JPS58123558U - Secondary ion mass spectrometer - Google Patents

Secondary ion mass spectrometer

Info

Publication number
JPS58123558U
JPS58123558U JP1996182U JP1996182U JPS58123558U JP S58123558 U JPS58123558 U JP S58123558U JP 1996182 U JP1996182 U JP 1996182U JP 1996182 U JP1996182 U JP 1996182U JP S58123558 U JPS58123558 U JP S58123558U
Authority
JP
Japan
Prior art keywords
mass spectrometer
ion mass
secondary ion
sample holder
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1996182U
Other languages
Japanese (ja)
Inventor
広瀬 博
Original Assignee
株式会社日立製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立製作所 filed Critical 株式会社日立製作所
Priority to JP1996182U priority Critical patent/JPS58123558U/en
Publication of JPS58123558U publication Critical patent/JPS58123558U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案を説明するための正面図、第2図は平面
図、第3図は試料ホルダ部の平面図と正面図である。 
 − 1・・・ガス導入装置、2・・・−次粒子源、3・・・
試料ホルダ、6・・・物点スリット、7. 8. 9・
・・質量分析計、10・・・溝、13・・・グリセロー
ル。
FIG. 1 is a front view for explaining the present invention, FIG. 2 is a plan view, and FIG. 3 is a plan view and a front view of the sample holder section.
- 1... gas introduction device, 2... -order particle source, 3...
Sample holder, 6... object point slit, 7. 8. 9・
...Mass spectrometer, 10...Groove, 13...Glycerol.

Claims (1)

【実用新案登録請求の範囲】 ガス導入装置、上記ガスの一次粒子を生成するための一
次粒子源、分析するための試料とこれを。 保持するための試料ホルダ、スパッタされた二次イオン
を分析するための質量分析計より成る装置において、上
記試料ホルダは質量分析計の物点スリットの長さ方向と
同じ方向に長く、二次イオンの加速方向と反対側に凹の
溝を有する二次イオン質量分析計。
[Claims for Utility Model Registration] A gas introduction device, a primary particle source for generating primary particles of the gas, and a sample for analysis. In an apparatus consisting of a sample holder for holding the secondary ions and a mass spectrometer for analyzing the sputtered secondary ions, the sample holder is long in the same direction as the length of the object point slit of the mass spectrometer, and A secondary ion mass spectrometer with a concave groove on the opposite side to the direction of acceleration.
JP1996182U 1982-02-17 1982-02-17 Secondary ion mass spectrometer Pending JPS58123558U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1996182U JPS58123558U (en) 1982-02-17 1982-02-17 Secondary ion mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1996182U JPS58123558U (en) 1982-02-17 1982-02-17 Secondary ion mass spectrometer

Publications (1)

Publication Number Publication Date
JPS58123558U true JPS58123558U (en) 1983-08-23

Family

ID=30032149

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1996182U Pending JPS58123558U (en) 1982-02-17 1982-02-17 Secondary ion mass spectrometer

Country Status (1)

Country Link
JP (1) JPS58123558U (en)

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