JPS58179343A - Inspection method of figure - Google Patents

Inspection method of figure

Info

Publication number
JPS58179343A
JPS58179343A JP57061913A JP6191382A JPS58179343A JP S58179343 A JPS58179343 A JP S58179343A JP 57061913 A JP57061913 A JP 57061913A JP 6191382 A JP6191382 A JP 6191382A JP S58179343 A JPS58179343 A JP S58179343A
Authority
JP
Japan
Prior art keywords
inspected
elements
inspection
standard
graphic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57061913A
Other languages
Japanese (ja)
Inventor
Sadaaki Yokoi
横井 貞明
Hideo Tachiki
立木 英雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP57061913A priority Critical patent/JPS58179343A/en
Publication of JPS58179343A publication Critical patent/JPS58179343A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE:To eliminate the need for correction of distortion of a scanner, etc. or positioning of high precision in the inspection of defects in an electronic circuit figure, etc. by making comparison inspection with only the quantity of the figure elements within each divided region. CONSTITUTION:There are two kinds of the figure elements to be inspected in this invention, that is, a patterned part which is subjected to patterning and a blank part which is not subjected to said patterning. If the figure to be inspected is a product such as an IC or transistor, it is necessary to make figure inspection for color elements as well. In such a case, the figure to be inspected is beforehand separated to each color element by using a filter or color camera or the like and is inputted, whereby figure data is obtained with each color element. The quantity of the figure elements 4 contained in an optionally divided region 3 is determined by a known method with respect to the patterned part and the blank part respectively and is compared with the quantity of the figure elements in the same region as the above-described divided region included in the corresponding standard figure. If the quantities are the same, the object to be inspected is decided to be nondefective.

Description

【発明の詳細な説明】 本発明は、図形特に電子回路を形成するためのマスク図
形あるい娘各種基板上く形成された電子回路図形等の検
査方法−関するものであるO近年、電子回路の高集積化
、高密度化の急速な進展に伴ない、前記図形は益々黴顔
化する傾向にあるが、そうした状況において、それらの
図形が欠陥を有しているか否かを検査することが、電子
回路部品の製造上の重要な問題となってきている。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for inspecting figures, particularly mask figures for forming electronic circuits, and electronic circuit figures formed on various substrates. With the rapid progress of high integration and density, the above-mentioned figures tend to become more and more moldy, but in such a situation, it is possible to inspect whether or not these figures have defects. This has become an important problem in the manufacturing of electronic circuit components.

マスク図形あるい社電子回路図形の欠陥K14種々のも
のがあるが、その中で特に重大なものは、図形要素中に
含まれる所定外の連続あるいは不連続である。何故なら
ば、これらの欠陥は電子回路の断線あるいは短絡といっ
た致命的な結果を生ず形あるいは各種基板上に形成され
走電子回路図形等(以下単に図形と略す)の中の欠陥、
特に、図形要素中に含まnる所定外の連続および不連続
を効率よく検査する方法を提供するものである。本発明
によれば、あらかじめ分割された領域もしく社、線分上
に含まれる図形要素の数を求めて比較検査を行なうため
、前記所定外の連続あるいは不連続が存在する場合には
、図形要素の個数が異なるので、検出が可能である。
There are various types of defects K14 in mask graphics or electronic circuit graphics, but the most serious one is unspecified continuity or discontinuity contained in a graphic element. This is because these defects can cause fatal consequences such as disconnection or short circuits in electronic circuits, and defects in electrophoretic circuit figures (hereinafter simply referred to as figures) formed on shapes or various substrates.
In particular, the present invention provides a method for efficiently inspecting unspecified continuity and discontinuity included in a graphic element. According to the present invention, since the number of graphical elements included in a pre-divided region, area, or line segment is determined and a comparison inspection is performed, if continuity or discontinuity other than the above-mentioned predetermined continuity exists, Detection is possible because the number of elements is different.

