JPS58115690A - Read-only memory device - Google Patents

Read-only memory device

Info

Publication number
JPS58115690A
JPS58115690A JP56212884A JP21288481A JPS58115690A JP S58115690 A JPS58115690 A JP S58115690A JP 56212884 A JP56212884 A JP 56212884A JP 21288481 A JP21288481 A JP 21288481A JP S58115690 A JPS58115690 A JP S58115690A
Authority
JP
Japan
Prior art keywords
signal
column
selection signal
column selection
rom
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56212884A
Other languages
Japanese (ja)
Inventor
Takashi Osone
大曾根 隆志
Hideyoshi Shimura
志村 秀吉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP56212884A priority Critical patent/JPS58115690A/en
Publication of JPS58115690A publication Critical patent/JPS58115690A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/08Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
    • G11C17/10Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
    • G11C17/12Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices

Landscapes

  • Read Only Memory (AREA)

Abstract

PURPOSE:To reduce power consumption and increase operation speed of a read- only memory device which stores information according to the absence/presence of an insulating gate type field effect transistor (MOS type FET). CONSTITUTION:Row selection signals X1, X2-Xn are selected by a signal ''1'', and column selection signals Y1, Y2-Yn are selected by a signal ''0''. Namely, an n-MOSFET21 in an area applied with the row selection signal ''1'' and the column selection signal ''0'' is read. Therefore, four maximum n-MOSFETs 21 applied with the column selection signal ''0'' at sources turn on and a DC current flows from a power source Vcc through a pull-up p-MOSFET26. The number of n-MOSFET21 in an on state is determined by the number of FETs corresponding to the signals ''0'' and ''1'' stored in the selected column, so the number of FETs 21 in the on state is 0-4 and 2 on average; and current consumption is reduced to <=1/10 and an ROM having a fast operation speed is realized.

Description

【発明の詳細な説明】 本発明の目的は、絶縁ゲート型電界効果トランジスタ(
MO8型FET )の有無によって情報を蓄積する読み
出し専用記憶装置(旦eal OnlyMemo r 
7 、以下ROMと略す)の低消費電力化と高速動作を
実現することにある。
DETAILED DESCRIPTION OF THE INVENTION An object of the present invention is to provide an insulated gate field effect transistor (
A read-only memory device that stores information depending on the presence or absence of MO8 type FET.
7, hereinafter abbreviated as ROM), to achieve low power consumption and high-speed operation.

第1図は従来のROMで、情報を蓄積するn−MO8型
FMT10がXn行Ym列のマトリクス状に配置されて
いる。夫々のE’ E T 1oのゲートには行選択信
号X1.X2.・・・Xnが印加さね、ドレインはビッ
ト線11〜14に接続され、ソースはGND電位に接続
される。この場合、ROMの情報はコンタクトの有無に
よってドレインをビット線に接続するか否かによって蓄
積する。
FIG. 1 shows a conventional ROM in which n-MO8 type FMTs 10 for storing information are arranged in a matrix of Xn rows and Ym columns. A row selection signal X1 . X2. . . . Xn is not applied, the drain is connected to the bit lines 11 to 14, and the source is connected to the GND potential. In this case, information in the ROM is accumulated depending on whether or not the drain is connected to the bit line depending on the presence or absence of a contact.

ビット線11〜14には電源VCCとの間にゲートとド
レインがVccに接続されたプルアップ用n −MO3
FET15が接続されるとともに、列選択信号Y1.Y
2.・・・Ymがゲートに印加された列スイッチ用n−
MO8F E T 16が接続される。これ等の列スイ
ッチ用n−MO5FET 18の一端はデータ線17−
20に接続され、n→asFET16のゲートに列選択
信号の′1”信号が印加された夫々のデータ線から4種
類の出力信号0゜−03が得られる。尚、第1図のR2
〜Rmのブロックは、左の回路構成を複数個配置した様
子を示し、この全体配置でROMが構成される。
The bit lines 11 to 14 are connected to the power supply VCC by a pull-up n-MO3 whose gate and drain are connected to Vcc.
FET15 is connected, and column selection signal Y1. Y
2. ... n- for column switches with Ym applied to the gate
MO8FET16 is connected. One end of these n-MO5FETs 18 for column switches is the data line 17-
Four types of output signals 0°-03 are obtained from the respective data lines connected to 20 and to which the column selection signal '1' signal is applied to the gate of n→asFET 16. Note that R2 in FIG.
The blocks ˜Rm show how a plurality of the circuit configurations on the left are arranged, and a ROM is configured with this overall arrangement.

