JPS58184677U - test probe - Google Patents
test probeInfo
- Publication number
- JPS58184677U JPS58184677U JP8213682U JP8213682U JPS58184677U JP S58184677 U JPS58184677 U JP S58184677U JP 8213682 U JP8213682 U JP 8213682U JP 8213682 U JP8213682 U JP 8213682U JP S58184677 U JPS58184677 U JP S58184677U
- Authority
- JP
- Japan
- Prior art keywords
- test
- heating element
- test pin
- cover
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のテストプローブの構成図、第２図は従来
のテストプローブの使用例を示す図、第３図は、この考
案によるテストプローブの実施例を示す図、第４図はこ
の考案によるテストプローブの部分詳細図であり、図に
おいて、１はテストピン、２はテストリード、３ａ、３
ｂはカバ一体、−４は基板、５はランド、６は防湿層、
７は電気部 −品、８は発熱体、９は絶縁体、１０は乾
電池、１１はスプリング、１２はスイッチ、１３は引出
−口である。なお、図中、同一あるいは相当部分
には同一符号を付して示しである。Fig. 1 is a diagram showing the configuration of a conventional test probe, Fig. 2 is a diagram showing an example of the use of the conventional test probe, Fig. 3 is a diagram showing an example of the test probe according to this invention, and Fig. 4 is a diagram showing an example of the use of the conventional test probe. 1 is a partial detailed view of a test probe according to the above. In the figure, 1 is a test pin, 2 is a test lead, 3a, 3
b is the cover integrated, -4 is the board, 5 is the land, 6 is the moisture barrier layer,
7 is an electric component, 8 is a heating element, 9 is an insulator, 10 is a dry battery, 11 is a spring, 12 is a switch, and 13 is a drawer opening. In the drawings, the same or corresponding parts are designated by the same reference numerals.
Claims (2)
柱状の形状をした導電体のテストピンを接触させ、上記
テストピンと電気的に接続されたテストリードから電気
信号を取り出すテストプローブにおいて、テストピンの
外周上に、テストピンと電気的に絶縁されるように発熱
体を設けるとともに、その発熱体から離れた位置には発
熱体に電力を供給する電源部および上鮎発熱体に供給す
る電力を制御するスイッチを設け、テストピンの先端を
加熱させるように構成したことを特徴とするテストプロ
ーブ。(1) In a test probe in which a conductive test pin with a pointed tip and a cylindrical shape is brought into contact with the object to be measured, and an electrical signal is extracted from a test lead electrically connected to the test pin. A heating element is provided on the outer periphery of the test pin so as to be electrically insulated from the test pin, and a power supply unit that supplies power to the heating element and a power supply unit that supplies power to the Kamiayu heating element is located at a position away from the heating element. A test probe characterized by being equipped with a switch for controlling power and configured to heat the tip of a test pin.
縁体と、発熱体と、スイッチと、および電源部を円筒状
のカバ一体に収納するとともに、テストピンの先端を上
記カバ一体より突出させ、またスイッチの操作部をカバ
一体側面より突出させ、さらにテストリードをカバ一体
に設けられた引出口より引き出しであることを特徴とす
る実用新案登録請求の範囲第（１）項記載のテストプロ
ーブ。(2) Part of the test pin, part of the test lead, insulator, heating element, switch, and power supply unit are housed in a cylindrical cover, and the tip of the test pin is integrated in the cover. The operating part of the switch is made to protrude from the integrated side surface of the cover, and the test leads are drawn out from a drawer opening provided in the cover. test probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8213682U JPS58184677U (en) | 1982-06-02 | 1982-06-02 | test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8213682U JPS58184677U (en) | 1982-06-02 | 1982-06-02 | test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58184677U true JPS58184677U (en) | 1983-12-08 |
Family
ID=30091212
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8213682U Pending JPS58184677U (en) | 1982-06-02 | 1982-06-02 | test probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58184677U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016162984A (en) * | 2015-03-05 | 2016-09-05 | 三菱電機株式会社 | Anneal apparatus |
-
1982
- 1982-06-02 JP JP8213682U patent/JPS58184677U/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016162984A (en) * | 2015-03-05 | 2016-09-05 | 三菱電機株式会社 | Anneal apparatus |
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