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Priority to JP1300182UpriorityCriticalpatent/JPS58116657U/en
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Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves
(AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【図面の簡単な説明】[Brief explanation of the drawing]
第１図は従来の超音波顕微鏡の概略構成を示す図、第２ 図は本考案の一実施例を示す図である。Figure 1 shows the schematic configuration of a conventional ultrasound microscope; The figure shows an embodiment of the present invention.
Claims (1)
【実用新案登録請求の範囲】[Scope of utility model registration request]超音波集束ビームを送受−する音響レンズと、上記ビー ムと所定試料とを２次元的に相対的に走査する手段とか らなる超音波顕微鏡はおいて、上記試料にたえず引張応 力を加える手段を具備することを特徴とする超音波顕微 鏡。An ultrasonic microscope comprising an acoustic lens for transmitting and receiving a focused ultrasonic beam, and a means for two-dimensionally scanning the beam and a predetermined sample relative to each other, and a means for constantly applying tensile stress to the sample. An ultrasonic microscope characterized by: