JPS58108453A - Holding means for array type probe - Google Patents
Holding means for array type probeInfo
- Publication number
- JPS58108453A JPS58108453A JP56207487A JP20748781A JPS58108453A JP S58108453 A JPS58108453 A JP S58108453A JP 56207487 A JP56207487 A JP 56207487A JP 20748781 A JP20748781 A JP 20748781A JP S58108453 A JPS58108453 A JP S58108453A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- shoe
- probed
- efficiency
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/28—Details, e.g. general constructional or apparatus details providing acoustic coupling, e.g. water
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
【発明の詳細な説明】
発明の技術分野
本発明は電子走査臘超音波探傷法に使用されるアレイm
探触子において、特にその被探傷体への接触用保持異に
関するものである。DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to an array m used in electronic scanning ultrasonic flaw detection.
In a probe, it particularly relates to a holding part for contacting the object to be inspected.
発明の技術的背景
近年、電子走査渥超音波探傷法において、特に被探傷体
と超音波探触子との接触効率が重要な課題となってお9
.これに伴って探触子の保持真および探触子と被探傷体
の間に介在させる接触媒質の供給方法等多くの試みがな
されている。アレイ型探触子においても、最近探触子と
被探傷体の間にシ、−を介した例が、“特開昭54−1
43194 ”および1開昭5.4−164182’等
によ)提案されているが、探触子の移動時の接触効率の
保持については記述されていない。Technical Background of the Invention In recent years, in electronic scanning ultrasonic flaw detection, the contact efficiency between the object to be tested and the ultrasonic probe has become an important issue9.
.. In response to this, many attempts have been made, including methods for holding the probe and for supplying a couplant interposed between the probe and the object to be tested. In the case of array-type probes, a recent example of using a wire between the probe and the object to be detected is disclosed in "Unexamined Japanese Patent Publication No. 54-1.
43194'' and 1997-164182, etc.), but there is no description of maintaining the contact efficiency during the movement of the probe.
背景技術の問題点
ところで、かかる従来の手段においては、探触子と被探
傷物との接触効率を改良するために、接触子の送受信面
に被探傷体形状に合せた7ユーを接触させたり、被探傷
体と探触子送受音面またはシュー〇関KIl触媒質を常
時自動供給する等の方法が採られているが、探触子の移
動に伴い被探傷体が十分滑らかでない念め接触媒貰の途
切れを生じる等により、十分な接触効率を保持し得ない
等の難点がある。一方、アレイ型探触子は一般に超音波
ビームを被探傷物体内に集束させる場合、およびリニア
電子走査による大きな視野範囲を得る九めには超音波送
受開口面を大きくする必要があるが、このような場合探
触子の寸法は必然的に大きくな〕、被探傷体との一様な
接触を困難としている。さらに、プレイ型探触子の振動
子群を曲面状に配列することは製作が複雑となるため、
通常直線状に配列された振動群によって構成されるプレ
イ型探触子が探傷に使用されるが、探触子寸法が大きく
なると曲面状の被探傷体への探触子の一様な接触が困難
となる。Problems with the Background Art By the way, in such conventional means, in order to improve the contact efficiency between the probe and the object to be tested, it is necessary to contact the transmitting/receiving surface of the contact with a 7U that matches the shape of the object to be tested. Methods such as constantly automatically supplying the probe to the probe's transmitting/receiving surface or the catalyst material have been adopted; There are drawbacks such as failure to maintain sufficient contact efficiency due to interruptions in the supply of catalyst. On the other hand, array type probes generally require a large ultrasonic transmission/reception aperture to focus the ultrasonic beam into the object to be inspected and to obtain a large field of view through linear electronic scanning. In such cases, the size of the probe is necessarily large], making it difficult to make uniform contact with the object to be inspected. Furthermore, arranging the transducer groups of play-type probes in a curved shape is complicated to manufacture.
Play-type probes consisting of a group of vibrations arranged in a straight line are usually used for flaw detection, but as the probe size increases, uniform contact of the probe with the curved object to be inspected becomes difficult. It becomes difficult.
