JPS5817308A - Device for measuring amount of ink supply - Google Patents

Device for measuring amount of ink supply

Info

Publication number
JPS5817308A
JPS5817308A JP56115550A JP11555081A JPS5817308A JP S5817308 A JPS5817308 A JP S5817308A JP 56115550 A JP56115550 A JP 56115550A JP 11555081 A JP11555081 A JP 11555081A JP S5817308 A JPS5817308 A JP S5817308A
Authority
JP
Japan
Prior art keywords
area
measured
measurement
printed
ink supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56115550A
Other languages
Japanese (ja)
Other versions
JPS637603B2 (en
Inventor
Kiyoshi Shibukawa
渋川 清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIREKO KK
Original Assignee
NIREKO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIREKO KK filed Critical NIREKO KK
Priority to JP56115550A priority Critical patent/JPS5817308A/en
Publication of JPS5817308A publication Critical patent/JPS5817308A/en
Publication of JPS637603B2 publication Critical patent/JPS637603B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/28Measuring arrangements characterised by the use of optical techniques for measuring areas
    • G01B11/285Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means

Abstract

PURPOSE:To set the adequate amount of ink supply without experienced skill, by compensating the signal obtained by scanning an object to be measured by a photoelectric transducing element array, integrating the results, and obtaining the ratio between the area of printed part and the area of the part which is not printed. CONSTITUTION:A detecting head 11 has a mask case 10, a light source 9, and a measuring device 8 which guides the light reflected from the measuring region of the object to be measured 4 to the photoelectric transducing element array through a lens. A driving device moves the head 11 in a step shape so as to scan the entire surface of the object to be measured 4. The wavelength values of the output signal train from the individual photoelectric transducing element in the measuring device 8 are converted into continuous analog waveforms. Said analog waveforms are compensated based on the compensating constant which is obtained by the measurement with respect to a calibrating plate 5 and the results are integrated. Then the area ratio between the printed part and the part which is not printed is measured. Based on said area ratio, the amount of the ink supply is determined.

Description

【発明の詳細な説明】 本発明はオフセット印刷[tI!用される刷版中、印刷
前に刷られる校正刷夛、情態)勢の印刷部と非印刷部と
の比率を測定して、印刷に必l!な適正インキ供給量を
出力するインキ供給量調定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to offset printing [tI! Measure the ratio of printed and non-printed areas in the printing plate used, the proof plate printed before printing, and the situation. The present invention relates to an ink supply amount adjusting device that outputs an appropriate ink supply amount.

従来よシ刷版や、校正刷)、情態)等の印刷部と非印刷
部の比率を測定する場合、区画領域毎または全面に対し
て光源L〕刷版等の被測定物に党を尚ててその反射光量
を測定することで行い、ζ光gos度が全体的に変化し
九食、輝度分布が変化すると、それが測定誤差の大きな
要因となる。
Conventionally, when measuring the ratio of the printed area to the non-printed area of a printing plate (printing plate, proof printing), printing plate, etc., the light source L is applied to each divided area or the entire surface. This is done by measuring the amount of reflected light.If the ζ light intensity changes as a whole and the brightness distribution changes, this becomes a major cause of measurement error.

この対策として一般に定期的に輝度のキャリブレーショ
ンを行うことが必要である。t−#:、、輝度変化検出
器を設けて輝度変化を検出し、これに基すて測定結果を
自動的に補正しようとする場合、輝度変化検出器の設置
場所や、特性がインキ供給量調定装置と一致しないと正
確な補正が出来ない。
As a countermeasure against this problem, it is generally necessary to periodically calibrate the brightness. t-#:,, When installing a brightness change detector to detect brightness changes and automatically correcting the measurement results based on this, the installation location and characteristics of the brightness change detector may vary depending on the ink supply amount. Accurate correction cannot be made unless it matches the adjustment device.

さらに、光源の輝度分布が変化し九場合には当然ながら
*mm全全領域反射状態も変るので、その場合は調定領
域全体に互ってきめ細い補正が必要となる。被糊定領域
周囲の印刷部および非印刷部の比率の大小にょ)周囲の
反射状態も変化するので、調定装置への不要な反射光の
変化となって測定誤差を生じることになる。皺測定領域
周囲の反射影響を除くには測定器に指向性を持たせるこ
とで可能となる。マスク板やレンズを使用して指向性を
持九せることが可能であるが、レンズを使用するとレン
ズの光軸からレンズの周辺へ近づくに従って入光量が減
じ、この結果としてレンズの中央と周辺との測定値に誤
差を生じることKなる等の多くの問題があつ九。
Furthermore, if the luminance distribution of the light source changes, the reflection state of the entire *mm area will also change, so in that case, fine corrections will be required for the entire adjustment area. Since the reflection state of the surrounding area (such as the size of the ratio of the printed area and the non-printed area around the gluing area) also changes, this causes an unnecessary change in the reflected light to the adjustment device, resulting in a measurement error. The influence of reflections around the wrinkle measurement area can be eliminated by providing the measuring instrument with directivity. Directivity can be improved by using a mask plate or a lens, but when using a lens, the amount of incident light decreases as it approaches the periphery of the lens from the optical axis of the lens, and as a result, the amount of incident light decreases as it approaches the periphery of the lens. There are many problems such as causing errors in the measured values.