さらに、被検査対象図形に対して、あらかじめ細めある
いは太め操作tjllL、九後に前記図形要素の個数を
求めて比較検査を行なうむとKよ)、図形要素中に含ま
れる幅が狭い不完全連続部所、あるい社図形要素間の間
隔が狭い不完全分離箇所の検出が可能である。
In addition, perform a thinning or thickening operation on the figure to be inspected in advance, and then perform a comparative inspection by calculating the number of the figure elements), and perform a comparison inspection by performing a thinning or thickening operation on the figure to be inspected. , or it is possible to detect incompletely separated locations where the spacing between graphic elements is narrow.

従来、この種の検査方法として蝶、被検査対象図形と標
準図形を一般に公知の方法であらかじめ位置合わせを行
ない、両者を別々のスキャナ等で走査して、その結果得
られる図形データを遂次比較する検査方法が用いられて
いた。この場合、被検査対象図形と標準図形との位置合
わせ精度が曳くないと欠陥と@i[llする可能性が6
シ、また高精度な位置合わせは技術的に困難であり、か
つ図形データを入力するスキャナ等の歪補正をする必要
があるなどといった問題点があった。
Conventionally, this type of inspection method involves aligning the butterfly, the target figure to be inspected and the standard figure in advance using a generally known method, scanning both with separate scanners, etc., and sequentially comparing the resulting figure data. A testing method was used. In this case, if the alignment accuracy between the figure to be inspected and the standard figure is not maintained, there is a possibility of defective @i[ll.
Furthermore, there are problems in that highly accurate alignment is technically difficult, and it is necessary to correct distortion in a scanner or the like that inputs graphic data.

ここで提供する方法は、前記のよう表スキャナ等の歪補
正あるいは高精度な位置決めを必要とせず、粗く位置決
めされた被検査対象図形と標準図形との比較検査方法に
ついて述べる。
The method provided here does not require distortion correction using a table scanner or the like or highly accurate positioning as described above, and describes a comparative inspection method of a roughly positioned target figure to be inspected and a standard figure.

以下図面を参照して本発明を詳1Illlk説明する。The present invention will be explained in detail below with reference to the drawings.

第taaa、電子回路を形成するためのマスク図として
取り出す様子を示す図であり、同図においてlは被検査
対象図形を示し、2Fi、被検査対象図形に含まれる図
形要素を示す。本発明で対象とする図形要素としては、
パターン形成が行なわれているパターン部と、前記形成
が行なわれていな込余白部の2種類存在する。
taaa is a diagram showing how to take out a mask diagram for forming an electronic circuit; in the same figure, l indicates a figure to be inspected, and 2Fi indicates a figure element included in the figure to be inspected. The graphical elements targeted by the present invention include:
There are two types: a pattern portion where pattern formation is performed and an indented margin portion where pattern formation is not performed.

一般に被検査対象−形がI C(Integrated
 C1rcuit )あるいはトランジスタ等の製品の
場合、色要素について4図形検査を行なう必要がある。
Generally, the shape of the object to be inspected is IC (Integrated).
In the case of products such as C1rcuit) or transistors, it is necessary to perform four graphical inspections on color elements.

このような場合に嬬、特許請求の範囲第3項、314項
、第7項、あるいは第8項に記載するように、フィルタ
もしく酸カラーカメラ等を使用して、被検査対象図形t
Toらかじめ各色要素に分解して入力することKより、
第1図で示されるような図形データが各色要素毎に得ら
れる。
In such a case, as described in Claims 3, 314, 7, or 8, a filter or an acid color camera or the like is used to examine the figure t to be inspected.
Since To decomposes and inputs each color element in advance,
Graphic data as shown in FIG. 1 is obtained for each color element.