従来の回路では、行選択信号X1.X2・・・Xnのう
ち′1”信号が印加された情報蓄積用n −MO3FE
T10はオンしてプルアップ用n〜MO3FET15を
介して電源Vaaから直流電流がGNDへ流れ、データ
線は0”電位となる。
In the conventional circuit, row selection signals X1. X2...n-MO3FE for information storage to which '1'' signal is applied among Xn
T10 is turned on, and a DC current flows from the power supply Vaa to GND via the pull-up n~MO3FET15, and the data line becomes 0'' potential.

MO8FE715がない場合には直流電流は流れず、デ
ータ線は′1”電位となる。第1図の場合には各列信榛
に対して4列のFET10が配列されているので、最大
4Xm個のFET1oがオンする。
If there is no MO8FE715, no DC current will flow and the data line will be at a '1' potential. In the case of Figure 1, four columns of FETs 10 are arranged for each column signal, so a maximum of 4Xm FETs can be used. FET1o turns on.

但し、オンするFET10の数はその選択された列に蓄
えられる′0” u 1 ++倍信号対応するFETの
数で決定されるので、オンスルFET10の数は0個〜
4Xm個の間の値をとる。従って、平均すれば2m個の
FET1oがオンすることとなる。FET10がオンし
た時にプルアップ用n−MO8FET15を介して電源
VccからGNDへ流れる′電流値をIcとすれば、平
均に消費される消費電流1ccは、 IcC==  2  In  X   lc   拳拳
*amm   (1)〕       で与えられる。
However, since the number of FETs 10 that are turned on is determined by the number of FETs that correspond to the '0'' u 1 ++ multiplied signal stored in the selected column, the number of on-switch FETs 10 is between 0 and 10.
Takes a value between 4Xm. Therefore, on average, 2m FETs 1o are turned on. If the current value flowing from the power supply Vcc to GND via the pull-up n-MO8FET 15 when the FET 10 is turned on is Ic, then the average consumption current of 1 cc is as follows: IcC==2 In X lc Fist*amm ( 1)] is given by.

但し、mは列選択信号の数である。However, m is the number of column selection signals.

第1図では、大容量ROMを構成するために列選択信号
の数を増やす程それに比例して消費電流Iccが増加す
る欠点がある。又、データ線の寄生容1も列選択信号に
比例して増大するために、出力信号0゜−03のスイッ
チング速度も大容量ROMになるに従って遅くなってし
まい、第1図では大容量、低消費電力、高速動作のRO
M回路としての欠点を有する。
In FIG. 1, there is a drawback that as the number of column selection signals is increased to configure a large capacity ROM, the consumption current Icc increases in proportion to the number of column selection signals. In addition, since the parasitic capacitance 1 of the data line also increases in proportion to the column selection signal, the switching speed of the output signal 0°-03 also becomes slower as the capacity increases. Power consumption, high speed operation RO
It has drawbacks as an M circuit.

本発明は、大容量ROMをより低消費電流で、かつ同等
以上の高速動作で実現する手段を提供することが目的で
ある。
It is an object of the present invention to provide a means for realizing a large capacity ROM with lower current consumption and faster operation at the same or higher speed.

第2図は本発明の一実施例のROMを示す。情報蓄積用
n−MO8FET21がXn行Ym行ツマトリクス状に
配置されている。夫々のFET21のゲートには行選択
信号x1.x2.・・・Xnが印加され、ドレインハヒ
ット線22〜26に接続されている。
FIG. 2 shows a ROM according to an embodiment of the present invention. Information storage n-MO8FETs 21 are arranged in a matrix of Xn rows and Ym rows. A row selection signal x1. x2. . . . Xn is applied and connected to the drain hitt lines 22 to 26.