本発明の目的はこれら問題点を解決した刷版中校正刷シ
、情態シ等の印刷部と非印刷部の比率測定に基づいてイ
ンキ供給量を決定する調定装置を提供することである。
SUMMARY OF THE INVENTION An object of the present invention is to provide an adjustment device that solves these problems and determines the ink supply amount based on the measurement of the ratio of printed areas and non-printed areas of proof sheets, print sheets, etc. in printing plates.

このために本発明のインキ供給量測定装置嬬、測定領域
以外からの光を遮光するL5にマスクケースを設けて測
定器による常に同様&状態での測定領域に関する測定を
可能にし、この測定器としてし7ズ訃よび複数の光電変
換素子アレーを有すbものとを使用し、該測定器の出方
信号として各素子の連続的な信号別として取)出すとと
もにこれをアナログ波形に変換し、このアナログ波形を
積分する仁とで印刷部と非印刷部との面積比率を定め、
これに基いてインキ供給量を測定するように構成されて
お)、しかも予め被測定物の印刷部および非印刷部とそ
れぞれ同じ色を別々に有する校正板を測定すること罠よ
って光電変換素子アレーに関しての補正定数によって補
正するようにしたことを特徴とする。
For this purpose, the ink supply amount measuring device of the present invention is provided with a mask case on L5 that blocks light from other than the measurement area, so that the measurement device can always measure the measurement area in the same state. 7) and a device having a plurality of photoelectric conversion element arrays, extracting the continuous signal of each element as the output signal of the measuring instrument and converting it into an analog waveform, By integrating this analog waveform, the area ratio of the printed area and the non-printed area is determined.
The ink supply amount is measured based on this), and the photoelectric conversion element array It is characterized in that the correction is performed using a correction constant for.

以下に本発明の実施例につき図面を参照して説明する。Embodiments of the present invention will be described below with reference to the drawings.

第1図お工び第2図に示す装−は、測定部をなす暗箱1
と、操作、制御、演算、記憶を行っているコンソール2
と出方装置であるプリンター3とから成る。測定部O1
1!11 aそ0内1[が無反射状態とされている。暗
箱lo底部に被測定物4および測定値と補正するための
校正1[5を測定画と同じレベルに配置するようKtk
ってiる。被測定物40装脱はそれを取付ける被測定物
七ット台60出し入れKよって行うようKなっている。
The equipment shown in Figure 1 and Figure 2 is the dark box 1 that forms the measuring section.
and a console 2 that performs operation, control, calculation, and storage.
and a printer 3 which is an output device. Measuring part O1
1!11 1 in a so0 is in a non-reflective state. At the bottom of the dark box lo, place the object to be measured 4 and the calibration 1 [5 for correcting the measured value] at the same level as the measurement image.
That's what I mean. The object to be measured 40 can be loaded and unloaded by loading and unloading the object to be measured 60 to which it is attached.

暗箱1の上方には走行ガイド7が備えられ、この*行ガ
イド7Kt’E)って測定器8、光源箱9およびマスタ
ケースlOが一体となっ九検出ヘッド11が走行駆動用
パルスモータ12にょ)走行するようKnりている。
A traveling guide 7 is provided above the dark box 1, and this line guide 7Kt'E) is a unit in which the measuring instrument 8, light source box 9, and master case 1O are integrated, and the detection head 11 is connected to the traveling driving pulse motor 12. ) It is set to run.

第2図はjl!1図のコンソール備から見た検出ヘッド
11を示し、測定器8の両備にて光m−9が傾斜してマ
スクケース10に堆付けられ、各光源箱9内に光源13
が備えられている。光源箱9を備えたマスクケースRo
d第3図に示す如く、底板1OAK長方形の測定窓1o
llを有してお)、この測定1!IOBが第4図に示す
如き測定領域5(aXA)を定めるよう帆なっている。
Figure 2 is jl! The detection head 11 shown in FIG.
is provided. Mask case Ro equipped with light source box 9
d As shown in Figure 3, the bottom plate 1OAK rectangular measurement window 1o
ll), this measurement 1! The IOB is shaped to define a measurement area 5 (aXA) as shown in FIG.