露2図は、前記方法によって得られ九図形データを、複
数個の領域に分割する様子を示す友めの図であ)、同図
において、任意に分割さn走領域3に含まれる図形要素
40個数がパターン部および余白部について各々一般に
公知の方法を用いて求められ、対応する標準図形に含ま
れる前記分割され九領域と同一領域内の図形要素の個数
との比較検査が行なわれ、個数が同一であれば良品と判
定される。
Figure 2 is a companion diagram showing how the nine-figure data obtained by the above method is divided into a plurality of regions). The number of 40 elements is calculated for each of the pattern part and the margin part using a generally known method, and a comparison test is performed with the number of graphic elements in the same area as the nine divided areas included in the corresponding standard figure. If they are the same, it is determined that the product is good.

このように1従来の方法上は異なp本発明で提供する方
法は、各分割された領域内での図形要素の個数について
のみの比較検査であるため、領域分割を適当に行なうこ
とKより、被検査対象図形と標準図形との位置合わせを
厳密に行表う必要がなくなる。
In this way, the method provided by the present invention is different from the conventional method.Since the method provided by the present invention is a comparative test only for the number of graphic elements in each divided region, it is necessary to perform region division appropriately. There is no need to strictly align the figure to be inspected with the standard figure.

#!3図は、前記分割され要領域内の図形:g!素中に
所定外の連続あるいは不連続が存在するか否かを判定す
る方法を説明するための図である。同図KsPいてそれ
ぞれ、(a)は前記図形要ズが良品の場合の様子を示し
、(b)は前記図形要素中に所定外の不連続箇所5が存
在して、図形要素中パターン部の図形要素の個数が増加
し余白部の図形要素の個数が減少する様子を示し、(C
)a前記図形要素中に所定外の連続箇所6が存在して図
形要素中パターン部の個数が減少し、余白部の個数が増
加する様子を示す。このように1本発明で提供するよう
K。
#! Figure 3 shows the divided figure within the required area: g! FIG. 3 is a diagram for explaining a method for determining whether or not an unspecified continuity or discontinuity exists in the element. In the figure KsP, (a) shows the situation when the graphic element is non-defective, and (b) shows the situation when an unspecified discontinuous point 5 exists in the graphic element, and the pattern part in the graphic element It shows how the number of graphic elements increases and the number of graphic elements in the margin decreases, (C
)a This shows how an unspecified continuous portion 6 exists in the graphic element, the number of pattern parts in the graphic element decreases, and the number of margin parts increases. Thus, one K as provided by the present invention.

前記分割された領域内に含まれる図形要素の個数を一般
に公知の方法でそnぞれ求め、対応する標準図形に含ま
れる同一領域内の図形要素の個数とO比I2を行なって
、得られる結果が等しくない場合には所定外の不連続も
しくは連続箇所が存在すると判定できる。
The number of graphical elements included in the divided areas is determined by a generally known method, and the O ratio I2 is calculated with the number of graphical elements in the same area included in the corresponding standard figure. If the results are not equal, it can be determined that there is an unspecified discontinuity or continuity.

第4図線、特許請求の範囲第2項、第4項、第6項、第
8項に記載するように、被検査対象図形に対してあらか
じめ細め操作を施して、図形要素中に不完全連続箇所が
あるかどうかを検査する方法K”)いて説明するための
図である。
As described in the fourth drawing line, claims 2, 4, 6, and 8, the figure to be inspected is subjected to a narrowing operation in advance to avoid imperfections in the figure element. FIG. 4 is a diagram for explaining a method K'') for inspecting whether there is a continuous portion.

同図においてそれぞれ、−)は前記図形要素が良品の場
合の様子を示し、(baa前記図形要素中に不完全連続
箇所7が存在する場合の様子を示し、 Gc)祉同図の
−)K対してあらかじめ定められ走置だけ細め操作を施
して得られる図形要素9の様子を示し、&j)は同図の
伽)に対して同様の操作を施し良結果、不完全連続箇所
7がf不連続箇所loとなって、図形要素中パターン部
の個数が増加し、余白部の個数が減少する様子を示す。
In the same figure, -) indicates the situation when the graphic element is in good condition, (baa indicates the situation when the incomplete continuous part 7 exists in the graphic element, Gc) -)K in the same figure, respectively. Fig. 9 shows the appearance of the graphic element 9 obtained by applying a narrowing operation by a predetermined translation amount to the image. It is shown that the number of pattern parts in the graphic element increases and the number of blank parts decreases as a continuous part lo occurs.

