った商の数
だけ切断用導体(11(3)(51・・・と1本おきに
切断すれば所定の抵抗値にwA整することができる。
As mentioned above, the cutting conductor (11(3)...(2n
1) and 1 as a unit, it increases by the value multiplied by the number of cuts. Therefore, at the stage of setting the adjustment thin film resistor (rl), X and R are appropriately determined and the size of ΔR1 is set in advance. If this is done, it is possible to adjust linearly so that the resistance value increases by twice ΔR1 by appropriately selecting the number to be cut when adjusting the resistance value. Therefore, as shown in Figure 1. After forming a thin film resistor (RAB) as shown in Figure 3, the resistance value between terminals (A) and 031 was determined, and once the magnitude of the resistance value to be increased was determined, this resistance value was divided by ΔR. By cutting every other cutting conductor (11 (3) (51...) by the number of quotients, wA can be adjusted to a predetermined resistance value.

このときの抵抗値の精度はΔR,の大きさで決まり、こ
のΔR1を決める菫とRの値は設計の段階で任意に設定
できるので、高精度のm*ができる。
The accuracy of the resistance value at this time is determined by the magnitude of ΔR, and the values of violet and R, which determine this ΔR1, can be arbitrarily set at the design stage, so that m* can be obtained with high precision.

前記実施例では、調整用薄膜抵抗体(rlは抵抗値の異
なる2種類の抵抗(R) (xR)の並列回路を7個室
列接続した構成としたが、7個に限るものでないこと勿
論である。また、切断用導体(11(2+・・・(n−
1)11本おきに切断して抵抗値を調整する場合を税引
したが、これに限るものでなく、1本ずつ順番:二切断
したり、2本おきに切断したりして抵抗値針調整するこ
とができる。−例として、182図に六すように、抵抗
値BとxRの2種類の抵抗(R)(xR)D並列回路を
n個直列接続して調整用薄膜抵抗体r)を形成し、切断
用導体(llf2+川(n−1)を1本ずつ峡番に切断
して抵抗値を調整する場合について説明する。このとき
の端子1)ノ)間の抵抗値RCDはRCD =  2R
o  +  n−R−(力x+1 で表わされる。
In the above embodiment, seven parallel circuits of adjusting thin film resistors (rl is two types of resistors (R) (xR) with different resistance values are connected in series, but the number is not limited to seven, of course. There is also a cutting conductor (11(2+...(n-
1) The case where the resistance value is adjusted by cutting every 11th needle is excluded, but this is not limited to this. Can be adjusted. - As an example, as shown in Fig. 182, n pieces of two types of resistors (R) (xR) D parallel circuits with resistance values B and xR are connected in series to form an adjustment thin film resistor r), and then cut. We will explain the case where the resistance value is adjusted by cutting the conductor (llf2+river(n-1)) one by one into a number. In this case, the resistance value RCD between terminals 1) and 2) is RCD = 2R.
o + n-R- (represented by force x+1.

つぎに、切断用導体(1)(2)・・・(n−1)と1
番目から1本ずつ切断してに番目まで切断した場合の端
子(C1<DJ間の抵抗値RCDI〜kを考える。
Next, conductors for cutting (1), (2)...(n-1) and 1
Consider the resistance value RCDI~k between the terminals (C1<DJ) when cutting one by one from the th.

(イ) kが奇数のときのRcD1〜.はで表わされる
ので、抵抗値の増加分ΔZ1〜にはとなる。
(a) RcD1~ when k is an odd number. Since it is expressed as , the increase in resistance value ΔZ1 is as follows.

#:I)kが偶数のときの耽D1〜には・・・01j で表わされるので抵抗値の増加分Δz1〜にはとなる。#:I) When k is an even number, indulgence D1~...01j Therefore, the increase in resistance value Δz1~.

                 ・・・0υしたが
って、切断用導体(1)(2)・・・(n−1)と1番
目から順番に切断してに番目まで切断した場合の調して
直線的に(k+1)/2倍した値だけ増加するよるよう
に調整することができる。
...0υ Therefore, if the cutting conductor (1) (2) ... (n-1) is cut in order from the 1st to the It can be adjusted so that it increases by the multiplied value.