このような検出ヘッド11は、パルスモータルに工〉ス
テップ状に走行ガイド7に沿って枢動され、各測定領域
8毎に測定器8が光源13から測定窓10B内O被欄定
物4の表面で反射され走光を受けて測定するようKなさ
れる。この測定動作をさらに詳しく説明すれば、まず校
正板5を測定してそOs定領域Sの反射輝度分布を測定
し、これを補正情報としてコンソール2において記憶す
る。そして検出ヘッド11はパルスセータ12によ〉走
行し、被測定物40上まで移動されて停止する。次に被
測定物4に対して同様に測定を開始し、測定器8からの
出力を補正情報とつき合せながら測定する。その結果を
1回O橢定値として記憶し、検出へラド11を第4図K
jiPffる&O距−だ妙走行させ良後次の測定を行う
、このようにして次々と被測定物4に対して測定を行−
1被測定物全域に互って行う。ζこで注意すべIiこと
として、印刷装置(図示せず)Kおけるインキ/パ々プ
の受は持つ区画領域は測定領域Sと紘一致せず、従って
インキ供給量の決定性区画領域毎に行わねばならない、
このために、第4図に示す如く区画領域の幅がCである
とするならと11aO橢定領域Sを連続して測定し、幅
Cの区画領域を網−した時点で轟誼イン中パルプに対す
るインキ供給量が決定される。すなわちインキ供給量の
出方は第4図におりる一回につ′#i測定したものにな
る。検出ヘッドllaマスクケース10.光1113お
よび測定器8が一体となって走行するので、校正板5を
測定する時も被測定物4を測定する時も測定領域の輝度
分布状態に変化がなく安定し良測定結果が得られる。
Such a detection head 11 is pivoted stepwise along the traveling guide 7 in a pulse motor manner, and the measuring instrument 8 is moved from the light source 13 to the object 4 in the measurement window 10B for each measurement area 8. It is designed to receive and measure light reflected from the surface. To explain this measurement operation in more detail, first, the calibration plate 5 is measured to measure the reflected luminance distribution of the constant area S, and this is stored in the console 2 as correction information. Then, the detection head 11 is moved by the pulse sweater 12, moved to above the object to be measured 40, and then stopped. Next, measurement of the object to be measured 4 is started in the same manner, and the output from the measuring device 8 is compared with the correction information. The result is memorized as a constant value, and the detection value is set to 11 in Figure 4.
After running the distance, perform the next measurement. In this way, measure the object 4 one after another.
1 Repeat over the entire area of the object to be measured. ζIt should be noted here that the divided area of the ink/pap receiver in the printing device (not shown) K does not coincide with the measurement area S, and therefore the determination of the ink supply amount is determined for each divided area. must,
For this purpose, if the width of the divided area is C as shown in FIG. The ink supply amount is determined. In other words, the amount of ink supplied is measured once as shown in FIG. Detection head lla mask case 10. Since the light 1113 and the measuring device 8 travel in unison, there is no change in the brightness distribution state of the measurement area when measuring the calibration plate 5 or when measuring the object to be measured 4, making it possible to obtain stable and good measurement results. .

第5図にこの測定方法の動作ブロック図を示しである。FIG. 5 shows an operational block diagram of this measuring method.

測定SSaレンズ2oと、光電変換素子(Is−nS)
が多数並んだ光電変換素子アレー21と、個々O光電変
換素子出カ信号を取〕出すアナログスイッチ22と、ア
ナログスイッチ22を選択するシフトレジスター23と
、そし”(yフトレジスメーを制御する回路24と1)
成る。コンソール2に内蔵された中央制御SZSよシ澗
定器コントロール26へII定開始指令が出されると、
光電変換素子アレー21の素子15.28−ngが順次
選択されて個々の光電変換素子の入光量に応じた充電変
換信号を連続的に得られる。このようにして第5図のラ
インL1に生じる光電変換信号の出力波形は第6図に示
す様になる。ζζで第4図の測定領域の測定ポイン)I
P、2P−nPは光電変換素子18.!8−n8に対応
する筒所として示してあシ第6図に示される個々の波高
値が第4図のIP、2P−npの反射光量値となるわけ
である。
Measurement SSa lens 2o and photoelectric conversion element (Is-nS)
A photoelectric conversion element array 21 in which a large number of photoelectric conversion elements are lined up, an analog switch 22 for outputting individual O photoelectric conversion element output signals, a shift register 23 for selecting the analog switch 22, and a circuit 24 for controlling the 1)
Become. When the central control SZS built in the console 2 issues a II constant start command to the stagnation device control 26,
The elements 15.28-ng of the photoelectric conversion element array 21 are sequentially selected, and charging conversion signals corresponding to the amount of light incident on each photoelectric conversion element can be continuously obtained. The output waveform of the photoelectric conversion signal thus generated on line L1 in FIG. 5 becomes as shown in FIG. 6. ζζ is the measurement point of the measurement area in Figure 4) I
P, 2P-nP is a photoelectric conversion element 18. ! The individual wave height values shown in FIG. 6 as the tube locations corresponding to 8-n8 become the reflected light amount values of IP and 2P-np in FIG. 4.