このように1前記図形要素が完全に連続しているかどう
かを判定する九めに1あらかじめ定められ走置だけ細め
操作を施せに、不完全連続箇所が。
In this way, in the ninth step of determining whether the graphical elements are completely continuous, perform a narrowing operation by a predetermined distance to find incompletely continuous points.

前記操作七施した後の図形に於いて不連続箇所となりて
図形要素の筒数が変化するので、欠陥として検出できる
After performing the seven operations, the figure becomes a discontinuous point and the number of cylinders of the figure element changes, which can be detected as a defect.

JIIs図はS特許請求のIIi囲第2項、第4項、第
6項、第8項に記載するように、被検査対象図形に対し
てあらかじめ太め操作を施して1図形要素相互間が完全
に分離しているかどうかを検査する方法について説明す
るための図である。
JIIs diagrams are created by performing a thickening operation on the figure to be inspected in advance so that the distance between each figure element is perfect, as described in Sections 2, 4, 6, and 8 of Section IIi of the S patent claim. FIG. 3 is a diagram for explaining a method of inspecting whether or not the two are separated.

同図においてそれぞれ、(a)は前記図形要素が良品の
場合の様子を示し%(b)は前記図形要素相互間に不完
全分離箇所11が存在する場合の様子を示し、(C)a
同図の(a)K対してあらかじめ定められた量だけ太め
操作を施して得られる図形の様子を示し、(d)Fi同
図(b)に対して同様の操作を施した結果、不完全分離
箇所が連続箇所l午となって、図形要素中パターン部の
個数が減少し、余白部の個数が増加する様子を示す。
In the same figure, (a) shows the situation when the graphic element is a good product, (b) shows the situation when there is an incomplete separation point 11 between the graphic elements, and (C) a
In the same figure, (a) shows the shape obtained by thickening K by a predetermined amount, and (d) shows an incomplete figure obtained by performing the same operation on Fi in (b). This figure shows how the separated parts become continuous parts, the number of pattern parts in the graphic element decreases, and the number of blank parts increases.

このように1前記図形要素相互間が完全に分離している
かどうかを判定するために%あらかじめ定められた量だ
け太め操作を施せば、不完全分離箇所が、前記操作を施
し九後の図形に於いて連続陥として検出できる◇ @6図は、特許請求の範囲第5項に記載するように、被
検査対象図形を任意方向を向く複数個の線分によって走
査して、各線分上に存在する図形要素の数を、標準図形
より求まるあらかじめ定められた値と比較検査を行なう
方法ta明するための図である。
In this way, if the 1% thickening operation is performed by a predetermined amount in order to determine whether the graphic elements are completely separated from each other, the incompletely separated parts will be changed to the shape after the above operation. ◇ In Figure 6, as stated in claim 5, the figure to be inspected is scanned by a plurality of line segments pointing in arbitrary directions, and the defect is detected as a continuous defect on each line segment. FIG. 2 is a diagram for explaining a method of comparing and inspecting the number of graphic elements to be compared with a predetermined value determined from a standard graphic.

