JPS58198767A - Inspecting device of characteristic of relay - Google Patents
Inspecting device of characteristic of relayInfo
- Publication number
- JPS58198767A JPS58198767A JP8181282A JP8181282A JPS58198767A JP S58198767 A JPS58198767 A JP S58198767A JP 8181282 A JP8181282 A JP 8181282A JP 8181282 A JP8181282 A JP 8181282A JP S58198767 A JPS58198767 A JP S58198767A
- Authority
- JP
- Japan
- Prior art keywords
- machine
- case
- index table
- main body
- relay
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
- G01R31/3278—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches of relays, solenoids or reed switches
Abstract
Description
【発明の詳細な説明】
未発明は本体ボディとこの本体ボディに被せられるケー
スとからなるリレーの特性検査装置に関するものである
◎
リレーにおける特性検査には種々のものがあるが、工程
上で分類すると、本体ボディにケースを被せる前に行な
うオーバートラベル検査、接点圧検査、感動開放電圧検
査尋と、ケースを被せてから行なう接触抵抗検査や耐圧
検査等かある。りまり2種の検査工程間に、ケースと本
体ボディとの組立工程が入っているものであって、この
ために従来では両検査を夫々別の検査装置で行なってお
り、スペースが広く必要な上に装置コストも高かり魁
未発明はこのような点に鎌み為されたものでありて、そ
の目的とするところはケースと本体ボディとの組立前と
組立後との両検査を1台で行なうことができるリレーの
特性検査装置を提供するにあるO
以下本発明を図示冥施例に基いて詳述すると、図中(1
)は12分割の間欠回転駆動がなされるインデックステ
ーブルであって、インデックステーブル(11の局部上
面には全部で12個のクランプ(2)を取付けである。[Detailed Description of the Invention] The invention relates to a relay characteristic testing device consisting of a main body and a case placed over the main body.◎ There are various types of characteristic testing for relays, but they can be classified based on the process. Then, there are overtravel tests, contact pressure tests, and open-circuit voltage tests that are performed before the case is placed on the main body, and contact resistance tests and withstand voltage tests that are performed after the case is placed on the main body. The process of assembling the case and main body is included between the two types of inspection processes, and for this reason, conventionally both inspections were performed using separate inspection equipment, which required a large amount of space. Moreover, the cost of the equipment is high, and Kaimi's invention was made with this in mind, and its purpose was to use a single machine to inspect both the case and the main body before and after assembly. The present invention will be described below in detail based on an illustrated example.
) is an index table that is driven to rotate intermittently in 12 divisions, and a total of 12 clamps (2) are attached to the local upper surface of the index table (11).
このクランプ(2)は第2図に示す″ようにリレーの本
体ボディ叫をレバー(ハ)で保持するボディ保持スペー
ス伝1)と、ケース(11)をレバー(財)で保持する
ケース保持スペース−とを備えて夫々のレバー(ハ)副
の一端に図中矢印方向の圧力を適宜部材で加えることで
、共に上方に開放された両スペース圀)@の各一方が開
閉されるものである。このインデックステーブル11)
の周囲には図中時計まわり方向において0−ディシフ機
(3)、第1の検査機器(8)、本体ボディtlolの
不良品取出用アンo−ディシフ機(6)と一体になった
ケース(11)用のローディシフ機(4)、組立機(7
)、萬2の検査機器(9)、そしてアン0−ディシフ機
(6)を順に配投しである。供給コ゛ンベア(1′4か
ら供給される本体ボディ(10)は、検査機器との接続
を容易にするために端子ピンを上方に1) 突出さ
せた姿勢で切出壓のローディシフ機(3)によりインデ
ックステーブル(1)のクランプ(2)Kおけるボディ
保持スペース21)に押し込まれてクランプされる0こ
れを第0段とすると、第0〜0段におりて第1の検査機
器(8)は本体ボディ(鴎に対してコイル抵抗検査、オ
ーバートラベル検査、常閉接点の接点圧検査、感#開放
電圧検査等の測定検査を行なう。次の第0段においては
上記検査において不良品と認定された本体ボディ+10
1の取出し、又はケース(11)の0−ディフクが行な
われる。図中α鴫は不良品取出しシュート、α荀は仕分
は器、α0はケース供給コンベアである◎ケース111
)を0−ゲイーJジする0−ディシフ機(4)は第3図
に示すようにピックアップ式であって、前述のように本
体ボディ(101の不良品取出し用のピックアップ式の
アン0−ディシフ機(6)と一体に形成されている。ケ
ース1ll)はその開口面を上方とした状態で0−ディ
シフ機14)のチャック四によってり5ンプ(りのケー
ス保持スペース(財)K押し込まれる00−ディシフ機
(4)のチャック−及びアン0−ディシフ機(11)の
チャック罰は夫々の上方の開閉動力部を有するヘッド部