第6図の信号は、第5図に示すアナログtIIL形変換
(υ30に入力され、その出力波形はjI7図に示す如
くなる。すなわち第7図の波形は116図の皺高値を連
続したアナログ波形にした4の−eある。
The signal in Fig. 6 is input to the analog tIIL conversion (υ30) shown in Fig. 5, and its output waveform is as shown in Fig. There is -e of 4 which was made into .

このfIL形を積分器31で(υ弐に示すようにtlか
らtnまでの時間で積分することで第4図の測定領域S
の全域における反射光量値を得る。
By integrating this fIL shape with the integrator 31 (as shown in υ2) over the time from tl to tn, the measurement area S shown in FIG.
Obtain the reflected light amount value over the entire range.

ム si定領領域全反射光量 値(t)  :第7図におけるtlからtシO波形th
”n:全光電変換素子のス中ヤン時間とζで問題となる
の紘前述したように測定領域Sの輝度分布状態のむらに
ぶる測定領域面からの反射光量のむもが測定誤差となる
こと、レンズ20を使用している丸めにその光軸からレ
ンズ周辺へ近づくにりれて入光量が滅)、同一の反射量
を持った被測定物4をレンズ200光軸部で測定したも
のとその周辺部で調定し九もOとで誤差が生じることで
ある。そζで測定領域SのIP、2P−・nP(第4図
)の反射光量が測定器80党電変換素子IS、lS・・
・ngにいかなる入党状態て分布しているかをあらかじ
め測定しておき、これを補正定数として演算して記憶し
、セして菖7図の波形を積分1131で積分する前KI
I正器R雪に&いて補正定数による補正を行う。
Total reflection light amount value (t) in fixed area: tl to t and O waveform th in Fig. 7
``n: A problem with the scanning time and ζ of all photoelectric conversion elements.As mentioned above, the unevenness of the brightness distribution state of the measurement area S and the amount of reflected light from the measurement area surface causes measurement errors. (The amount of incident light decreases as the lens approaches the periphery of the lens from the optical axis of the lens 20), and the measured object 4 having the same amount of reflection is measured at the optical axis of the lens 200. An error will occur if the adjustment is made in the peripheral area.Then, the reflected light amount of IP, 2P-, nP (Fig. 4) of the measurement area S is determined by lS...
・Measure in advance what kind of membership state is distributed in ng, calculate and store this as a correction constant, and set the KI before integrating the waveform of the iris 7 diagram with the integral 1131.
Correction is performed using the correction constant while in the snow.

このような補正を行うために校正1[zが配置されるの
であシ、被測定物4を測定する前にまず校正板5を測定
して光電変換素子1g、!8−allの出力状態をラベ
る。ζOための校正1[s社測定器8の測定領域Sと同
一長さをLび同一幅で、被測定物番の印ふ51部および
非印刷部とそれぞれ同じ色調の2色の面積部分5ム、5
Bが印刷されておシ、第8図にカニす如きものとされる
。それ故、校正板5の測定は印刷部の面積部分5ムと非
印刷部の面積部分5凰と02回の測定となる。その出力
波形を第9図訃よび第10図に示す、ζζで校正板5の
印刷部の色調が明るい色調とするならば、その出力波形
社用9の如くな夛、非印刷部が暗い色調とするならばそ
の出力波形は第10図の如くなる。第9図および第1O
図に示し九校正板5にシける2つOs定値は第5図のテ
ンプル・ホールド33を通して中央制御部25に与えら
れ、それぞれの充電変換素子18.28・・・ngにつ
き記憶される。ここでテンプルeホールド33お工ヒ積
分!31からの出力信号は信号選択34にょシ切換えら
れ、アナ薗グ/デジタル変換器35にニジ変換されて中
央制御部25に入力される。
Since the calibration 1[z is arranged to perform such correction, before measuring the object to be measured 4, the calibration plate 5 is first measured and the photoelectric conversion elements 1g, ! 8-Label the output status of all. Calibration 1 for ζO [Area area 5 of the same length and same width as the measurement area S of the S company measuring instrument 8, with two colors of the same tone as the marking 51 of the object number to be measured and the non-printing area, respectively. Mu, 5
B is printed on it, and it looks like a crab in Figure 8. Therefore, the calibration plate 5 is measured 02 times with an area of 5mm for the printed area and 5mm for the area of the non-printed area. If the output waveform is ζζ as shown in Figure 9 and Figure 10, and the color tone of the printed part of the proof plate 5 is a bright color tone, then the output waveform is as shown in Figure 9, and the non-printed part is a dark color tone. If so, the output waveform will be as shown in FIG. Figure 9 and 1O
The two Os constant values shown in the nine calibration plates 5 are given to the central control unit 25 through the temple hold 33 in FIG. 5, and are stored for each charge conversion element 18,28...ng. Temple e hold 33 construction integral here! The output signal from 31 is switched to signal selection 34, converted to analog/digital converter 35, and inputted to central control section 25.