発明の目的
本発明は上記のような事情に鑑みて成されたもので、そ
の目的は探触子と被探傷体との間の十分な接触効率を保
持して探傷効率(超音波送受効率)を向上させることが
できるプレイ型探触子保持^を提供することKToる。Purpose of the Invention The present invention was made in view of the above-mentioned circumstances, and its purpose is to maintain sufficient contact efficiency between the probe and the object to be tested to improve flaw detection efficiency (ultrasonic transmission/reception efficiency). To provide a play-type probe holding system that can improve the performance of the probe.
発明の概要
上記目的を達成するために本発明では、電子走査型超音
波探傷に使用する複数個の振動子を配列してなるアレイ
雛探触子と被探傷体との関にその一端面を被探傷体の形
状に合わせま九他端面を探触子の送受前面の形状に合わ
せて加工したシ、−を介在させ、且つ該シュー面上にて
探触子を可動する如くプレイ型探触子保持臭を構成する
ものである。SUMMARY OF THE INVENTION In order to achieve the above object, the present invention uses an array probe, which is formed by arranging a plurality of transducers used in electronic scanning ultrasonic flaw detection, and one end surface of the probe in the relationship between the probe and the object to be inspected. A play-type probe in which the other end surface is machined to match the shape of the transmitting/receiving front surface of the probe, and the probe is moved on the shoe surface. It constitutes the child retention odor.
発明の実施例
以下、本発明の一実施例を図面を参照して説明する。第
1図(a) (b)は、本発明によるアレイ探触子保持
具の構成例を示すもので、図では円形状の被探傷体1の
外面に適用した例を示している。第1図(a) (b)
において・プレイ型探触子2は、十分平滑に仕上げら
れたシ、−3の上面をガイド棒4に沿って可動する。こ
のガイド棒4は、シ、−JK固定して敗付けられた支え
板5に固定して取付けられ・ガイド棒4Vc#″iスリ
ーブ6が可動し得るように取付けられている。さらに、
スリー16にはプレイ型探触子2をガイド棒4の長手方
向と角度ずれを生じないように、ケースiが固定して取
付けられている。さらKま几、ケース1の内部にはバネ
8が組込まれ、その弾性力によ)プレイ型探触子2を常
時一定圧力で71−3の表面に押付けるようKしている
。ここで/、−1は一般にプレイ型探触子2と被探傷体
1の音響的整合が効率よく取れる材料が選定され・例え
d非金属材、金属材またはアクリル系の樹脂材等を適用
する。Embodiment of the Invention An embodiment of the present invention will be described below with reference to the drawings. FIGS. 1(a) and 1(b) show an example of the structure of an array probe holder according to the present invention, and the figures show an example applied to the outer surface of a circular object 1 to be tested. Figure 1 (a) (b)
The play-type probe 2 is movable along the guide rod 4 on the top surface of the cylindrical body 3, which has been finished sufficiently smooth. This guide rod 4 is fixedly attached to a supporting plate 5 which is fixedly attached to the guide rod 4, and is attached so that the guide rod 4Vc#''i sleeve 6 is movable.Furthermore,
A case i is fixedly attached to the three 16 so that the play type probe 2 is not angularly misaligned with the longitudinal direction of the guide rod 4. Furthermore, a spring 8 is incorporated inside the case 1, and its elastic force always presses the play-type probe 2 against the surface of the probe 71-3 with a constant pressure. Here, -1 is generally selected from a material that can efficiently achieve acoustic matching between the play type probe 2 and the object to be tested 1. For example, non-metallic materials, metallic materials, acrylic resin materials, etc. are used. .
一方、シ&−3は被探傷体IK一定圧力で押付けられる
ものであ〕、被探傷体1または被探傷体1と相対的な変
位を生じない固定支持枠9に固定された支持棒1OK取
付けられたバネまたはエアンリン〆−JJKより、押え
板12を介して一様に被探傷体JKil触している。On the other hand, the support bar 1 fixed to the fixed support frame 9 which does not cause any displacement relative to the object to be tested 1 or the object to be tested 1 is installed. The object to be flawed is uniformly touched through the holding plate 12 from the spring or air liner-JJK.