12!(ハ)によって開閉駆動され、また0−ディシフ
機14)とアン0−ディシフ機+51との両ヘッド部翰
(ハ)及びチャック(211咥は一体に前後動と上下動
とがなされる。As shown in Figure 2, this clamp (2) consists of a body holding space 1) that holds the main body of the relay with a lever (c), and a case holding space that holds the case (11) with a lever. By applying pressure in the direction of the arrow in the figure with an appropriate member to one end of each lever (c) and vice, each one of the two spaces ()@, both of which are open upward, can be opened and closed. .This index table 11)
Around the case (in the clockwise direction in the figure) is an integrated case (3), a first inspection device (8), and an un-o-diff machine (6) for removing defective products from the main body tlol. 11) load shift machine (4), assembly machine (7
), 2,000 inspection equipment (9), and an 0-disiff machine (6) were deployed in order. The main body (10) supplied from the supply conveyor (1'4) is placed with the terminal pin protruding upward (1) in order to facilitate connection with the inspection equipment. It is pushed into the body holding space 21) in the clamp (2) K of the index table (1) and is clamped.If this is the 0th stage, then the first inspection device (8) is at the 0th to 0th stage. Measurement tests such as coil resistance test, overtravel test, contact pressure test for normally closed contacts, and open circuit voltage test are carried out on the main body.In the next stage 0, the product is certified as defective in the above test. main body +10
1 or 0-diff of the case (11). In the figure, α 髫 is the defective product removal chute, α 荀 is the container for sorting, and α 0 is the case supply conveyor ◎ Case 111
) is a pickup type as shown in Figure 3, and as mentioned above, the main body (101) is a pick-up type un0-disiff machine for removing defective products. It is formed integrally with the machine (6).The case 1ll) is pushed into the case holding space K by the chuck 4 of the 0-diff machine 14) with its opening facing upward. The chuck of the 00-diff machine (4) and the chuck of the 0-diff machine (11) are driven to open and close by head parts 12! (c) each having an opening/closing power section above them, and the chuck of the 0-diff machine 14 ) and the un0-diff machine +51, both head parts (c) and chuck (211) move back and forth and up and down as one body.
こうして1つのクラシブ(2)Kおけるボディ保持スペ
ース−に本体ボディTl0)が、ケース保持スペース−
にケース(川が保持されると、次の第0段にνいて組立
機17)Kよりインデックステーブル(1)上で両者が
組み立てられる。組立機(7)は第4図に示すようにイ
ンデックステーブル(1)の駆動部からの入力をfア■
で受ける入力軸131)と、入力軸(財)に設は九2り
のカム(35131と、夫々軸−(B四に支持されてカ
ム@2−の回転を上下動と水平動とに変えるレバー一体
ηと、レバー俤ηによって水平移動させられるスライダ
(ハ)と、スライダーに上下動自在に支持されるととも
にレバー−によって上下に駆動させられるM動軸−と、
摺動軸−の下端に設けられたピックアップ四とで構成さ
れたものであり、本体ボディ叫をボディ保持スペース@
0からヘッド部−ηとチャック(6)とからなるピック
アップ四が上方ヘクまみ出し、次いで上方に開口したケ
ースB’u)内に上方から本体ボディ(1o)を押し込
んで、本体ボディ叫とケースl11)とを組み立てるも
のであるbこうしてインデックステーブル(1)上で組
み立てられたリレーは、次の第0〜0段にpいて第2の
検査機器(9)により接触抵抗検査、耐圧検査等の測定
検査がなされ、第[相]段にしいてアーJo−デイシジ
機(6)によりインブックステープル11)から取出さ
れ、上記検査結果に基いて仕分は器α*Kjり良品と不
良品とが仕分けられて取出しシュートQ7)に柿される
のである以上のように本発明にあっては間欠駆動される
インデックステーブル上のクランプで保持したボゲイ本
体とケースとをこのインデックステーブル上で組み立て
る組立機を有するものであり、組み立て前後の各検査を
インデックステーブル上で行なえるものであって、検査
工程が1工程で済むとともにこの1工程内で組み立ても
なされるために能率良く検査を行なえ、また検査に必要
なスペースも少なくてすむものであるDIn this way, the body holding space in one Classic (2)K is replaced by the case holding space.