j119図に示した印刷部の面積部分5ムにおける測定
で得た光電変換素子1S−n80出力v8i〜vSn 
から第1θ図におけるVTt〜VT、  をそれぞれ差
し引く減算を行うととによって←) I (3)式を得
る。
Photoelectric conversion element 1S-n80 output v8i to vSn obtained by measurement at area 5mm of the printed part shown in Figure j119
By subtracting VTt~VT in Fig. 1θ from ←) I (3) is obtained.

V8 s ”+’n  v’r s 、11mVV t
 〜nvv1〜鳳 ax 〜nX(at 〜rs VT1〜n)−Rt〜n
−<3)Rs−a : 114正器32による補正結果
S1〜n : 1lFGS図に示す被測定物5の測定出
力l111−、ll:補正定数 β:7、パン補正定数 V・:測定スパンとして必要な値 V&:VVt〜nの中で最大の値 eこでgs図o波形v、〜、お!び第10110*形V
T1〜nFi測定し九校正板5が単一色であるから、波
高値が平坦となるべきである。そζで(2)式を使用し
て光電変換素子l5−n8に係るそれぞれの補正定数を
中央制御部25において算出する。
V8 s ”+'n v'r s , 11mVV t
~nvv1~ho ax ~nX(at ~rs VT1~n)-Rt~n
-<3) Rs-a: 114 Correction results by the regular device 32 S1-n: 11 Measurement output of the object 5 shown in the FGS diagram l111-, ll: Correction constant β: 7, Pan correction constant V: as measurement span Required value V&: Maximum value e among VVt ~ n Here, gs diagram o waveform v, ~, oh! and No.10110*Type V
Since the nine calibration plates 5 in the T1 to nFi measurements are of a single color, the peak values should be flat. Then, the central control unit 25 calculates each correction constant for the photoelectric conversion elements l5-n8 using equation (2).

スパン補正定数−#i測定スパンを調整する−ので、光
電の輝度が落ちた場合の第9図および第10図の波高値
全体の変動に対する補正定数である。
Since the span correction constant #i adjusts the measurement span, it is a correction constant for the overall fluctuation of the peak value in FIGS. 9 and 10 when the photoelectric brightness decreases.

Va/VVi−ntj個々の光電素子出力のバラツキを
補正するためのもので、当然ながら測定領域8における
照射輝度むらの補正も出来る。
Va/VVi-ntj This is for correcting variations in the outputs of individual photoelectric elements, and of course it is also possible to correct unevenness in irradiation brightness in the measurement area 8.

補正定数a1〜nは第11図の様なパターンになる。そ
して中央制御部25内に記憶される。
The correction constants a1 to n form a pattern as shown in FIG. Then, it is stored in the central control unit 25.

この工うにして校正板5を測定することで第11□ 図の如き補正定数413〜nを得九後検出ヘッド11を
走行させて被測定物4に関する測定を開始するのである
By measuring the calibration plate 5 in this manner, correction constants 413 to n as shown in FIG.

この測定においてラインを寓に社第7図に示し九如き測
定信号が時間1mからtnt″″C願次あられれる。一
方時間tlからtn4で同期してラインを魯には中央制
御部25からデジタル/アナログコンバータ36を介し
て補正定数波形(第1111に示す)が与えられ、アナ
ログ波形変換(2) 37によ)ラインt4にはその波
高値の連続し九アナログII形があられれを、また、同
時に第10図に示し九校正板5の非印刷部における測定
結果がデジタル/アナログコンバータ38を介して2イ
ン1.に与えられ、アナログ波形変換(3) 39によ
)ラインL@にはその波高値の連続したアナログ波形が
あられれる。そしてこれらはライン1.に1〕与えられ
ゐ測定値とともに補正器32に! J) (3)式0演
算が行なわれ、測定amが補正される。、この出力信号
をtlからtnの走査時間で積分器31により積分し、
tntでの積分値を中央制御部25において記憶する。
In this measurement, a measurement signal as shown in FIG. 7 using the line as an analogy is generated from time 1 m to tnt''C. On the other hand, a correction constant waveform (shown at 1111) is given to the line from time tl to tn4 from the central control unit 25 via the digital/analog converter 36, and analog waveform conversion (2) is performed by 37). On the line t4, the continuous peak value of the 9 analog type II is shown, and at the same time, the measurement results on the non-printed part of the 9 calibration plate 5 are transmitted through the digital/analog converter 38 into 2-in-1 as shown in FIG. .. , and by analog waveform conversion (3) 39), a continuous analog waveform of the peak value is placed on the line L@. And these are line 1. 1] is given to the corrector 32 along with the measured value! J) (3) Equation 0 calculation is performed and the measured am is corrected. , this output signal is integrated by an integrator 31 over a scanning time from tl to tn,
The integral value at tnt is stored in the central control unit 25.