この場合、ROMの情報は、従来の例と同様にコンタク
ト窓あけの有無によってドレインをビット線に接続する
か否かによって蓄積する。FET21のソースには列選
択信号Y1.Y2・・・Ymが印加される。ビット線2
2〜26には電源Vccとの間にプルアップ用p−MO
8FET2eが接続され、そのゲートはGNDに接続さ
れる。ビット線22〜26には列選択信号Y1.Y2.
・・・Ymがゲートに印加された列スイッチ用p−MO
5FET27が接続され、それ冴の他端はデータ線28
〜31に接続され、夫々のデータ線から4種類の出力信
号0゜〜o3が得られる。又、データ線28〜31には
必要に応じてプルアップ用p−MO8FET26’が電
源VCCとの間に接続される。尚、第2図のR2〜Rm
のブロックは左の回路構成を複数個配置した様子を示し
、この全体配置でROMが構成される。
In this case, information in the ROM is accumulated depending on whether or not the drain is connected to the bit line depending on whether or not a contact window is opened, as in the conventional example. The source of FET21 is supplied with column selection signal Y1. Y2...Ym is applied. bit line 2
2 to 26 have p-MO for pull-up between the power supply Vcc.
8FET2e is connected, and its gate is connected to GND. Bit lines 22-26 are supplied with column selection signals Y1. Y2.
... p-MO for column switch with Ym applied to the gate
5FET27 is connected, and the other end of it is the data line 28.
.about.31, and four types of output signals 0.degree..about.o3 are obtained from the respective data lines. Furthermore, a pull-up p-MO8FET 26' is connected between the data lines 28 to 31 and the power supply VCC as necessary. Furthermore, R2 to Rm in Fig. 2
This block shows a plurality of circuit configurations on the left, and this entire layout constitutes a ROM.

第2図の場合には、行選択信号X1.x2.・・・bは
′1”信号で選択され、列選択信号Y1.Y2・・・Y
nは′0”信号で選択される。即ち、列選択信号が゛′
1″′信号で、かつ列選択信号が0”信号の印加された
領域の情報蓄積用n−MO8FET21が読み出される
。この時、他の列選択信号は1”fti号が印加されて
いるので、情報蓄積用n−M(JSFET21のソース
は1”レベルとなるためプルアップ用p−MO8Fk:
T26からの直流電流は流れない。
In the case of FIG. 2, row selection signals X1. x2. ...b is selected by the '1" signal, and the column selection signal Y1.Y2...Y
n is selected by the '0' signal. That is, the column selection signal is '0'.
The information storage n-MO8FET 21 in the region to which the 1'' signal and the column selection signal 0'' signal is applied is read out. At this time, the other column selection signals are 1"fti applied, so the information storage n-M (JSFET21 source is at 1" level, so the pull-up p-MO8Fk:
No direct current flows from T26.

従って、第2図の場合は、列選択信号の゛0゛′信号が
ソースに印加される最大4つのn−MO8FET21が
オンし、プルアップ用p−MO3FET26を介して電
源Vc弓1ら直流電流がlAc九る。このオンするn−
MO3FET21の数はその選択された列に蓄えられた
+I Q I+ 、 111n信号に対応するFET0
数で決定されるので、オンするFET21の数は0個〜
4個の間の値をとり、平均すれば2個となる。FET2
1がオンした時に電源Vccからプルアップ用p−MO
8FETを介して流れる電流値を、従来例と同様にIc
とすれば、本発明で平均に消費される消費電流Ice’
は、IcC’ =2 x I c    ・…・・ (
2)となる。第1図の例では(1)式で与えられる如(
2mxIcであるから、本発明を用いれば、ROMの消
費電流は1/mに減少する。しかも本発明の場合には、
ROMが如何に大容量になろうともその清酒電流は2I
cで一定に珠たれ、低消費電力化に有効である。例えば
、8にピットス8出力の64にピッ)ROMを構成する
場合を考えると、第2図の)10M構成に於いて、n 
= 256 、 m = 32のものが2ブロツクで構
成できる。従って、第1図の消費電流に比べて1/32
に減少できる。更に大谷敏の256にピットや1Mビッ
トになれば、夫々1 /64 、1 /1281c減少
f キ、大容量ROMになる程、本発明は有効になる。
Therefore, in the case of Fig. 2, up to four n-MO8FETs 21 whose sources are applied with the column selection signal ``0'' signal are turned on, and a direct current flows from the power supply Vc bow 1 through the pull-up p-MO3FET 26. is lAc9. This turns on n-
The number of MO3FET21 is FET0 corresponding to the +I Q I+, 111n signal stored in that selected column.
Since it is determined by the number, the number of FETs 21 to turn on is 0 to
A value between 4 is taken, and the average is 2. FET2
p-MO for pull-up from power supply Vcc when 1 is turned on
The current value flowing through the 8FET is set to Ic as in the conventional example.
Then, the average consumption current Ice' of the present invention is
is IcC' = 2 x Ic... (
2). In the example shown in Figure 1, as given by equation (1), (
Since it is 2m×Ic, if the present invention is used, the current consumption of the ROM is reduced to 1/m. Moreover, in the case of the present invention,
No matter how large the capacity of the ROM becomes, its sake current is 2I.
c, which is effective for reducing power consumption. For example, considering the case where a ROM is configured at 64 with 8 outputs and 8 outputs, in the 10M configuration shown in Figure 2, n
= 256 and m = 32 can be constructed with two blocks. Therefore, compared to the current consumption in Figure 1, it is 1/32
can be reduced to Furthermore, if Satoshi Otani's 256 has pits or 1M bits, the present invention becomes more effective as the capacity of the ROM increases by 1/64 and 1/1281c, respectively.