When the case (river is held) is moved to the next 0th stage, the assembling machine 17) K assembles both on the index table (1). As shown in Fig. 4, the assembly machine (7) receives input from the drive section of the index table (1) from the f.
The input shaft (131) received by A lever integral η, a slider (c) that is horizontally moved by the lever η, an M moving shaft that is supported by the slider so as to be movable up and down and is driven up and down by the lever,
It consists of a sliding shaft and a pickup installed at the lower end, and the body retaining space @
From 0, the pickup 4 consisting of the head part -η and the chuck (6) extends upward, and then pushes the main body (1o) from above into the case B'u) which is opened upward, and the main body and the case are closed. The relay thus assembled on the index table (1) is transferred to the next stage 0 to 0 and subjected to contact resistance testing, voltage resistance testing, etc. using the second testing equipment (9). Measurement and inspection are carried out, and in the [phase] stage, the products are taken out from the in-book stapler 11) by the Arjo-Desiji machine (6), and based on the above inspection results, they are sorted into the machine α*Kj, and the good and defective products are sorted. As described above, the present invention has an assembling machine that assembles the body and the case held by the clamps on the index table, which is driven intermittently, on the index table. It is a device that allows each inspection before and after assembly to be performed on an index table, and since the inspection process is completed in one step and assembly is also done within this one step, inspections can be carried out efficiently, and the inspection can be carried out efficiently. D
m1図は本発明一実施例の平面図、第2図は同上のクラ
ンプの平面図、第3図(a) (b)(c)は同上のケ
−スの0−デインジ機と本体ボディのアンロープインク
機との左側面図、正面図、右側面図、第4図fa) [
b)(c) (d)は組立機の破断圧面図、破断側面図
及び部分平面図であり、(1)はインデックステーブル
、(2)はクランプ、(:Il i41は0−デインジ
機、t5) i6)はアン0−ヂインジ機、(7)は組
立機、(8)は第1の検査機器、(9)は第2の検査機
器% +10+は本体ボディ、111)はケースを示す
。
代理人 弁理士 石 1)長 七
箪ス 削
(b)
鯛1 J 關
(c)
し−一一一−−−=
第4図
(。) 14′
(d)Fig. m1 is a plan view of one embodiment of the present invention, Fig. 2 is a plan view of the same clamp, and Figs. Left side view, front view, right side view of the unrope ink machine, Fig. 4 fa) [
b) (c) (d) are a fracture pressure surface view, a fracture side view, and a partial plan view of the assembly machine, (1) is an index table, (2) is a clamp, (: Il i41 is a 0-Dinge machine, t5 ) i6) is an 0-indicator machine, (7) is an assembly machine, (8) is a first inspection device, (9) is a second inspection device%, +10+ is the main body, and 111) is the case. Agent Patent Attorney Ishi 1) Long Nanamansu (b) Sea Bream 1 J Seki (c) Shi-111---= Figure 4 (.) 14' (d)
Claims (1)
ースとからなるリレーの特性検査装置であって、間欠駆
動されるインデックステーブルと、インデックステーブ
ルに複数個設けられたクラシブと、所定位置のクランプ
に本体ボディ及びケースを夫々供給する0−デインク機
と、インデックステーブル上で本体ボディとケースとを
組み立てる組立機と、組み立てられたリレーをインデッ
クステーブルから取り出すアフローチインク機と、本体
ボディ用0−デインジ機から組立機までの間に配置した
第1の検査機器と、組立機からアシ口−ヂインク機まで
の闇に配置した第2の検査機器とを具備することを特徴
とするリレーの特性検査装置T1) A relay characteristic testing device consisting of a main body and a case placed over the main body, which includes an index table that is driven intermittently, a plurality of crassives provided on the index table, and a clamp at a predetermined position that connects the main body to the main body. an assembly machine that assembles the main body and the case on an index table, an afro-arch ink machine that takes out the assembled relay from the index table, and a 0-deink machine for the main body. A relay characteristic inspection device comprising a first inspection device placed between the assembly machine and a second inspection device placed in the dark between the assembly machine and the ink-to-ink machine.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8181282A JPS58198767A (en) | 1982-05-15 | 1982-05-15 | Inspecting device of characteristic of relay |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8181282A JPS58198767A (en) | 1982-05-15 | 1982-05-15 | Inspecting device of characteristic of relay |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58198767A true JPS58198767A (en) | 1983-11-18 |
