JPS5812334A - Auto handler - Google Patents

Abstract

PURPOSE:To perform a large capacity treatment of IC and contrive the improvement of operating rate, by preventing the operating speed righ and left of shuttles from not following the measured speed in an auto handler wherein the shuttle and containing part have the structure of at least two stages or more. CONSTITUTION:An IC to be measured is thrown into a supply part 15. Next, the IC is sent in a transverse direction by a carrier 16, and the IC sent from the carrier part is turned at a turret 17 in the direction of a vertical measurement part, thus being dropped thereinto. Further, it is judged for PASS, FALL at the measurement part 18 and sent into a shoot part 19. In case of the operating speed of the shuttle <measured speed, the shoot part 19 rises and falls and then utilizes the first and second shuttles 20, 21 and containing parts 22, 23. In brief, when the measured speed is considerably high and the classification in the shuttle is difficult, the IC is carried alternately into an unused shuttle 19 by the up-down movement of the shoot part so that the shuttle 19 can satisfactorily cope with the measured speed in the measurement part.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention provides a structure for an autohandler comprising a supply stop, a measuring section, a chute section, a shuttle, a containing section, etc., and the structure of the shuttle and containing section. More specifically, it relates to a series of operations from portions (h, -) to storage portion (o).

The object of the present invention is to prevent the left and right movement speed of the shuttle from being unable to follow the measured speed when the IC is measured at high speed.

Another object of the invention is to provide large capacity processing. Furthermore, another object of the present invention is to improve the operating rate of an autohandler.

The present invention will be explained in detail below.

First, as shown in Fig. 1, the crushed liquid I0 is poured from the supply port 1. Furthermore, measurement is carried out using the KI 11 fixing section 2 (as shown in FIG. 2, the electrode contactor 4 is brought into contact with the IC lead 5, and the connected tester is used). It then passes through the chute section and reaches the shuttle. By the left and right movement of the shuttle, it is stored in a designated area of Pλssym ML of accommodation s3.

A detailed explanation of such a series of operations is shown in FIG. 3. First, FIG. 3(a) is a plan view of the autohandler. Further, (b) is a diagram showing a cross section of (a). First, the IO to be measured is poured into the supply section 8゜8'. Next, the carrier 9.9' sends the workpiece C in the horizontal direction, and the workpiece C sent from the carrier section with the turrets 1o and 1σ is sent to the vertical measuring section. Turn around and drop, further measuring part 11.1
At 1', check PASB and IFAIL, pass through the shade section, and board the shuttle (classification section) 13.15.
The measured workpiece 0 is determined by the judgment signal from the tester, and P is set in advance.
Accommodation section 14.1 where musss 1 and fmu machining areas are set
Store 4'lK. Note that the arrows in the figure indicate the flow of xO.

The molded IO is measured while repeating a series of operations as described above, and the above operations are possible if the operating speed of the shuttle is the measurement speed. In other words, if the shuttle's left and right movement is fast and the measurement speed is slow, the shuttle can respond adequately, but conversely, if the shuttle movement is slow and the measurement speed is fast, the shuttle will respond to the measurement speed and is difficult to store. t
In order to increase the speed of the shuttle, an attempt was made to shorten the width of the storage section, but since there were few workers entering the storage section, the operating rate of mass-produced models deteriorated, which was very problematic. .

The present invention eliminates the above-mentioned drawbacks and will be described in detail below.

As shown in Figure 4, the shuttle and storage section have a two-tiered structure. Note that the present invention will be explained using an autohandler having a two-stage structure. First, the IC to be measured is poured into the supply section 15. Next, the carrier 16 sends ra in the lateral direction, and the turret 17 changes direction and drops it into the X0Vt@direct measurement part sent from the carrier part.
A FAIL determination is made and sent to the shade section 19. At this time, if the operating speed of the shuttle is greater than the measured speed, the first-stage shuttle 20 and accommodation section 22 are used. Conversely, when the operating speed of the shuttle is measured (measured speed), the shade part 19 rises and falls, and the shuttles 2 of the first and second stages
0, 21, and accommodating portions 22 and 25 are used. In short, if the measuring speed is quite fast and classification with the shuttle is difficult, the unused shuttles 19 are alternately processed by moving the chute up and down. , so that the shuttle 19 can sufficiently cope with the measuring speed of the measuring section.

In addition, in the present invention, in the case of shuttle operation speed>measurement speed, the first stage shuttle 2o and storage 111220 were used, but the operation rate in mass production type (in order to increase the operation rate, large capacity processing of the KFi storage section) was used. The second stage shuttle 21 and the storage section 23 may be used to improve the efficiency of storage. Further, in the present invention, an autohandler with a two-stage structure has been described, but if a multi-stage structure is adopted depending on the measurement speed, it will be even more useful for improving the operating rate and processing a large capacity. The present invention prevents the left and right movement speed of the shuttle from being unable to follow the measured speed when the shuttle and the storage section are in at least two stages. It also aims to improve the operating rate by performing large-capacity processing.

[Brief explanation of the drawing]

Figure 1 is a schematic diagram of the autohandler (conventional diagram), and Figure 2 is a structural diagram of the measuring section (conventional diagram). Figure 3 (a) is a plan view of the autohandler, (b) F
i cross-sectional view (conventional view). FIG. 4 is a sectional view of an autohandler according to the present invention. 1... Supply port 2.11.11', 18... Measurement part 5.14
．． 14', 22.25...accommodation section 4...
・Contactor 5...IC lead 6...IC 7■0+-rail 8, 8', 15...Supply section 9.9', 16
...Carrier 10.10', 17...
・Turret 12.12', 19... Sheet parts 13, 13', 20.21... Shuttle and above Applicant Suwa Seikosha Co., Ltd. Agent Patent attorney Tsutomino Mogami Figure 4

Claims (3)

[Claims] (1) The molded XO is put into the supply section and dropped onto the firefly, which has been judged as PA8B, Fum II, in the measurement section, and onto the shuttle. An autohandler that is stored in an area, wherein the shuttle and storage section of the autohandler have a structure of at least two or more stages. (2) In the autohandler, the XO that has been fixed by the measuring section is fed into the chute section, and the
After one of the shuttles (which has a structure of at least two stages) is completed by vertical movement, the shuttle is stored in the PA88 ν area of the dyeing storage area by left and right movement of the shuttle. An auto handler characterized by: (3) The autohandler is characterized in that the up and down movement of the chute section is performed when the adjustment speed applied to the measurement section is faster than the left and right movement speed of the crest shuttle.