JPS58182290A - Method of forming thick film pattern - Google Patents

Method of forming thick film pattern

Info

Publication number
JPS58182290A
JPS58182290A JP6479282A JP6479282A JPS58182290A JP S58182290 A JPS58182290 A JP S58182290A JP 6479282 A JP6479282 A JP 6479282A JP 6479282 A JP6479282 A JP 6479282A JP S58182290 A JPS58182290 A JP S58182290A
Authority
JP
Japan
Prior art keywords
thick film
photoresist
substrate
pattern
film pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6479282A
Other languages
Japanese (ja)
Inventor
大江 明彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Avionics Co Ltd
Original Assignee
Nippon Avionics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Avionics Co Ltd filed Critical Nippon Avionics Co Ltd
Priority to JP6479282A priority Critical patent/JPS58182290A/en
Publication of JPS58182290A publication Critical patent/JPS58182290A/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 この発明咬混成集積回路用犀膜基板の製造方法に関する
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of manufacturing a rhinoceros membrane substrate for a hybrid integrated circuit.

一般に混成集積回路用厚膜基板は、ステンレスメッシJ
L勢を用いたスクリーンマスクにより、厚膜用ペースト
をセラ建ツク勢の基板に転写し、基板上に所望の回路パ
ターンを形成(スクリ−ンプリント法と呼ばれる)した
後、高湿炉で焼成する方法がとられている。このような
スクリーンプリント法では、パターンの線がスクリーン
の線と重なった場合には、f1径分だけパターンの線幅
の誤差となり、数十ミクロンという微細なパターンを印
刷することは困難であ−)た。
Generally, thick film substrates for hybrid integrated circuits are made of stainless steel mesh J
The thick film paste is transferred to a ceramic substrate using a screen mask using an L-type film, and the desired circuit pattern is formed on the substrate (called the screen printing method). After that, it is fired in a high-humidity furnace. A method is being adopted to do so. In this type of screen printing method, if the lines of the pattern overlap the lines of the screen, there will be an error in the line width of the pattern by the diameter f1, making it difficult to print patterns as fine as several tens of microns. )Ta.

また、印刷されたペーストの厚みは、主にスクリーンの
厚さとメッシ凰の空間率によりて左右されるため、所望
の厚みを出すにはかなシの熟練度が要求されていえ。
In addition, the thickness of the printed paste is mainly determined by the thickness of the screen and the porosity of the mesh screen, so it requires great skill to achieve the desired thickness.

本発明は上記のような一点に鑑みなされた屯ので、混成
集積回路用厚膜基板の製造において、簡単な操作でかつ
設備費などが少なく低コストであるという従来の厚膜の
利点を損う仁となく、よ)高精度のパターンが得られる
厚膜パターンの形成方法を提供する4のである。
The present invention was developed in view of the above points, and therefore, in the production of thick film substrates for hybrid integrated circuits, the advantages of conventional thick films such as easy operation, low equipment costs, etc., and low cost are lost. 4) provides a method for forming a thick film pattern that allows a highly accurate pattern to be obtained.

本発@になる厚膜パーーンO形成方法は、基板上に所要
の厚膜パターンを形成する方法において、基板上に所要
の厚さにフォトレジストを塗布する工程と、塗布されえ
フォトレジスト上に所要のパターンのネガフィルムを重
ね合わせて無光する工程と、露光したフォトレジストを
現像して未感光部分を除去する工程と、フォトレジスト
の除去跡に厚膜ペーストを充填する工程と、厚膜ペース
トを充填した基板を乾燥させたのち焼成して厚膜ペース
トを固化させると共にフォトレジストを除去する工程と
からなることを特徴としている。
The method for forming a thick film Pern O, which is currently being developed, is a method for forming a required thick film pattern on a substrate. A process of superimposing negative films of the desired pattern and making them non-light, a process of developing the exposed photoresist and removing the unexposed areas, a process of filling the area where the photoresist has been removed with thick film paste, and a process of forming the thick film. It is characterized by the steps of drying the paste-filled substrate, then baking it to solidify the thick film paste, and removing the photoresist.