第3図は本発明の別の実施例を示す。R1,R2・・・
Rmで示すブロックは、第1図又は第2図に示す左の回
路ブロックとR2・・・Rmに対応する。R1゜R2・
・・Rmで構成されるブロックを左(l)右(r)の2
つのブロックに配置し、その行選択信号は第2図と同様
に共通のXl、X2.・・・Xn信号を印加する。従っ
て、左右のブロックの行方向は行選択信号によって同時
に選択される。列選択信号は、ブロック切換信号A、A
が論理積されたYl・A、Y2・A。
FIG. 3 shows another embodiment of the invention. R1, R2...
The block indicated by Rm corresponds to the left circuit block shown in FIG. 1 or 2 and R2...Rm. R1゜R2・
・The block composed of Rm is 2 on the left (l) and right (r).
The row selection signals are common to Xl, X2 . ...Apply the Xn signal. Therefore, the row directions of the left and right blocks are simultaneously selected by the row selection signal. The column selection signal is the block switching signal A, A
are ANDed Yl・A, Y2・A.

(r)と左ブロック(1)に印加する。更に、データ線
1    32〜39には夫々ブロック切換用トランス
ファゲートとしてp−mzO8FET40〜47を接続
する。
(r) and the left block (1). Furthermore, p-mzO8FETs 40 to 47 are connected to the data lines 132 to 39, respectively, as transfer gates for block switching.

トランスファゲート40〜43のゲートにはハ信号が、
トランスファゲート44〜4γのゲートにはA信号を印
加する。ブロック切換1K ’i Aが“1”の時は左
ブロックが、Aが“1″の時は右ブロックが選択される
。この時、出力信号0゜〜03の得られるデータ線32
.36と33.37と34゜38と35.39はトラン
スファゲートによって2分割されており、トランスファ
ゲート40〜47がない場合に比べて、データ線の寄生
容量は約1/2に減少し、情報蓄積用n−MO8FET
21によるビット線とデータ線の放電時間及びプルアッ
プ用がMO8FET26によるビット線とデータ線の充
電時間が短絡されてROMの高速動作が可能となる。尚
、データ線32〜39に接続されたp −MO8FET
48はプルアップ用のMOSFETで、非選択状態にあ
るデータ線を“1″レベルに充電せしめる作用を有し、
そのゲートはGNDに、ソースは電源Vcc(g接続さ
れている。
The gates of transfer gates 40 to 43 have a signal C,
A signal is applied to the gates of transfer gates 44 to 4γ. Block switching 1K'i When A is "1", the left block is selected, and when A is "1", the right block is selected. At this time, the data line 32 from which output signals 0° to 03 are obtained
.. 36, 33, 37, 34, 38, and 35.39 are divided into two by transfer gates, and the parasitic capacitance of the data line is reduced to about 1/2 compared to the case without transfer gates 40 to 47, and the information Storage n-MO8FET
The discharging time and pull-up time of the bit line and data line by MO8FET 21 are short-circuited, and the charging time of the bit line and data line by MO8FET 26 are short-circuited, thereby enabling high-speed operation of the ROM. In addition, p-MO8FET connected to data lines 32 to 39
48 is a pull-up MOSFET, which has the function of charging the data line in a non-selected state to the "1"level;
Its gate is connected to GND, and its source is connected to the power supply Vcc (g).

第4図は第3図と同様に、データ線の寄生容量を1/2
に減少せしめるための別の実施例を示す。
In Figure 4, the parasitic capacitance of the data line is reduced to 1/2, similar to Figure 3.
Another embodiment for reducing the

g3図と同一番号のものは同一の機能をもつものである
。左右ブロックの列選択信号には共通のY、、Y2.・
・・Ym信号を印加し9、行選択信号にブロック選択信
号A、Aの論理積を印加する。従って、・f、4図の場
合には、列方向は左右ブロックで各1列が選択されるが
、行方向は右又は左ブロックのどちらか一方の一列のみ
が選択される。
Items with the same numbers as in Figure g3 have the same functions. Common column selection signals for the left and right blocks are Y, , Y2 .・
. . . Apply the Ym signal 9, and apply the AND of the block selection signals A and A to the row selection signal. Therefore, in the case of *f, Figure 4, one column in each of the left and right blocks is selected in the column direction, but only one column in either the right or left block is selected in the row direction.

