JPS58195276A - Method for matching pattern - Google Patents

Method for matching pattern

Info

Publication number
JPS58195276A
JPS58195276A JP57077242A JP7724282A JPS58195276A JP S58195276 A JPS58195276 A JP S58195276A JP 57077242 A JP57077242 A JP 57077242A JP 7724282 A JP7724282 A JP 7724282A JP S58195276 A JPS58195276 A JP S58195276A
Authority
JP
Japan
Prior art keywords
pattern
matching
memory
center
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57077242A
Other languages
Japanese (ja)
Other versions
JPH0145104B2 (en
Inventor
Kikuo Mita
三田 喜久夫
Moritoshi Ando
護俊 安藤
Giichi Kakigi
柿木 義一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP57077242A priority Critical patent/JPS58195276A/en
Publication of JPS58195276A publication Critical patent/JPS58195276A/en
Publication of JPH0145104B2 publication Critical patent/JPH0145104B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06VIMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00Arrangements for image or video recognition or understanding
    • G06V10/70Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/751Comparing pixel values or logical combinations thereof, or feature values having positional relevance, e.g. template matching
    • G06V10/7515Shifting the patterns to accommodate for positional errors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Databases & Information Systems (AREA)
  • Evolutionary Computation (AREA)
  • General Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Software Systems (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Character Discrimination (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE:To speed up matching and to reduce the generation of malfunction by finding a temporary pattern center having high pattern probability and moving a matching pattern successively from the center to the periphery of the input pattern to match the pattern. CONSTITUTION:The input pattern 2 of an object 1 to be recognized is read out by a TV camera 3, binary-coded by a binary-coding circuit 4 and successively stored in an input pattern memory 5 synchronusly with the scanning of the camera 3. The temporary center positions of X and Y components of a matching pattern are set up in temporary center registers 6, 7 and the temporary centers of respective components are applied to adders 11, 14. In addition, the outputs of matching scanning counters 10, 13 for the X and Y components respectively and the X and Y component outputs 8, 12 of an offset memory 9 are applied to the circuit 11, 14 and the pattern 2 in the memory 5 is read out in a consistent degree counting circuit 17 by using the outputs of the circuits 11, 14 as the addresses. Subsequetly, the mask pattern read out from a mask pattern memory 16 is successively moved to the periphery of the pattern 2 by a circuit 17 to match the pattern.

Description

【発明の詳細な説明】 (1)1発明の技術分野 本発明は入カバターンとマスクパターントノマツチング
を施行するに際しそのマツチング確率の高い位置からマ
ツチング処理を開始するようにしたパターンマツチング
方式に関する。
DETAILED DESCRIPTION OF THE INVENTION (1) 1 Technical Field of the Invention The present invention relates to a pattern matching method that starts matching processing from a position with a high matching probability when carrying out input cover pattern and mask pattern tono matching. .

(2)0発明の背景 入カバターンと予め記憶されているマスクパターンとの
一致が得られるかどうかを調べる方式には、各種の方式
が開発されているが、それらの方式は夫々固有の欠点を
包蔵しておシ、上記両パターンのマツチングを得る方式
としては、更に&良発展の余地があるのが実情である。
(2) Background of the Invention Various methods have been developed to check whether the entered cover pattern matches a pre-stored mask pattern, but each method has its own drawbacks. However, the reality is that there is still room for further development as a method for matching both of the above patterns.

(3)、従来技術と間龜点 W来のパターンマツチング方式の1つには、入カバター
ンのXY投影処理をなしそのヒストグラムからパターン
中心を求めてパターン間のマツチングを施行する方式が
ある。この方式によると、入カバターン内に生ずる小さ
な汚れにより求めんとする中心がずれミスマツチングの
原因となる。又、マスクパターンを入カバターンの端か
ら順次に移動させてマツチングをとる方式があるが、こ
の方式は処理時間が長くか\るという欠点を有する。
(3) Distance between prior art and W One of the pattern matching methods since W is a method in which an XY projection process is performed on an input pattern, the pattern center is found from the histogram, and pattern matching is performed. According to this method, a small amount of dirt generated in the input cover pattern causes the desired center to shift, causing mismatching. There is also a method of performing matching by sequentially moving the mask pattern from the end of the input pattern, but this method has the disadvantage that the processing time is long.

(416発明の目的 本発明は上述のような従来方式の有する欠点に鑑みて創
案されたもので、その目的祉高速で誤動作の少ないパタ
ーンマツチング方式を俵供することにある。
(416 OBJECTS OF THE INVENTION The present invention was devised in view of the drawbacks of the conventional methods as described above, and its purpose is to provide a pattern matching method that is high speed and has fewer malfunctions.

(5)1発明の構成 そして、この目的は入カバターンメモリに記憶された入
カバターンに対しマスクパターンメモリに記憶されたマ
スクパターンを順次に移動させながら入カバターンとマ
スクパターンとのマツチングの有無を調べるに際し、パ
ターンマツチングfi率の高いパターン仮中心を求め、
その中心からマスクパターンを入カバ!−ン周辺に向っ
て1次に移動させて入カバターンとマスクパターンとの
マツチングをとることKよって達成される。
(5) 1 Structure of the Invention The purpose of this invention is to sequentially move the mask pattern stored in the mask pattern memory with respect to the input cover pattern stored in the input cover pattern memory, and check whether or not there is a matching between the input cover pattern and the mask pattern. When investigating, find the pattern tentative center with a high pattern matching fi rate,
Insert the mask pattern from the center! - This is achieved by firstly moving the pattern toward the periphery of the pattern to match the input cover pattern and the mask pattern.

(6)1発明の寮施例   (″□ ′□、、:、・ 以下、添付図面を参照しながら、本発明の実、;、; 施例を欽明する。   :) 工+t1□0.。−−5゜オ。0.カ バターン2を有する被墾歓物で、その入カバターン2U
TVカメラ3にて読取られ、二値化回路4にて二値化さ
れ九人カバターン信号はTVカメラ3の走査と同期して
入カバターンメモリ5に順次に記憶されるように構成さ
れている。
(6) Dormitory Example of 1 Invention (''□ ′□,,:,・ Hereinafter, with reference to the attached drawings, the embodiment of the present invention will be described. :) 工+t1□0.. --5゜O.0. A cultivated animal with a cover turn 2, whose input cover turn 2U
The nine cover turn signals read by the TV camera 3 and binarized by the binarization circuit 4 are sequentially stored in the input cover turn memory 5 in synchronization with the scanning of the TV camera 3. .

6.7は夫々、仮中心記憶レジスタで、レジスタ6には
仮中心のX成分が、そしてレジスタ7には仮中心のY成
分が置かれる。この仮中心は統計的手法、例えば入カバ
ターンについて順次の移動を生ぜしめながら、パターン
マツチング度を最大にする入カバターン点が最も集まる
点を仮中心とすることによって求められる。8はオフセ
ットメモリ9のX成分オフセット量出力で、10はX成
分用マツチング走査カウンタである。レジスタ6の出力
、X成分オフセット1出力8、及び〃ウンタ10の出力
は和算回路11を経てメモリ5のXアドレッシング回路
へ′1゜ 接続されている= 1□ゆオ、ヤ1も、+V、。Yよ、オ、ヤツ:、1.て ト蓋出力で、13tiY成分用マツチング走査カウンタ
である。レジスターの出力、Y成分オフ     1セ
ント騙出力12、カウンター3の出力は和算回路14を
経てメモリ5のYアドレッシング回路へ接続されている
。そして、カウンタ13Fiカウンタ10のキャリー出
力へ接続され、カウンタ10からΦヤリーがある度毎に
1だけカウントアツプされる。又、カウンタ13のキャ
リー出力はオフセットメモリ読出しカウンタ15へ接続
され、カウンタ13から今ヤリ−がある度毎にカウンタ
13の値Filだけ進められる。
Reference numerals 6 and 7 are provisional center storage registers, in which the X component of the provisional center is placed in register 6, and the Y component of the provisional center is placed in register 7. This tentative center is determined by a statistical method, for example, by sequentially moving the incoming cover turns and setting the point where the incoming cover turn points that maximize the degree of pattern matching are most concentrated as the tentative center. 8 is the X component offset amount output of the offset memory 9, and 10 is a matching scan counter for the X component. The output of the register 6, the X component offset 1 output 8, and the output of the counter 10 are connected to the X addressing circuit of the memory 5 via the summation circuit 11. ,. Y, O, guy:, 1. This is a matching scan counter for 13tiY components. The output of the register, Y component off, 1 cent deception output 12, and the output of the counter 3 are connected to the Y addressing circuit of the memory 5 via the summation circuit 14. The counter 13Fi is connected to the carry output of the counter 10, and is incremented by 1 every time there is a Φyy from the counter 10. Further, the carry output of the counter 13 is connected to an offset memory read counter 15, and is incremented by the value Fil of the counter 13 every time there is a current value from the counter 13.