以下、本発明の詳細に一’)9図面を参照して説明する
。第1図乃至第6図は、本発明方法の一実施例たる各工
程を示す側断面図である。なお各図において対応する部
分については同一参照番号を付した。第1gにおいて、
lはセラ建ツク等の混成集積回路用の基板であ抄、この
基板1上KPfi要の厚さ即ち形成しようとするパター
ンの厚さにフォトレジスト(感光剤)2を塗布する。フ
ォトレジスト鵞は膜厚の調節の容為さからドライフィル
ム状のものが推奨されるが、液体性の4のであってもよ
い。次に第2図に示すごとく、塗布されたフォトレジス
ト2上に所要パターンのネガフィルム3を重ね合わせて
、例えば高圧水銀灯等の適宜の光源4でもってフォトレ
ジスト2を霧光する。そして露光したフォトレジスト2
を現像して未感光部分5を除去すると、第3図に示すご
とく所要パターン部分6について基板lが露出した状態
となる。この所要パターン部分即ちフォトレジスト2の
除去跡6K、第4図に示すごとく厚膜ペースト7をゴム
スキージ、ローラ等8を用いて充填する。
Hereinafter, the present invention will be explained in detail with reference to the drawings. 1 to 6 are side sectional views showing each step of an embodiment of the method of the present invention. Note that corresponding parts in each figure are given the same reference numbers. In the 1st g,
1 is a substrate for a hybrid integrated circuit such as a ceramic structure, and a photoresist (photosensitive agent) 2 is coated on this substrate 1 to a required thickness of KPfi, that is, the thickness of a pattern to be formed. It is recommended that the photoresist be in the form of a dry film in view of the ease of controlling the film thickness, but a liquid type photoresist may also be used. Next, as shown in FIG. 2, a negative film 3 having a desired pattern is superimposed on the coated photoresist 2, and the photoresist 2 is illuminated with a suitable light source 4 such as a high-pressure mercury lamp. And exposed photoresist 2
When the unexposed portion 5 is removed by development, the substrate 1 is exposed for the required pattern portion 6, as shown in FIG. This required pattern portion, that is, the removal trace 6K of the photoresist 2, is filled with thick film paste 7 using a rubber squeegee, roller, etc. 8, as shown in FIG.

厚膜ペースト7を充填し終った基板1(第5図)は恒湿
槽等(ml示せず)にて乾燥させる。乾燥した基板lは
数百度に加熱されたコンベア炉等(図示せず)K入れて
焼成する。仁の焼成工程によって、パター/を形成する
ペースト7は基板l上にIaき國められ、フォトレジス
ト2Fi燃焼し縦峨ガスとして気化する。以上のごとき
一連の工@によって、第6閣に示すごとき基板1上に所
要の厚膜パターン7aが形成された混成集積回路用厚膜
基板を得る仁とができる。なお仁の製法において使用す
る厚膜ペーストは、導体、抵抗体または誘電体のいずれ
のペーストであって本、上述の工程で処理する仁とがで
きる。
The substrate 1 (FIG. 5) filled with the thick film paste 7 is dried in a humidity chamber or the like (ml not shown). The dried substrate 1 is placed in a conveyor furnace (not shown) heated to several hundred degrees and fired. Through the firing process, the paste 7 forming the pattern is spread onto the substrate 1, and the photoresist 2Fi burns and vaporizes as a vertically concentrated gas. Through the series of steps described above, it is possible to obtain a thick film substrate for a hybrid integrated circuit in which the required thick film pattern 7a is formed on the substrate 1 as shown in the sixth table. The thick film paste used in the above-mentioned manufacturing method may be a conductor, a resistor, or a dielectric paste and may be processed in the above-described steps.