同図において%15は走査する線分を示し、それぞれ、
(1)は線分上の図形要素が良品の場合の様子を示し、
(b)は前記線分上の図形要素中に所定外の連続箇所1
6が存在して、図形要素中パターン部の個数が減少し、
余白部部の個数も減少する様子を示し、(C)は前記線
分上の図形要素中に所定外の不連続箇所17が存在して
、図形要素中パターン部の個数が増加して、余白部の個
数も増加する様子を示す。
In the same figure, %15 indicates the line segment to be scanned, and each
(1) shows the situation when the graphic element on the line segment is a good item,
(b) is an unspecified continuous location 1 in the graphic element on the line segment.
6 exists, the number of pattern parts in the graphic element decreases,
The number of blank spaces also decreases, and (C) shows that an unspecified discontinuous point 17 exists in the graphic element on the line segment, and the number of pattern parts in the graphic element increases, resulting in a decrease in the margin. The number of parts also increases.

このように、前述の複数個の領域に分割して。In this way, it is divided into the multiple areas mentioned above.

各領域内に存在する図形l[LIAの個数を求める代わ
pK被検査対象図形を複数個の線分によ)産査して、各
線分上に存在する図形要素の個数を求めるととkより、
所定外の連続箇所あるいは不連続箇所を求めることが可
能である。
If we survey the figure l existing in each region (instead of finding the number of LIA) and find the number of figure elements existing on each line segment, then ,
It is possible to find unspecified continuous locations or discontinuous locations.

さらに、特許請求の範囲第6項、j18項に記載するよ
うに1あらかじめ被検査対象図形に対して太めあるいは
細め操作をほどこして、しかる後に前述したように複数
の線分により走査することにより、図形要素の不完全連
続箇所もしくは、図形要素相互間の不完全分離箇所の検
査が可能である。
Furthermore, as described in Claims 6 and 18, 1, by performing a thickening or thinning operation on the figure to be inspected in advance, and then scanning with a plurality of line segments as described above, It is possible to inspect incompletely continuous locations of graphical elements or incompletely separated locations between graphical elements.

を使用して図形データとして取や出す様子を示し、11
2図は前記取り出された図形データを複数個の領域に分
割する様子を示し、第3図は前記分割され九領域内の図
形要素中に所定外の連続あるいは不連続が存在するか否
かを判定する方法を説明するための図であシ、同図にお
いてそれぞれ、(ahFi前記図形要素が良品の場合を
示し、(b)は前記図形要素中に所定外の不連続箇所が
存在する場合を示し、(c)は前記図形要素中に所定外
の連続箇所が存在する場合を示し、第4図は、被検査対
象図形に対してあらかじめ細め操作を施して、不完全連
続箇所があるかどうかを検査する方法についてI!明す
るための図であり、同図においてそれぞれ(a)t’;
j、前記図形要素が良品の場合全示し、(b)は前記図
形要素中に不完全連続箇所が存在する場合を示し、(C
) U同図(a) K対して細め操作を施した結果得ら
れる図形を示し、(d)は、同図(b) K対して細め
操作を施した結果、不完全連続箇所が不連続箇所となる
様子を示し、第5図は、被検査対象図形に対してあらか
じめ太め操作上節して、不完全分離箇所があるかどうか
を検査する方法忙ついて説明する丸めの図であシ、同図
忙おいてそれぞれ、(a)は前記図形要素が良品の場合
を示し、伽)は前記図形要素中に不完全分離箇所が存在
する場合を示し、(C)は同図(a) 11C対して太
め操作を施した結果得られる図形を示し、(d)は同図
(b)九対して太め操作を施し九結果、不完全分離箇所
が連続箇所となる様子を示し、第6図は、被検査対象図
形を複数個の線分によって走査して各線分上Ktすれる
図形要素の個数の比較検査を行なう方法を説明するため
の図である。
11 shows how to extract it as graphic data using
Figure 2 shows how the extracted graphic data is divided into a plurality of regions, and Figure 3 shows whether or not there is unspecified continuity or discontinuity in the graphic elements within the nine divided regions. This figure is for explaining the determination method. (c) shows a case where an unspecified continuous part exists in the graphic element, and FIG. This is a diagram for explaining the method of testing, and in the diagram, (a) t';
j, if the graphic element is a good item, all are shown, (b) is a case where there is an incompletely continuous part in the graphic element, (C
) U The same figure (a) shows the figure obtained as a result of performing a narrowing operation on K, and (d) shows the figure obtained as a result of performing a narrowing operation on K in the same figure (b). Figure 5 is a rounded diagram that briefly explains the method of performing a thicker operation on the figure to be inspected in advance to check whether there is an incompletely separated part. In the figures, (a) shows the case where the graphic element is in good condition, (2) shows the case where there is an incompletely separated part in the graphic element, and (C) shows the case where the graphic element is defective, and (C) shows the case where the graphic element is in good condition. 6(d) shows the figure obtained as a result of thickening operation on 9 in the same figure (b), and as a result of 9 performing thickening operation on 9, incompletely separated parts become continuous parts. FIG. FIG. 6 is a diagram for explaining a method of scanning a figure to be inspected using a plurality of line segments and performing a comparative inspection of the number of figure elements that fall on each line segment.