このためデータ線に読み出される信号は、列選択毎yj
で選ばれた左右の何れかの1ブロツクで、かつ列選択信
号が“0”になっている領域のものが読み出される。第
3図、第4図の実施例では、それ等の消費電流は第2図
の場合と同様に1つの行と1つの列選択信号で選ばれた
領域の情報蓄積用n−MO3FETの平均の数に比例し
た消費電流(この場合にはIce=2Ic)であるが、
そのデータ線の寄生容量は約1/2に減少してより高速
なスイッナング動作を可能にしている。
Therefore, the signal read out to the data line is yj for each column selection.
One block on either the left or right selected by , and in the area where the column selection signal is "0", is read out. In the embodiments shown in FIGS. 3 and 4, their current consumption is the average of the information storage n-MO3FETs in the area selected by one row and one column selection signal, as in the case of FIG. Although the current consumption is proportional to the number (Ice=2Ic in this case),
The parasitic capacitance of the data line is reduced to about 1/2, enabling faster switching operation.

以1−に述べたように、本発明を用いれば消費電流は従
来の数10分の1以下に減少し、動作速度の速い)tO
Mが実現できる。尚、第2図〜第4図の説明では、プル
アンプ用MO8FET26.26’。
As described in 1- above, by using the present invention, the current consumption is reduced to less than several tenths of that of the conventional method, and the operating speed is high.
M can be realized. In addition, in the explanation of FIGS. 2 to 4, MO8FET 26.26' is used for pull amplifier.

48や、列スイッチ用MO8FET27や、ブロック切
換用トランスファゲート40〜47にp −MOSFE
Tを用いて説明したが、n−MOSFETを用いても同
様な機能を有するように構成することができる。
48, MO8FET 27 for column switches, and transfer gates 40 to 47 for block switching are p-MOSFEs.
Although the description has been made using an n-MOSFET, the same function can be achieved using an n-MOSFET.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のROM回路図第2図、第3図。 第4図はそれぞれ本発明の実施例のROM回路図である
。 21−−−−−−情報蓄積用n−MO3FET、26.
26’。 48・・・・・・プルアップ用p−MO8FET、27
 ”00列スイッチ用p −MO3F ET、 40〜
47 ・・・−−−ブロック切換用トランスファゲート
。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
図 ’I’+       Yz  も 第2図 第3図 ノ     l 第4図
FIG. 1 is a conventional ROM circuit diagram, FIGS. 2 and 3. FIG. 4 is a ROM circuit diagram of an embodiment of the present invention. 21---n-MO3FET for information storage, 26.
26'. 48...Pull-up p-MO8FET, 27
"00 row switch p-MO3F ET, 40~
47 ...--- Transfer gate for block switching. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Figure 'I' + Yz is also Figure 2 Figure 3 No l Figure 4

Claims (1)

【特許請求の範囲】[Claims] 情報蓄積用絶縁ゲート型トランジスタのゲートに行選択
信号を印加し、ドレインをビット線に接続し、ソースに
列選択信号を印加するとともに、=■iピビソト線と電
源との間にプルアップ用絶縁ゲート型トランジスタを接
続し、かつ前記ビット線とデータ線との間に列選択信号
がゲートに印加された列スイッチ用絶縁ゲート型トラン
ジスタを接続したことを特徴とする読み出し専用記憶装
置。
A row selection signal is applied to the gate of the insulated gate transistor for information storage, the drain is connected to the bit line, and a column selection signal is applied to the source. A read-only memory device comprising: a gate type transistor connected thereto; and a column switch insulated gate type transistor having a column selection signal applied to its gate connected between the bit line and the data line.
JP56212884A 1981-12-28 1981-12-28 Read-only memory device Pending JPS58115690A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56212884A JPS58115690A (en) 1981-12-28 1981-12-28 Read-only memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56212884A JPS58115690A (en) 1981-12-28 1981-12-28 Read-only memory device

Publications (1)

Publication Number Publication Date
JPS58115690A true JPS58115690A (en) 1983-07-09

Family

ID=16629850

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56212884A Pending JPS58115690A (en) 1981-12-28 1981-12-28 Read-only memory device

Country Status (1)

Country Link
JP (1) JPS58115690A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5394371A (en) * 1991-07-02 1995-02-28 Sharp Kabushiki Kaisha Semiconductor memory device with shared sense amplifiers

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5394371A (en) * 1991-07-02 1995-02-28 Sharp Kabushiki Kaisha Semiconductor memory device with shared sense amplifiers

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