以上のaBAから明らかなようK、本発明になる厚膜パ
ターンの形成方法を混成集積回路などに用いられる厚膜
基板に適用すれば、従来のスクリーンプリント法にて使
用されるスクリーンマスクでは非常に困難であった数十
ミクロンのファインパターンを、容易に基板上に形成す
ることができる。it、使用するフォトレジストの膜厚
を調節することKより、所望の厚さのパターンを任意に
得ることができる。従って、従来方法に比して、よシ高
精度の厚膜パターンを得ることができ、しか本格別な設
備を必要としないので低コストであると、いう顯著な効
果を奏するものである。
As is clear from the above aBA, if the thick film pattern forming method of the present invention is applied to a thick film substrate used for hybrid integrated circuits, the screen mask used in the conventional screen printing method can be Fine patterns of several tens of microns, which was previously difficult, can now be easily formed on a substrate. By adjusting the thickness of the photoresist used, a pattern with a desired thickness can be obtained. Therefore, compared to the conventional method, it is possible to obtain a thick film pattern with higher precision, and since no special equipment is required, the cost is lower.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第6図は本発f@になる厚膜パターンの形成
方法の一実施例たる各工程を示す側断面図である。 l・・・基板、2・−7オトレジスト、3・・・ネガフ
ィルム、4・・・光源、S・−未感光部分、6・・・所
要パターン部分(フォトレジストの除去跡)、7・・・
*換ヘースト、7m−・・厚膜パターン、8・・・スキ
ージ、ローラ
FIGS. 1 to 6 are side sectional views showing each step of an embodiment of the method for forming a thick film pattern according to the present invention. l...Substrate, 2-7 photoresist, 3...Negative film, 4...Light source, S-unexposed area, 6...Required pattern area (removal trace of photoresist), 7...・
*Change height, 7m--thick film pattern, 8--squeegee, roller

Claims (1)

【特許請求の範囲】[Claims] 基板上に所要の厚膜パターンを形成する方法において、
基板上KWr*の厚さにフォトレジストを塗布する工程
と、塗布されたフォトレジスト上に所要パターンのネガ
フィルムを重ね会わせて露光する工程と、露光し九フォ
トレジストを現像して未感光部分を除去する工程と、フ
ォトレジストの除去跡に厚膜ペーストを充填する工程と
、厚膜ペーストを充填した基板を乾燥させたのち焼成し
て厚膜ペーストを固化させると共にフォトレジストを除
去する工程とからなることを%像とする厚膜パターンの
形成方法。
In a method of forming a desired thick film pattern on a substrate,
A process of applying photoresist to a thickness of KWr* on the substrate, a process of overlapping a negative film of the desired pattern on the applied photoresist and exposing it to light, and developing the exposed photoresist to remove unexposed areas. a process of filling thick film paste into the area where the photoresist has been removed; and a process of drying and baking the substrate filled with the thick film paste to solidify the thick film paste and removing the photoresist. A method for forming a thick film pattern based on the percentage of
JP6479282A 1982-04-20 1982-04-20 Method of forming thick film pattern Pending JPS58182290A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6479282A JPS58182290A (en) 1982-04-20 1982-04-20 Method of forming thick film pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6479282A JPS58182290A (en) 1982-04-20 1982-04-20 Method of forming thick film pattern

Publications (1)

Publication Number Publication Date
JPS58182290A true JPS58182290A (en) 1983-10-25

Family

ID=13268434

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6479282A Pending JPS58182290A (en) 1982-04-20 1982-04-20 Method of forming thick film pattern

Country Status (1)

Country Link
JP (1) JPS58182290A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6187393A (en) * 1984-08-29 1986-05-02 インタ−ナシヨナル・スタンダ−ド・エレクトリツク・コ−ポレイシヨン Optical thick film hybrid method
JP2014235752A (en) * 2013-05-30 2014-12-15 南昌欧菲光科技有限公司 Touch-screen conductive film and method for manufacturing the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52126767A (en) * 1976-04-16 1977-10-24 Nichicon Capacitor Ltd Method of printing thick film

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52126767A (en) * 1976-04-16 1977-10-24 Nichicon Capacitor Ltd Method of printing thick film

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6187393A (en) * 1984-08-29 1986-05-02 インタ−ナシヨナル・スタンダ−ド・エレクトリツク・コ−ポレイシヨン Optical thick film hybrid method
JP2014235752A (en) * 2013-05-30 2014-12-15 南昌欧菲光科技有限公司 Touch-screen conductive film and method for manufacturing the same

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