なお、プレイ型探触子2と7.−J(り@触面には、随
時接触媒質IJが供給パイf14により供給されてお9
%両者間の音響伝達効率を良好にするとともにプレイ型
探触子2の移動を滑らかにするようにしている。tた、
シ、−3と被探傷体1の接触面にも、接触媒質18が必
要に応じて随時供給パイプ25によ)供給されている。In addition, play type probes 2 and 7. -J (at contact surface, couplant IJ is supplied from supply pipe f14 at any time.
% The acoustic transmission efficiency between the two is improved, and the movement of the play type probe 2 is made smooth. It was,
A couplant 18 is also supplied to the contact surface between the flaw detection object 1 and the flaw detecting object 1 through a supply pipe 25 as needed.
第2図(a)(b)は、シ、−Sの被探傷体との接触面
および断面を示すもので、第2図(a)(b) vc示
すようにシ、−3の被探傷体との接触面には複数個の供
給孔J6が設けられてお9、シ、−3の内部に設けられ
た導管17から、各供給孔16に一様に!I触媒質IJ
を供給する。Figures 2 (a) and (b) show the contact surface and cross section of the test object of -S, and as shown in Figures 2 (a), (b) and vc, the test object of -3 A plurality of supply holes J6 are provided on the surface that comes in contact with the body, and a plurality of supply holes J6 are provided uniformly from the conduit 17 provided inside the body to each supply hole 16! I catalyst IJ
supply.
かかる構成において、り、−Sは被探傷体1の所望の領
域を探傷すべく、自在に移動および設置し得るものであ
るが、7.−Jが一担所定の位置に移動すると、設置時
に前述した供給孔1#から接触媒質13が十分供給され
て被探傷体1上を一様に@い、その後エアシリンダー1
1により被探傷体1に密着される。この後、シ。In such a configuration, -S can be freely moved and installed in order to detect a desired area of the object to be tested 1.7. - When the J-J moves to a predetermined position, the couplant 13 is sufficiently supplied from the supply hole 1# mentioned above at the time of installation and uniformly spreads over the test object 1, and then the air cylinder 1
1, it is brought into close contact with the object 1 to be inspected. After this, Shi.
−1は被探傷体1と相対的な移動が生じないため・接触
媒質13が流出および蒸発しない限り両者の密着度は十
分保たれるものである。iた、一般に被探傷体10外表
面は十分平滑ではない究め、接触媒質13は毛細管現象
と同様な効果により流出が比較的少なく、良好な接触効
果を生じるものである。-1 is because there is no movement relative to the object 1 to be inspected, and as long as the couplant 13 does not flow out or evaporate, the degree of adhesion between the two is sufficiently maintained. Additionally, since the outer surface of the object to be inspected 10 is generally not sufficiently smooth, the couplant 13 has a relatively small amount of outflow due to an effect similar to capillarity, and produces a good contact effect.
一方、シ、−Sが所定位置に設置されると、子2は両者
とも平滑であるため、シュー3面上を接触媒質13が覆
っていれば常時良好な接触状態が得られる。かようにし
て所望の領域の探傷が終了すると、エア7りンダー11
の圧力が解除され、シ、−3が再び他の所望領域に移動
して、 −〜 −−再び探傷
が実施される。On the other hand, when shoes 2 and -S are installed at predetermined positions, since both shoes 2 are smooth, if the couplant material 13 covers the surface of the shoe 3, a good contact state can be obtained at all times. When the flaw detection in the desired area is completed in this way, the air 7rinder 11
The pressure is released, and -3 moves again to another desired area, and flaw detection is carried out again.
このように、[数個の超音波振動子を用い互いに位相干
渉させて超音波の送受信を行なう電子走査屋超音波探傷
に使用する複数個の振動子を配列してなるアレイ!11
!l!触子2において、上記探触子2と被探傷体1との
間にその一端面を嫡探傷体1の形状に合わせまた他端面
を探触子2の送受前面の形状に合わせ、て加工したV&
−3を介在させ、且つ該シ、−J面上にて探触子2を可
動する如くアレイ臘探触子保護具を構成したものである
。In this way, an array consisting of a plurality of transducers used in ultrasonic flaw detection is an electronic scanner that uses several ultrasonic transducers to transmit and receive ultrasonic waves by causing phase interference with each other. 11
! l! The probe 2 was machined between the probe 2 and the object to be tested 1 so that one end surface matched the shape of the real test object 1 and the other end surface matched the shape of the transmitting/receiving front surface of the probe 2. V&
-3 is interposed therebetween, and the array-shaped probe protector is configured such that the probe 2 is movable on the -J plane.