カウンタ15の出力はメモリ9のアドレッシング回路へ
接続されている。
The output of counter 15 is connected to the addressing circuit of memory 9.

カウンタ10及び13は夫々、マスクパターンメモリ1
6のXアドレッシング回路及びYアドレッシング回路へ
接続さレテイル。
The counters 10 and 13 are respectively connected to the mask pattern memory 1.
Retail connected to the X addressing circuit and Y addressing circuit of 6.

そして、メモリ5,160出力は一致度計数回路17へ
接続されている。
The outputs of the memories 5 and 160 are connected to the matching degree counting circuit 17.

次に、上記構成を有する本発明装置例についての動作を
説明する。
Next, the operation of an example of the device of the present invention having the above configuration will be described.

入カバターン2がTVカメラ3で読み取られ、その出力
が二値化回路4で二値化されて入カバターンメモリ5へ
記憶されるが、その際に統計的手法によりパターンマツ
チング度を最大にする入カバターン点が最4集まる点、
側ちパターン仮中心が求められ、そのX、Y座標の値が
仮中心記憶レジスタ6.7に記憶される。
The input cover pattern 2 is read by a TV camera 3, and its output is binarized by a binarization circuit 4 and stored in the input cover pattern memory 5. At this time, the degree of pattern matching is maximized using a statistical method. The point where up to 4 input cover turn points gather,
The tentative center of the side pattern is determined, and its X and Y coordinate values are stored in the tentative center storage register 6.7.

次いで、入カバターンメモリ50入カバターンとマスク
パターンメモリ16のマスクパターンとの間にマツチン
グが得られるか否かのマツチング走査が開始される。
Next, a matching scan is started to determine whether matching can be obtained between the cover pattern input in the input cover pattern memory 50 and the mask pattern in the mask pattern memory 16.

即ち、レジスタ6.7の値によって指定される仮中心を
基準にして、マスクパターンメモリ16の記憶全域に相
当する記憶領域が入カバターンメモリ5から切り出され
てその記憶領雛がビット直列に送出される一方、メモリ
16の内容もビット直列に送出される。これを詳しく説
明すると次のようになる。
That is, a storage area corresponding to the entire storage area of the mask pattern memory 16 is cut out from the input pattern memory 5 based on the temporary center specified by the value of the register 6.7, and the storage area is sent out in bit series. Meanwhile, the contents of memory 16 are also sent out in bit series. This can be explained in detail as follows.

マツチング走査の開始時には、メモリ9のいやれの出力
8,12も零であり、そしてカウンタ10.13は零に
リセットされる。マツチング走査の開始と共に、カウン
タは所定時間毎に1だけカウントアツプされていく。そ
の値は和算回路11でレジスタ6の値、X成分オフセッ
ト量出力8の値との和をとられてメモリ5のXアドレッ
シング回路へ供給されると共に、レジスタ7の値、Y成
分オフセット量出力12の値、及びカウンタ13の値と
の和が和算回路14でとられ、その出力値がメモリ5の
Yアビレフ2フフ回路へ供給されて、これら両和算出力
によって指定される入カバターンのビットが読出される
At the beginning of the matching scan, the outputs 8, 12 of the memory 9 are also zero and the counters 10.13 are reset to zero. At the start of the matching scan, the counter is incremented by 1 at predetermined time intervals. The value is summed with the value of register 6 and the value of X component offset amount output 8 in addition circuit 11, and is supplied to the X addressing circuit of memory 5, and the value of register 7 and the value of Y component offset amount output The sum of the value of 12 and the value of the counter 13 is taken by the summation circuit 14, and the output value is supplied to the Y-Abiref2hufu circuit of the memory 5, and the input pattern specified by the output of both sums is calculated. The bit is read.

一方、カウンタ10.13の値が夫に1メモリ16のX
、Yアビレフ2フフ回路へ供給されてそれら値によって
指定されるメモリ16のビットが読出される。
On the other hand, the value of counter 10.13 is 1 memory 16
, Y ABILEFF2FF circuit, and the bits of the memory 16 designated by these values are read out.

