JPS58144242U - Focus correction tip - Google Patents

Focus correction tip

Info

Publication number
JPS58144242U
JPS58144242U JP1982041124U JP4112482U JPS58144242U JP S58144242 U JPS58144242 U JP S58144242U JP 1982041124 U JP1982041124 U JP 1982041124U JP 4112482 U JP4112482 U JP 4112482U JP S58144242 U JPS58144242 U JP S58144242U
Authority
JP
Japan
Prior art keywords
focus correction
mirror
chopper
temperature
focus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1982041124U
Other languages
Japanese (ja)
Other versions
JPS6350651Y2 (en
Inventor
雄一 萩原
吉村 恒彦
明人 長田
鷲野 弘幸
Original Assignee
富士通株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士通株式会社 filed Critical 富士通株式会社
Priority to JP1982041124U priority Critical patent/JPS58144242U/en
Publication of JPS58144242U publication Critical patent/JPS58144242U/en
Application granted granted Critical
Publication of JPS6350651Y2 publication Critical patent/JPS6350651Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Radiation Pyrometers (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は赤外線温度検出装置の原理図、第2図はその焦
点補正機構の概略図、第3図は従来のカムパターン検出
方法を示す図、第4図は従来のチョツノ二の斜視図、第
5図は本考案にかさるチョッーハノ斜視図、第6図は本
考案にか)るカムパターンのネガパターン図、第7図は
本考案にかさるカムパターン検出方法を示す図、第8図
は本考案にかさるカムパターンを形成したフィルムを示
す図である。 図中、1はスラブ、2は回転鏡、3は赤外線、4は1次
線、5は2次鏡、6は赤外線検出部、9゜21はチョッ
パ、10.20はカムパターン、 ・24はフィルムを
示す。
Fig. 1 is a principle diagram of an infrared temperature detection device, Fig. 2 is a schematic diagram of its focus correction mechanism, Fig. 3 is a diagram showing a conventional cam pattern detection method, Fig. 4 is a perspective view of a conventional chotsuno-2, Figure 5 is a perspective view of the present invention, Figure 6 is a negative pattern diagram of the cam pattern according to the present invention, Figure 7 is a diagram showing the cam pattern detection method of the present invention, and Figure 8. 1 is a diagram showing a film on which a cam pattern according to the present invention is formed; FIG. In the figure, 1 is a slab, 2 is a rotating mirror, 3 is an infrared ray, 4 is a primary line, 5 is a secondary mirror, 6 is an infrared detector, 9°21 is a chopper, 10.20 is a cam pattern, and 24 is Showing the film.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 物体から放射される赤外線を回転鏡、1次鏡、及び2次
鏡で反射させ、赤外検出部に集光入射させて物体の温度
を検出する赤外線温度検出装置に附設されて、上記回転
鏡と一体的に回転するチョッパに形成した焦点補正用カ
ムパターンを光学的に検出し、その検出信号に基づき2
次鏡を調整し−で焦点を補正するように構成された焦点
補正機構において、上記チョッパは透明円筒にカムパタ
ーンがフォトレジスト膜の現像焼き付けによって作成さ
れ、あるいはフォトレジスト膜の現像焼き付けによって
作成されたフィルムが張り付けられた構造からなること
を特徴とする焦点補正用チョッノで。
The rotating mirror is attached to an infrared temperature detection device that detects the temperature of an object by reflecting infrared rays emitted from an object by a rotating mirror, a primary mirror, and a secondary mirror, and condensing the reflected light into an infrared detection section to detect the temperature of the object. The focus correction cam pattern formed on the chopper that rotates integrally with the chopper is optically detected, and based on the detection signal, the
In the focus correction mechanism configured to correct the focus by adjusting a second mirror, the chopper has a cam pattern formed on a transparent cylinder by developing and baking a photoresist film, or by developing and baking a photoresist film. This is a focus correction lens characterized by a structure with a film attached to it.
JP1982041124U 1982-03-23 1982-03-23 Focus correction tip Granted JPS58144242U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1982041124U JPS58144242U (en) 1982-03-23 1982-03-23 Focus correction tip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1982041124U JPS58144242U (en) 1982-03-23 1982-03-23 Focus correction tip

Publications (2)

Publication Number Publication Date
JPS58144242U true JPS58144242U (en) 1983-09-28
JPS6350651Y2 JPS6350651Y2 (en) 1988-12-27

Family

ID=30052313

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1982041124U Granted JPS58144242U (en) 1982-03-23 1982-03-23 Focus correction tip

Country Status (1)

Country Link
JP (1) JPS58144242U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008058044A (en) * 2006-08-30 2008-03-13 Sumitomo Metal Mining Co Ltd Temperature measuring method of resin film, and heating film deposition device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008058044A (en) * 2006-08-30 2008-03-13 Sumitomo Metal Mining Co Ltd Temperature measuring method of resin film, and heating film deposition device

Also Published As

Publication number Publication date
JPS6350651Y2 (en) 1988-12-27

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