JPS58116659U - ultrasound microscope - Google Patents
ultrasound microscopeInfo
- Publication number
- JPS58116659U JPS58116659U JP1300682U JP1300682U JPS58116659U JP S58116659 U JPS58116659 U JP S58116659U JP 1300682 U JP1300682 U JP 1300682U JP 1300682 U JP1300682 U JP 1300682U JP S58116659 U JPS58116659 U JP S58116659U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- microscope
- ultrasound
- ultrasound microscope
- ultrasonic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
−第51図は、従来の超音波ビームの探触子系の概略構
成を示す図、第2図はその動作を説明するための図、第
3図は、反射波の処理方法を説明するためのブロック図
、第4図は、相対インピーダンスと反射率との関係を示
す特性曲線図、第5図は、レンズ界面と試料からのそれ
ぞれのエコーの大きさを説明する図、第6図は、反射超
音波信号の大きさと表示すべき出力信号の大きさの関係
を示す図、第7図は、本考案の一実施例の構成を示す図
1、第8図は、その動作を説明するための図、第9図及
び第10図は、本考案の要部の一実施例の構成を示す図
である。
−I S、IO,7Q−−−−
1、”=−’Jzw: ’Ant@雫の111tイ、
シt−3r〉ス引ね。
遁−6図 ゛。- Figure 51 is a diagram showing the schematic configuration of a conventional ultrasonic beam probe system, Figure 2 is a diagram to explain its operation, and Figure 3 is a diagram to explain the method of processing reflected waves. Fig. 4 is a characteristic curve diagram showing the relationship between relative impedance and reflectance, Fig. 5 is a diagram explaining the magnitude of each echo from the lens interface and the sample, and Fig. 6 is a block diagram of A diagram showing the relationship between the magnitude of a reflected ultrasound signal and the magnitude of an output signal to be displayed, FIG. 7 shows the configuration of an embodiment of the present invention, and FIG. 8 shows a diagram for explaining its operation. , FIG. 9, and FIG. 10 are diagrams showing the configuration of an embodiment of the main part of the present invention. -I S, IO, 7Q---
1,"=-'Jzw: 'Ant@Shizuku's 111t,
Shit-3r〉pull. Ton - Figure 6 ゛.
Claims (1)
用いて、該試料の超音波像を得る超音波顕微鏡において
、該試料の音響インピーダンスの2−゛ 次元分布のう
ちある範囲にあるインピーダンスのみを表示する手段を
具備せる事を特徴とする超音波顕微鏡。[Claims for Utility Model Registration] The sample is the focal region of the focused ultrasonic beam. In an ultrasound microscope that obtains an ultrasonic image of a sample using reflected ultrasound obtained by two-dimensional scanning, only the impedance within a certain range of the 2-dimensional distribution of acoustic impedance of the sample is used. An ultrasonic microscope characterized by being equipped with a means for displaying.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1300682U JPS58116659U (en) | 1982-02-03 | 1982-02-03 | ultrasound microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1300682U JPS58116659U (en) | 1982-02-03 | 1982-02-03 | ultrasound microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58116659U true JPS58116659U (en) | 1983-08-09 |
Family
ID=30025542
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1300682U Pending JPS58116659U (en) | 1982-02-03 | 1982-02-03 | ultrasound microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58116659U (en) |
-
1982
- 1982-02-03 JP JP1300682U patent/JPS58116659U/en active Pending
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