本発明は上記のように構成したので、調整用薄膜抵抗体
の切断用導体を切断して抵抗値を所定の値に調整する際
、その切断によって増加する抵抗値は予め設計の段階で
任意に設定できる。このため、従来のように、装置の切
削精度や測定精度によって精度の限界が決まることがな
く、調整精度を設計の段階で任意に調節できるので、精
度の高い抵抗値の調整が可能である。しかも切断作業で
あり調整が極めて容易にできる。
Since the present invention is configured as described above, when the cutting conductor of the thin film resistor for adjustment is cut to adjust the resistance value to a predetermined value, the resistance value increased by the cutting is arbitrarily determined in advance at the design stage. Can be set. Therefore, unlike in the past, the limit of accuracy is not determined by the cutting accuracy or measurement accuracy of the device, and the adjustment accuracy can be adjusted arbitrarily at the design stage, making it possible to adjust the resistance value with high accuracy. Moreover, since it is a cutting operation, adjustment can be made extremely easily.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による薄膜抵抗体の抵抗値調整方法の一
実施例を示す薄膜抵抗体の構成回路図、第2図は他の実
施例における薄膜抵抗体の構成回路図である。 (RAB)・・・薄膜抵抗体、(r)・・・調整用薄膜
抵抗体、(R)(XR) ・・・抵抗、(1) (2)
〜(n −1) 用切断用導体。 特許出願人 株式会社 ゼ ネ ラ ル同    上 
   加 納  −徊
FIG. 1 is a structural circuit diagram of a thin film resistor showing one embodiment of a method for adjusting the resistance value of a thin film resistor according to the present invention, and FIG. 2 is a structural circuit diagram of a thin film resistor in another embodiment. (RAB)... Thin film resistor, (r)... Thin film resistor for adjustment, (R) (XR)... Resistance, (1) (2)
~(n-1) cutting conductor. Patent applicant: General Co., Ltd. Same as above.
Kano − Wandering

Claims (1)

【特許請求の範囲】 (1)既知の抵抗体を互いに並列に設け、途中を少なく
とも1つの切断用導体で連結して調整用薄膜抵抗体とな
し、前記切断用導体を所定数だけ切断することにより抵
抗値を所定の値に調整することを特徴とする薄膜抵抗体
の抵抗値調整方法。 (2、特許請求の範囲第1項記載において、調整用薄膜
抵抗体は、抵抗値の異なる第1%IJシ薄膜抵抗体を交
互に直列に接続した直列回路と、この直列回路砿:対し
て逆の順序に第1、第2薄膜抵抗体を交互に直列に接続
した直列回路とを互+z)l二並列に接続し、前記第1
、第2薄膜抵抗体が互1.XE並列接続となるように前
記2個の直列回路の一方の接続点と他方の接続点とを切
断用導体で接続してなる薄膜抵抗体の抵抗値調整方法。 (3)  !許請求の範囲第2項記載におり)て、調整
用**抵抗体の切断用導体の切断は1本おきE切断して
抵抗値を調整するようにした薄膜抵抗体の抵抗値調整方
法。 (4)%許請求の範囲′W112項記載において′、調
整用薄膜抵抗体の切断用導体の切断は1本づつ順次連続
して切断して抵抗値を調整するようにした薄膜抵抗体の
抵抗値調整方法。
[Scope of Claims] (1) Known resistors are provided in parallel with each other and connected in the middle with at least one cutting conductor to form an adjusting thin film resistor, and a predetermined number of the cutting conductors are cut. 1. A method for adjusting a resistance value of a thin film resistor, the method comprising: adjusting the resistance value to a predetermined value. (2. In claim 1, the adjusting thin film resistor is composed of a series circuit in which 1% IJ thin film resistors having different resistance values are alternately connected in series; A series circuit in which first and second thin film resistors are alternately connected in series in the reverse order is connected in parallel with each other, and the first and second thin film resistors are connected in parallel.
, the second thin film resistor is mutually 1. A method for adjusting the resistance value of a thin film resistor, in which one connection point and the other connection point of the two series circuits are connected by a cutting conductor so as to form an XE parallel connection. (3)! A method for adjusting a resistance value of a thin film resistor according to claim 2, wherein the cutting conductor of the adjusting resistor is cut by E cutting every other conductor to adjust the resistance value. (4) % Allowable Scope of Claims 'W112' states that the resistance of a thin film resistor is such that the cutting conductor of the adjusting thin film resistor is cut one by one in succession to adjust the resistance value. Value adjustment method.
JP57083585A 1982-05-18 1982-05-18 Method of regulating resistance value of thin film resistor Pending JPS58200509A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57083585A JPS58200509A (en) 1982-05-18 1982-05-18 Method of regulating resistance value of thin film resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57083585A JPS58200509A (en) 1982-05-18 1982-05-18 Method of regulating resistance value of thin film resistor

Publications (1)

Publication Number Publication Date
JPS58200509A true JPS58200509A (en) 1983-11-22

Family

ID=13806568

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57083585A Pending JPS58200509A (en) 1982-05-18 1982-05-18 Method of regulating resistance value of thin film resistor

Country Status (1)

Country Link
JP (1) JPS58200509A (en)

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