これKよ〉1回すなわち1つの測定領域に関する測定が
終了するOであ)、検出ヘッド11は第4図に示した距
離亀だけ走行して、同様に次の測定を行う。この工うな
測定を被測定物4の全面にゎた夛繰返す、ζ0橢定にお
けるタイム・チャートを第12図に示す。
After this, the detection head 11 travels the distance shown in FIG. 4, and performs the next measurement in the same manner. FIG. 12 shows a time chart for the determination of ζ0, in which this simple measurement is repeated over the entire surface of the object to be measured 4.

このような本発明によるインキ供給量測定装置による効
果を説明すれば次の通)である。すなわち、従来インキ
供給量が適切であるか否かを作業者が刷夛上〉を見なが
らイン中パルプを調整していたので適正なイン中量を調
整するまでに多くの損紙を発生していたうえ、この作業
線かなりの熟練を要していたのに対し、本発明の装置を
使用することに1シ熟練作東者でなくとも簡単に適正な
イン中供給量をセット出来、しかも印刷開始前にこの調
定結果でイydFパルプをセットしておけは損紙をかな
り少くさせることが出来る。それ社従米工〉問題となっ
ていた光IIO輝度変化に対する測定誤差や充電変換素
子特性のバッフ中、測定領域の輝度むらによる測定誤差
を、調定Ws#I前に校正板を測定して適正な補正定数
を算出し、補正しながら被測定物を測定してゆくいわゆ
る自動キャリブレーション方式としたことで解決した九
めであ夛、これに、ニジ精度の良い安定した結果が得ら
れるためである。
The effects of the ink supply amount measuring device according to the present invention will be explained as follows. In other words, in the past, operators had to adjust the ink pulp while checking the printing process to see if the ink supply amount was appropriate, which resulted in a lot of wasted paper until they could adjust the appropriate ink amount. In addition, this work line required a considerable amount of skill, whereas using the device of the present invention, even a non-skilled operator can easily set the appropriate amount of supply during the process. If the IydF pulp is set based on this adjustment result before printing starts, the amount of paper waste can be considerably reduced. The problem of measurement errors due to changes in optical IIO brightness and uneven brightness in the measurement area during buffing of charge conversion element characteristics has been corrected by measuring the calibration plate before adjustment Ws#I. This problem was solved by using the so-called automatic calibration method, which calculates a correction constant and measures the object while making corrections.In addition, stable results with good accuracy can be obtained. .

また糊定器の個々O光電変換素子出力をデジタル化して
測定すると多大なメモリーを必要とし、るが、本発明O
ものでは測定器の光電変換出力をアナログ液形として積
分する方法を使用しているOでメモリーも少なく演算時
間も少なくて済む利点がある。
Furthermore, if the output of each O photoelectric conversion element of a glue measuring device is digitized and measured, a large amount of memory is required, but the present invention
This method uses a method of integrating the photoelectric conversion output of the measuring device as an analog liquid type, which has the advantage of requiring less memory and requiring less calculation time.