これらビットが一致度計数回W817で比較計数される
These bits are compared and counted in the coincidence count W817.

このようなビットの比較計数はカウンタ10.13の値
によって指定されるメモリ16のビ、7.よ104.1
.・讐′・う。。6カ、よっ、指定されるビットとの比
較計数を、カウンタ10からキャリーが出る、即ちメモ
リ16のX方向−桁分の読出しが児了する度毎にカウン
タ13の値を1だけカウントアツプさせつ\施行し、カ
ウンタ13からキャリーが出ることでメモリ16の記憶
全域のすべてのビットと、レジスタ6.7の値とオフセ
ット量出力8.12の値とで指定される上記記憶全域に
相当する開始点から、カウンタ10.13の値によって
指定されるすべてのビット(これらのビットは上記記憶
全域に相当し、メモリ5から切シ出された記憶領緘内の
各ビットである)との比較計数が終了する。その時、−
数置計数回路17から一致度を示す出力信号が出力され
る。
The comparison count of such bits is determined by the bits of memory 16 specified by the values of counters 10.13, 7. Yo104.1
..・Enemy'・U. . 6. Therefore, the value of the counter 13 is incremented by 1 each time a carry is output from the counter 10, that is, every time the reading of the X direction digits of the memory 16 is completed. Then, when a carry is output from the counter 13, all bits of the entire memory area of the memory 16 and the above memory area specified by the value of the register 6.7 and the value of the offset amount output 8.12 are allocated. Comparison from the starting point with all the bits specified by the value of counter 10.13 (these bits correspond to the above memory area and are each bit in the memory area extracted from memory 5) Counting ends. At that time, -
The numeral counting circuit 17 outputs an output signal indicating the degree of matching.

上述のようなカウンタ13からのキャリーが出る度毎に
オフセット読出しカウンタ15が1だけカウントアツプ
される。このカウントアツプ毎にメモリ5のqb出し領
域は入カバターンの周辺に向って−とに移動される。例
えば、図示の如く渦巻状に移1動される。その移動の度
毎に、メモリ16の記憶全域に相当する記憶領域   
   1がメモリ5から切り出されてこれら記憶領域の
全ビットが上述した比較計数動作に供されて、その終了
時に一致度出力信号が一致度計数回路17から出力され
る。
Each time a carry is output from the counter 13 as described above, the offset read counter 15 is incremented by one. At each count up, the qb output area of the memory 5 is moved toward the periphery of the input pattern. For example, as shown in the figure, it is moved in a spiral manner. Each time it moves, a storage area corresponding to the entire storage area of the memory 16 is stored.
1 is extracted from the memory 5, all bits of these storage areas are subjected to the above-mentioned comparison and counting operation, and at the end of the comparison, a coincidence output signal is output from the coincidence counting circuit 17.

そして、その−数置出力信号は、予め決められたレベル
の範囲にあるか否かの判定に供されつ\パターンマツチ
ングが遂行される。その判定が肯定されることでその処
理を終了する。
Then, the -number output signal is used to determine whether it is within a predetermined level range, and pattern matching is performed. If the determination is affirmative, the process ends.

上述の如く、本発明によれば、パターンマツチングの開
始点を統計的に決められるパターン仮中心(マツチング
確率の高い点)に設定して入カバターンとマスクパター
ンとのマツチングの有無を調べていくから、マツチング
の試行回数を減少させてマツチングの高速化を達成する
と共に、誤動作を少なくし得る。
As described above, according to the present invention, the starting point of pattern matching is set at the statistically determined pattern tentative center (a point with high matching probability), and the presence or absence of matching between the input cover pattern and the mask pattern is checked. Therefore, it is possible to reduce the number of matching trials, achieve high-speed matching, and reduce malfunctions.

上記実施例においては、パターン仮中心からのマスクパ
ターンの入カバターン周辺方向への移動を渦巻式に生じ
させる例について説明したが、パターン仮中心から放射
状に生じさせてもよい。
In the above embodiments, an example has been described in which the movement of the mask pattern from the temporary center of the pattern toward the periphery of the incoming pattern occurs in a spiral manner, but it may also be caused to move radially from the temporary center of the pattern.

