JPS58170836U - Microwave integrated circuit board test fixture - Google Patents

Microwave integrated circuit board test fixture

Info

Publication number
JPS58170836U
JPS58170836U JP6837682U JP6837682U JPS58170836U JP S58170836 U JPS58170836 U JP S58170836U JP 6837682 U JP6837682 U JP 6837682U JP 6837682 U JP6837682 U JP 6837682U JP S58170836 U JPS58170836 U JP S58170836U
Authority
JP
Japan
Prior art keywords
circuit board
integrated circuit
microwave integrated
test fixture
board test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6837682U
Other languages
Japanese (ja)
Inventor
宮北　清
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP6837682U priority Critical patent/JPS58170836U/en
Publication of JPS58170836U publication Critical patent/JPS58170836U/en
Pending legal-status Critical Current

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Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の一実施例を示す斜視−１第２図は第１
図のＡ−Ａ’を通る縦断面において矢印方向から見た断
面図である。 １・・・・・・マイクロ波集積回路基板、２・・・・・
・ベース、３・・・・・・ケース、４・晶・・絶縁棒、
５・・・・・・Ｌ／バー、６・・・・・・カム、７・・
・・・・同軸接栓、８・・・・・・スプリング、９・・
・・・・ナツト、１０・・・・・七ス、１１・・・・・
・基板１の入出力部、１２・・・・・・中心導体、１３
・・・・・・支点。Figure 1 is a perspective view showing one embodiment of the present invention. Figure 2 is a perspective view of an embodiment of the present invention.
FIG. 2 is a cross-sectional view taken along the arrow direction in a longitudinal section taken along line AA' in the figure. 1...Microwave integrated circuit board, 2...
・Base, 3...Case, 4.Crystal...Insulation rod,
5... L/bar, 6... Cam, 7...
... Coaxial plug, 8 ... Spring, 9 ...
...Natsuto, 10...7th, 11...
- Input/output section of board 1, 12... Center conductor, 13
······fulcrum.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 面方向位置を定めて被試験マイクロ波集積回路基板を収
納する凹部のあるケースと、この収納し、　たマイクロ
波集積回路基板の入出力部が接触する位置に中心導体を
位置させて前記ケースに固定した同軸接栓と、この中心
導体にその入出力部を押し付ける方向に前記マイクロ波
集積回路基板に対し弾性力を加える手段と、この弾性力
印加手段と前記中心導体との距離を調節して前記弾性力
め印加および除去を制御する手段とを備えるマイクロ波
集積回路基板試験治具。A case with a recess for storing a microwave integrated circuit board to be tested with a fixed surface direction position; A fixed coaxial plug, a means for applying an elastic force to the microwave integrated circuit board in a direction of pressing the input/output portion thereof to the center conductor, and a distance between the elastic force applying means and the center conductor are adjusted. and means for controlling application and removal of the elastic force.
JP6837682U 1982-05-11 1982-05-11 Microwave integrated circuit board test fixture Pending JPS58170836U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6837682U JPS58170836U (en) 1982-05-11 1982-05-11 Microwave integrated circuit board test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6837682U JPS58170836U (en) 1982-05-11 1982-05-11 Microwave integrated circuit board test fixture

Publications (1)

Publication Number Publication Date
JPS58170836U true JPS58170836U (en) 1983-11-15

Family

ID=30078160

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6837682U Pending JPS58170836U (en) 1982-05-11 1982-05-11 Microwave integrated circuit board test fixture

Country Status (1)

Country Link
JP (1) JPS58170836U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009168471A (en) * 2008-01-10 2009-07-30 Tamagawa Electronics Co Ltd Semiconductor device test apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009168471A (en) * 2008-01-10 2009-07-30 Tamagawa Electronics Co Ltd Semiconductor device test apparatus

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