同、2色O印刷物でその互いの面積比を反射光量で測定
するもOであれば、校正板の色をその2色にすることで
測定出来るのであ)、前述した装置以外に多くの適用が
出来ることは勿論である。
Similarly, if the area ratio of two-color O printed matter is measured by the amount of reflected light, it can be measured by changing the color of the calibration plate to the two colors), so it can be used in many applications other than the above-mentioned device. Of course it is possible.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図および第2図は本発明の一実施例であるインキ供
給量測定装置の立面図訃よび端面図。 第3図社マスクケースの斜視図。 第4図社欄定器にぶる測定領域を示す斜視図。 第5図は第1図および第2図に示した装置Oブロック図
。 第6図、第7図お工び第9図〜第110!lIは波形を
示す説明図。 第8図拡校正板を示す斜視図。 第12図は測定を示すタイムチャート図。 !・・・・−・・・暗箱 2・−・・・・・・コンソール 4−・・・・・・被測定物 5・−・・・・・・校正板 8・・・・・・・−Ill定器 9・・・・・・−光源箱 10・・・・・・・・・マスクケース 11・・・・・・・・・検出ヘッド 12・−・・・・・・パルスモータ 13・・・・・・・・・光源 20−m−レンズ 21−−−一党電変換素子アレー 21−−−アナログスイッチ 23−−−−−シフトレジスター 24−−・−−シフトレジスター制御回路2トーーー中
央制御部 26−−−−−欄定器コントロール 30 、37 、39 +++アナログ波形変換31−
−−−−−−積分器 35.36.38−−コンバータ 特許出願人    日本レギュレーター株式会社代理人
 弁理士     小  野   栄手続補正書(自発
) 18和56年7月、27日 特許庁長官島田春樹殿 り事件の表示  4I劇昭56−1155502発明の
名称   インキ供給量測定装置a補正をする者 事件との関係  特許出願人 氏 名  日本レギュレーター株式会社也代 理 人 
〒177 住 所  東京都練馬区谷j115−8−ロ電話996
−1659氏名 弁理士(658g)小野 栄ψ &葡正命令の日付 (自発) a補正の内容 明細書第4頁第9行中「測定装置」とある會「測定器」
に、@S頁第14行中、「遮光するようk」の次にr 
Ill定器の前に」を挿入し、同じく第15行中「測定
器による」とあるを削減。第6頁第11行中「に開して
の補正定数によって補正する」とあるを「素子ごとの補
正定数を等比する仁とによって被測定物測定結果を補正
する」と訂正する。
1 and 2 are an elevational view and an end view of an ink supply amount measuring device according to an embodiment of the present invention. Figure 3 is a perspective view of the company's mask case. FIG. 4 is a perspective view showing the measurement area on the column measuring device. FIG. 5 is a block diagram of the apparatus shown in FIGS. 1 and 2. Figures 6, 7 and 9 to 110! lI is an explanatory diagram showing a waveform. FIG. 8 is a perspective view showing the enlarged calibration plate. FIG. 12 is a time chart diagram showing measurement. ! ...... Dark box 2 ...... Console 4 - ... Measured object 5 ... ... Calibration plate 8 ...... Ill meter 9...-Light source box 10...Mask case 11...Detection head 12--Pulse motor 13. ......Light source 20--Lens 21--Single power conversion element array 21--Analog switch 23--Shift register 24--Shift register control circuit 2-- Central control unit 26--Column control 30, 37, 39 +++Analog waveform conversion 31-
---Integrator 35.36.38--Converter patent applicant Japan Regulator Co., Ltd. Agent Patent attorney Sakae Ono Procedural amendment (voluntary) July 27, 1856 Haruki Shimada, Commissioner of the Japan Patent Office Indication of the Tonori case 4I Drama Sho 56-1155502 Name of the invention Relationship with the Ink Supply Quantity Measuring Device A Corrector Case Patent Applicant Name Nippon Regulator Co., Ltd. Yayo Osamu
177 Address: Tanij115-8-Ro, Nerima-ku, Tokyo Telephone: 996
-1659 Name Patent attorney (658g) Sakae Ono ψ & Date of order by Tadashi (spontaneous) a Meeting that says “Measuring device” on page 4, line 9 of the statement of contents of the amendment “Measuring device”
In the 14th line of @S page, r next to "k to block light"
``Before the measuring device'' was inserted, and the phrase ``depending on the measuring device'' in line 15 was also deleted. In page 6, line 11, the phrase ``correct by a correction constant divided by 2'' is corrected to ``the measurement result of the object to be measured is corrected by a ratio of correction constants for each element.''

Claims (1)