図においてlは、被検査対象図形、2は被検査対象図形
に含まれる図形要素%3蝶、分割され九領域、4は分割
された領域に含まれる図形要素、5は所定外の不連続箇
所、6は所定外の連続箇所、7は不完全な連続箇所、8
は細め操作を行なう分割された領域、9線細め操°作を
行なりた図形要素、10は、細め操作を行なりた結果生
ずる不連続箇所、11は不完全分離箇所、12は、太め
操作を行なう分割された領域、13Fi太め操作を行な
った図形要素、14線太め操作を行なった結果生ずる連
続箇所、15は被検査対象図形を走査する線分、16は
所定外の連続箇所、17は所定外の不第1図 第2図 第3図 C(X) (C) 第4図 (α) (b) 第4図 (C) (d) 第5図 (α) (t)) 第5図 (C) Cd)
In the figure, l is the figure to be inspected, 2 is the figure element included in the figure to be inspected, %3 is the butterfly, divided into 9 areas, 4 is the figure element included in the divided area, and 5 is an unspecified discontinuous point. , 6 is an unspecified continuous location, 7 is an incomplete continuous location, 8
10 is a divided region to which a thinning operation is performed, a graphical element subjected to a 9-line thinning operation, 10 is a discontinuous point resulting from the thinning operation, 11 is an incomplete separation point, and 12 is a thickening operation 13 is a graphical element subjected to the Fi thickening operation, 14 is a continuous location resulting from the line thickening operation, 15 is a line segment that scans the figure to be inspected, 16 is an unspecified continuous location, 17 is a Figure 1 Figure 2 Figure 3 C (X) (C) Figure 4 (α) (b) Figure 4 (C) (d) Figure 5 (α) (t)) 5 Figure (C) Cd)

Claims (1)