(7)0発明の効果 以上要するに、本発明によれば、パターンマツチングの
開始点をマツチング確率の高い点に設定してマツチング
を開始させているから、マツチングの高速化を実現出来
るし、又−動作の発生も減少させる勢の効果が得られる
(7) 0 Effects of the Invention In short, according to the present invention, since the starting point of pattern matching is set to a point with a high matching probability and matching is started, it is possible to realize high-speed matching. - The effect of reducing the occurrence of motion can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

添付図面は本発明の一実施例を示す図である。 図において、bは入カバターンメモリ、6゜7Fi仮中
心記憶レジスタ、9はオフセットメモリ、10tiX成
分用マツチング走査カウンタ、1311!成分用マツチ
ング走奮カウンタ、15はオフセットメモリ訳出しカウ
ンタ、11.14は和算回路、16はマスクパターンメ
モリ、1フは一致度計数回路である。 特許出−人 富士通株式会社 −7,科j
The accompanying drawings illustrate one embodiment of the invention. In the figure, b is an input cover pattern memory, 6°7Fi temporary center storage register, 9 is an offset memory, 10tiX component matching scan counter, 1311! Component matching excitation counter, 15 an offset memory translation counter, 11.14 a summation circuit, 16 a mask pattern memory, and 1F a coincidence degree counting circuit. Patent issuer: Fujitsu Limited-7, department

Claims (1)

【特許請求の範囲】[Claims] 入カバターンメモリに記憶された入カバターンに対しマ
スクパターンメモリに記憶され九マスクパターンを順次
に移動させ壜から久方パターンとマスクパターンとのマ
ツチングをとるのに際し、パターンマツチング確率の高
いパターン仮中心を求め、該パターン仮中心から上記マ
スクパターンを上記入カバターン周辺に向って順次に移
動させて上配入カバターンと上記マスクパターンとのマ
ツチングをとることを特徴とするパターンマツチング方
式。
When matching the long pattern from the bottle with the mask pattern by sequentially moving the nine mask patterns stored in the mask pattern memory against the input cover pattern stored in the input cover turn memory, select a pattern with a high probability of pattern matching. A pattern matching method characterized in that the center is determined, and the mask pattern is sequentially moved from the temporary center of the pattern toward the periphery of the cover pattern to match the upper cover pattern and the mask pattern.
JP57077242A 1982-05-08 1982-05-08 Method for matching pattern Granted JPS58195276A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57077242A JPS58195276A (en) 1982-05-08 1982-05-08 Method for matching pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57077242A JPS58195276A (en) 1982-05-08 1982-05-08 Method for matching pattern

Publications (2)

Publication Number Publication Date
JPS58195276A true JPS58195276A (en) 1983-11-14
JPH0145104B2 JPH0145104B2 (en) 1989-10-02

Family

ID=13628388

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57077242A Granted JPS58195276A (en) 1982-05-08 1982-05-08 Method for matching pattern

Country Status (1)

Country Link
JP (1) JPS58195276A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61188676A (en) * 1985-02-15 1986-08-22 Fujitsu Ltd System for cutting out symbol area
JPS63229582A (en) * 1987-03-19 1988-09-26 Fujitsu Ltd Method and device for fingerprint image collation
US7105857B2 (en) 2002-07-08 2006-09-12 Nichia Corporation Nitride semiconductor device comprising bonded substrate and fabrication method of the same
US7301175B2 (en) 2001-10-12 2007-11-27 Nichia Corporation Light emitting apparatus and method of manufacturing the same

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61188676A (en) * 1985-02-15 1986-08-22 Fujitsu Ltd System for cutting out symbol area
JPS63229582A (en) * 1987-03-19 1988-09-26 Fujitsu Ltd Method and device for fingerprint image collation
US7301175B2 (en) 2001-10-12 2007-11-27 Nichia Corporation Light emitting apparatus and method of manufacturing the same
US7390684B2 (en) 2001-10-12 2008-06-24 Nichia Corporation Light emitting apparatus and method of manufacturing the same
US7105857B2 (en) 2002-07-08 2006-09-12 Nichia Corporation Nitride semiconductor device comprising bonded substrate and fabrication method of the same
US7378334B2 (en) 2002-07-08 2008-05-27 Nichia Corporation Nitride semiconductor device comprising bonded substrate and fabrication method of the same
US8030665B2 (en) 2002-07-08 2011-10-04 Nichia Corporation Nitride semiconductor device comprising bonded substrate and fabrication method of the same

Also Published As

Publication number Publication date
JPH0145104B2 (en) 1989-10-02

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