【特許請求の範囲】 被測定物O測定領域を定める開口を有し且り測定領域以
外からの光を線光するマスクケース、鋏!スクケースK
jlj付けられて被測定物O橢定領域を照明する光源、
シエび被橢定物OIl定領域からの反射光をレンズを通
して自薦せる複数0党電変換素子からなるアレー上に導
びく測定器を有してなる検出ヘッドを、 暗箱に沿りて検出ヘッドをステップ状に$動させ、順次
K1m定領域を移動させる仁とで*sm定物の全面にわ
たる走査が行えるようになす九めO駆動装置と、 被橢定物O印刷S訃よび非印刷部と同じ色を別々に印刷
されて情々に測定領域に対置できるように被測定物と同
一レベルにて暗11に配置され九校正板と、 前記測定I)Kよる測定領域に関する個AQ光電変換素
子O出力信奇を連続的な信号列として検出した後ζOw
t高値を連続するアナログ波形に変換する丸めon路と
、 前記校正板に関する測定に基いて光電置換素子アレーに
おけるそれぞれの素子に関する補正定数を求めて記憶す
る回路と、 前記補正定数に基いて前記測定器の出力信号を補正する
補正n路と、 前記補正の行われ九t11部アナログ液形を積分して印
刷部と被印刷部との面積比率を測定する回路と、 前記測定領域にシける印刷部と非印刷部との面積比率に
基いてインキ供給量を決定する丸めの回路と、 を含んでなるインキ供給量調定装置。
[Claims] A mask case and scissors that have an opening that defines the measurement area of the object to be measured and that emits light from outside the measurement area! School case K
a light source that illuminates a fixed area of the object to be measured O;
A detection head with a measuring device that guides the reflected light from the fixed area of the object and the object OIl through a lens onto an array consisting of a plurality of 0-electroelectric conversion elements is installed along the dark box. A driving device that makes it possible to scan the entire surface of the *sm standard by moving it stepwise and sequentially moving the K1m constant area; nine calibration plates printed separately in the same color and placed in the dark 11 at the same level as the object to be measured so that they can be conveniently placed opposite to the measurement area; After detecting the O output signal as a continuous signal train, ζOw
a rounding circuit for converting the t high value into a continuous analog waveform; a circuit for determining and storing a correction constant for each element in the photoelectric displacement element array based on measurements on the calibration plate; n correction circuits for correcting the output signal of the device; a circuit for integrating the analog liquid form for which the correction is performed and measuring the area ratio between the printing section and the printed section; and a printing section for printing in the measurement area. An ink supply amount adjusting device comprising: a rounding circuit that determines the ink supply amount based on the area ratio of the printing section and the non-printing section;
JP56115550A 1981-07-23 1981-07-23 Device for measuring amount of ink supply Granted JPS5817308A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56115550A JPS5817308A (en) 1981-07-23 1981-07-23 Device for measuring amount of ink supply

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56115550A JPS5817308A (en) 1981-07-23 1981-07-23 Device for measuring amount of ink supply

Publications (2)

Publication Number Publication Date
JPS5817308A true JPS5817308A (en) 1983-02-01
JPS637603B2 JPS637603B2 (en) 1988-02-17

Family

ID=14665310

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56115550A Granted JPS5817308A (en) 1981-07-23 1981-07-23 Device for measuring amount of ink supply

Country Status (1)

Country Link
JP (1) JPS5817308A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6325533A (en) * 1986-07-17 1988-02-03 Toshiba Seiki Kk Measurement of quantity of light from lighted object
JPH0280942A (en) * 1988-09-17 1990-03-22 Topcon Corp Surface inspection apparatus
EP0414504A2 (en) * 1989-08-25 1991-02-27 Xerox Corporation Densitometer for measuring developability
US5387976A (en) * 1993-10-29 1995-02-07 Hewlett-Packard Company Method and system for measuring drop-volume in ink-jet printers
JP2009535607A (en) * 2006-04-28 2009-10-01 グローバル・センサー・システムズ・インコーポレイテッド Equipment for measuring the size of packages

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3754822A (en) * 1971-02-26 1973-08-28 Xerox Corp Scanning system
JPS5444914A (en) * 1977-09-14 1979-04-09 Mitsuo Tanaka Method of easily adjusting ink in flat plate printing
JPS5654309A (en) * 1979-10-11 1981-05-14 Dainippon Printing Co Ltd Device for measurement of pattern area from printed board for offset print

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3754822A (en) * 1971-02-26 1973-08-28 Xerox Corp Scanning system
JPS5444914A (en) * 1977-09-14 1979-04-09 Mitsuo Tanaka Method of easily adjusting ink in flat plate printing
JPS5654309A (en) * 1979-10-11 1981-05-14 Dainippon Printing Co Ltd Device for measurement of pattern area from printed board for offset print

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6325533A (en) * 1986-07-17 1988-02-03 Toshiba Seiki Kk Measurement of quantity of light from lighted object
JPH0280942A (en) * 1988-09-17 1990-03-22 Topcon Corp Surface inspection apparatus
EP0414504A2 (en) * 1989-08-25 1991-02-27 Xerox Corporation Densitometer for measuring developability
US5387976A (en) * 1993-10-29 1995-02-07 Hewlett-Packard Company Method and system for measuring drop-volume in ink-jet printers
JP2009535607A (en) * 2006-04-28 2009-10-01 グローバル・センサー・システムズ・インコーポレイテッド Equipment for measuring the size of packages

Also Published As

Publication number Publication date
JPS637603B2 (en) 1988-02-17

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