【特許請求の範囲】 (1)  被検査対象図形と標準図形との比較検査を行
なう図形検査方法に於いて、被検査対象図形を複数個の
任意領域に分刻し、各分割さnた領域内に独立して存在
する図、形要素の数を、標準図形より求まるあらかじめ
定められた値と比較して、その大小関係よ)前記領域内
の図形要素に1所定外の連続あるいは不連続が存在する
か否かを判定することを特徴とする図形検査方法。 (2)  前記被検査対象図形と標準図形との比較検査
全行なう際に、あらかじめ被検査対象図形に対して、細
めあるいは太め操作を施した後に比較検査を行なうこと
により、図形要素忙不完全連続ろるい蝶不完全分離が存
在するか否かt判定することを特徴とする特許請求の範
囲第1項記載の図形検査方法。 (3)  前記被検査対象図形と標準図形との比較検査
を行なう際に、あらかじめ被検査対象図形をフィルタあ
るいはカラーカメラ等を使用して、色要素に分解した後
に比較検査を行なうことを特徴とする特許請求の範囲第
1項記載の図形検査方法。 (4)前記被検査対象図形と標準図形との比較検査を行
なう9に、あらかじめ被検査対象図形tフィルタあるい
は力2−カメラ等を使用して色要素に分解し、さらに細
めあるいは太め操作を施した後に比較検査を行なうこと
Kよシ、図形要素に不完全連続あるいは不完全分離が存
在するか否かを判定することt4I黴とする特許請求の
範囲第1項記載の図形検査方法。 (5)前記被検査対象図形と標準図形との比較検査を行
な−う際に、被検査対象図形全任意方向を同〈複数個の
線分圧より走査し、各走査線上に独立して存在する図形
要素の数を求め、標準図形より求まるあらかじめ定めら
れた値と比較検査を行なうととft%黴とする特許請求
の範囲第1項記載の図形検査方法。 (6)前記被検査対象図形と標準図形との比較検査を行
なう際に、あらかじめ被検査対象図形に対して、細めあ
るいは太め操作を施した後に任意方向を向く複数個の線
分上に存在する図形要素の個数を比較検査することKよ
夕図形iI素に不完全連続あるいは不完全分離が存在す
るか否かを判定することを特徴とする特許請求の範囲第
1項記載の図形検査方法。 (η 前記被検査対象図形と標準図形との比較検査を行
なう際に、あらかじめ被検査対象図形をフィルタあるい
はカッ−カメラ等を使用して色要素に分解した後に任意
方向を向く複数個の線分上に存在する図形要素の個数を
比較検査することを特徴とする特許請求の範囲#I1項
記載の図形検査方法。 (8)前記被検査対象図形と標準図形との比較検査を行
なう際に、あらかじめ被検査対象図形をフィルタあるい
はカラーカメラ等を使用して色要素に分解し、さらに細
めあるいは太め操作を施し九後に任意方向を向く複数個
の線分上に存在する図形要素の個数を比較検査すること
によシ、図形要素に不完全連続あるい社不完全分離が存
在するか否かを判定することt4111とする特許請求
の範囲第1項記載の図形検査方法O
[Claims] (1) In a figure inspection method that performs a comparative inspection between a figure to be inspected and a standard figure, the figure to be inspected is divided into a plurality of arbitrary areas, and each divided area is divided into n areas. Compare the number of figures and shape elements that exist independently within the area with a predetermined value determined from the standard figure, and determine whether there is any unspecified continuity or discontinuity in the figure elements within the area. A figure inspection method characterized by determining whether or not it exists. (2) When carrying out all the comparative inspections between the figure to be inspected and the standard figure, the figure to be inspected is thinned or thickened in advance, and then the comparison inspection is carried out, so that the figure elements are busy, incomplete, continuous, etc. 2. The graphic inspection method according to claim 1, further comprising the step of determining whether or not sluggish incomplete separation exists. (3) When performing a comparative inspection between the figure to be inspected and the standard figure, the figure to be inspected is first separated into color elements using a filter or a color camera, and then the comparative inspection is carried out. A pattern inspection method according to claim 1. (4) In step 9, in which the figure to be inspected is compared with the standard figure, the figure to be inspected is first separated into color elements using a t-filter or a camera, and then further narrowed or thickened. 2. The graphical inspection method according to claim 1, further comprising: performing a comparative inspection after the comparison, and determining whether incomplete continuity or incomplete separation exists in the graphical elements. (5) When performing a comparative inspection between the figure to be inspected and the standard figure, the figure to be inspected is scanned in all arbitrary directions using the same (multiple line partial pressures), and independently on each scanning line. 2. The graphic inspection method according to claim 1, wherein the number of existing graphic elements is calculated and compared with a predetermined value determined from a standard graphic to obtain ft% mold. (6) When performing a comparative inspection between the figure to be inspected and the standard figure, the figure to be inspected is thinned or thickened in advance and then exists on multiple line segments pointing in arbitrary directions. 2. A graphic inspection method according to claim 1, characterized in that by comparing and inspecting the number of graphic elements, it is determined whether or not incomplete continuity or incomplete separation exists in K and II elements. (η When performing a comparative inspection between the figure to be inspected and the standard figure, the figure to be inspected is separated into color elements using a filter or a cuckoo camera, etc., and then multiple line segments pointing in arbitrary directions are The figure inspection method according to claim #I1, characterized in that the number of figure elements existing on the figure is comparatively inspected. (8) When performing a comparative inspection between the figure to be inspected and the standard figure, The figure to be inspected is separated into color elements using a filter or a color camera, etc., and then thinned or thickened. After that, the number of figure elements existing on multiple line segments pointing in arbitrary directions is compared and inspected. A graphical inspection method O according to claim 1, wherein t4111 determines whether incomplete continuity or incomplete separation exists in the graphical element.
JP57061913A 1982-04-14 1982-04-14 Inspection method of figure Pending JPS58179343A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57061913A JPS58179343A (en) 1982-04-14 1982-04-14 Inspection method of figure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57061913A JPS58179343A (en) 1982-04-14 1982-04-14 Inspection method of figure