Family
ID=13756903
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8181282A Pending JPS58198767A (en) | 1982-05-15 | 1982-05-15 | Inspecting device of characteristic of relay |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58198767A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102889954A (en) * | 2012-10-11 | 2013-01-23 | 中国计量学院 | Method for detecting contact pressure of magnetic latching relay |
CN107064647A (en) * | 2017-04-24 | 2017-08-18 | 东营市垦利区明珠电力工程有限公司 | A kind of handcart type breaker loop resistance test device |
CN107121596A (en) * | 2017-04-24 | 2017-09-01 | 李世明 | A kind of handcart type breaker loop resistance test device and its application method |
-
1982
- 1982-05-15 JP JP8181282A patent/JPS58198767A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102889954A (en) * | 2012-10-11 | 2013-01-23 | 中国计量学院 | Method for detecting contact pressure of magnetic latching relay |
CN107064647A (en) * | 2017-04-24 | 2017-08-18 | 东营市垦利区明珠电力工程有限公司 | A kind of handcart type breaker loop resistance test device |
CN107121596A (en) * | 2017-04-24 | 2017-09-01 | 李世明 | A kind of handcart type breaker loop resistance test device and its application method |
CN107121596B (en) * | 2017-04-24 | 2019-06-18 | 深圳供电局有限公司 | A kind of handcart type breaker loop resistance test device and its application method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102102830B1 (en) | Test handler, pushing device and test tray for testhandler, interface board for tester | |
US8138783B2 (en) | Testable integrated circuit and IC test method | |
US3701021A (en) | Apparatus for testing circuit packages | |
JPS58198767A (en) | Inspecting device of characteristic of relay | |
US2663844A (en) | Contact fixture | |
US4436619A (en) | Method of sorting semiconductor devices and apparatus for performing this method | |
JPH06338351A (en) | Battery inspection device | |
US4358847A (en) | Electrical circuit test apparatus and method | |
KR100217394B1 (en) | Inferior battery discharging and loading apparatus of lithium battery | |
JPH03245067A (en) | Apparatus for inspecting and sorting electric characteristics of chip part | |
JPS6111465B2 (en) | ||
JPH08334546A (en) | Testing apparatus for semiconductor device | |
US10041995B2 (en) | Test method for eliminating electrostatic charges | |
US3045184A (en) | Component sorting circuit | |
JPS6352711B2 (en) | ||
JPS60158527A (en) | Method of driving relay | |
JP2000258496A (en) | Inspection of semiconductor device and device thereof | |
JPS60152961A (en) | Contact apparatus for ic | |
JPS58124240A (en) | Inspecting unit for semiconductor device | |
KR19980084030A (en) | Selective repetitive inspection method of semiconductor chip package and inspection apparatus having jig used therein | |
JPH01253663A (en) | Burn-in method and burn-in board | |
JPS61118668A (en) | Method for inspecting shortcircuit inferiority of multi-terminal element | |
JPH02138884A (en) | Handling system of component to be tested | |
KR0131109Y1 (en) | Compulsory discharging circuit in the process of pcb assembly testing | |
JPH04274773A (en) | Inspecting apparatus of electronic component |