Publications (1)

Publication Number Publication Date
JPS58179343A true JPS58179343A (en) 1983-10-20

Family

ID=13184872

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57061913A Pending JPS58179343A (en) 1982-04-14 1982-04-14 Inspection method of figure

Country Status (1)

Country Link
JP (1) JPS58179343A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6115343A (en) * 1984-06-29 1986-01-23 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Method of optically inspecting and analyzing integrated circuit
JPS6123951A (en) * 1984-07-11 1986-02-01 Ibiden Co Ltd Detecting method of automatic inspection of outward shape of circuit
EP0222079A2 (en) * 1985-11-12 1987-05-20 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Printed circuit boards optical testing method
EP0231941A2 (en) * 1986-02-05 1987-08-12 OMRON Corporation Method for inspection of printed circuit board assembly by arithmetic comparison of several pictures in different colours
JPH0235576A (en) * 1989-05-23 1990-02-06 Hitachi Ltd Detection of pattern fault

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50127574A (en) * 1974-03-27 1975-10-07
JPS5293248A (en) * 1976-01-31 1977-08-05 Fuji Electric Co Ltd Trouble discriminator
JPS5324780A (en) * 1976-08-20 1978-03-07 Hitachi Ltd Lead frame
JPS571160A (en) * 1980-05-27 1982-01-06 Tsurumaki Sogyo Kk Thread-winding device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50127574A (en) * 1974-03-27 1975-10-07
JPS5293248A (en) * 1976-01-31 1977-08-05 Fuji Electric Co Ltd Trouble discriminator
JPS5324780A (en) * 1976-08-20 1978-03-07 Hitachi Ltd Lead frame
JPS571160A (en) * 1980-05-27 1982-01-06 Tsurumaki Sogyo Kk Thread-winding device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6115343A (en) * 1984-06-29 1986-01-23 インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション Method of optically inspecting and analyzing integrated circuit
JPS6123951A (en) * 1984-07-11 1986-02-01 Ibiden Co Ltd Detecting method of automatic inspection of outward shape of circuit
EP0222079A2 (en) * 1985-11-12 1987-05-20 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Printed circuit boards optical testing method
JPS62201339A (en) * 1985-11-12 1987-09-05 マニア・エレクトロニツク・アウトマテイザチオン・エントビツクルンク・ウント・ゲレ−テバウ・ゲ−エムベ−ハ− Method of optically testing circuit substrate
EP0231941A2 (en) * 1986-02-05 1987-08-12 OMRON Corporation Method for inspection of printed circuit board assembly by arithmetic comparison of several pictures in different colours
JPH0235576A (en) * 1989-05-23 1990-02-06 Hitachi Ltd Detection of pattern fault
JPH0577112B2 (en) * 1989-05-23 1993-10-26 Hitachi Ltd

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