従って、上述したような本構成とすれば、被探傷体1が
任意の曲面形状を有していても、その自If形状に見合
ったシューを使用するようにしたので、被探傷体の所望
の領域に対して超音波探傷を行なうことが可能である。Therefore, with this configuration as described above, even if the object 1 to be flawed has an arbitrary curved surface shape, a shoe suitable for its own If shape is used, so that the desired shape of the object to be flawed can be obtained. It is possible to perform ultrasonic flaw detection on the area.
特に、シ。In particular, shi.
−3と被探傷体1を相対的に移動させないめで、シ、−
1と被探傷体1間の音響的接触が十分圧保持され・かつ
シ&−3の平滑面上でプレイ型探触子2を移動させるの
で、アレイ型探触子2とシ、−の接触が密とな力探傷効
率(超音波の子2の寸法が大きくなってアレイ箪探触子
の全面を被探傷体に均一に接触させ得ないような場合に
、よシ一層効果を発揮できるものである。-3 and the object to be inspected 1 are not moved relative to each other.
Since the acoustic contact between 1 and the object to be tested 1 is maintained at sufficient pressure, and the play type probe 2 is moved on the smooth surface of 1 and 3, contact between the array type probe 2 and 1 and 1 is maintained. Force flaw detection efficiency with high density (this method is even more effective when the size of the ultrasonic probe 2 becomes large and it is not possible to uniformly contact the entire surface of the array probe with the object to be tested) It is.
発明の変形例
(1) 上記実施例においては、7ユー3に接触媒質
供給孔J6を設けたが、供給孔を設けずK、シ、−1の
周辺から接触媒質を供給すること賜可能であり、−また
シ、−Sの接触面に微細な溝を設けて接触媒質の流入を
良好とすることも可能である。さら&C,lIB図(島
)(b)に示すように7ユー3の周辺にス4ンジ材23
等吸水性の材料を設けてさらに%接触媒質の過不足を常
時補うことも可能である。Modification of the invention (1) In the above embodiment, the couplant supply hole J6 was provided in the 7U3, but it is also possible to supply the couplant from the vicinity of K, C, and -1 without providing a supply hole. It is also possible to provide fine grooves on the contact surfaces of Y, S, and S to improve the inflow of couplant. As shown in Sara&C,lIB diagram (island) (b), there is a swivel material 23 around the 7 u 3.
It is also possible to provide equiabsorbent materials to constantly compensate for excess or deficiency in % couplant.
(2) 上記実施例では、円形状曲面の被探傷体に適
用した例を述べたが、もちろん平板状の被探傷体へも容
易に適用することができる。(2) In the above embodiment, an example was described in which the present invention was applied to an object to be tested having a circular curved surface, but of course it can be easily applied to an object to be tested having a flat plate shape.
(3) 上記説明では、シュー1上をアレイ鑞探触子
2を移動しているが、シ、−が水等の液体であっても容
易に応用し得るものであり、音響的な伝達効率をよ)一
層内上させることができる。(3) In the above explanation, the array solder probe 2 is moved on the shoe 1, but it can be easily applied even when the shoe 1 is a liquid such as water, and the acoustic transmission efficiency is can be made even more internal.
発明の詳細
な説明したように本発明によれば、探触子と被探傷体と
の間の十分な接触効率を保持して探傷効率(超音波送受
効率)を向上させることができる極めて信頼性の高いプ
レイ鳳探触子保持具が提供できる。DETAILED DESCRIPTION OF THE INVENTION According to the present invention, as described in detail, the present invention is extremely reliable and can maintain sufficient contact efficiency between the probe and the object to be tested to improve the flaw detection efficiency (ultrasonic transmission/reception efficiency). We can provide a high-play Otori probe holder.
第1図(a) (b)は本発明の一実施例を示す構成図
、11E2図(a) (b)は本発明の7.−の一実施
例を示す図、#13図(1) (b)は本発明の他の実
施例を示す図である。
1・・・被探傷体・2・・・アレイ型探触子、3・・・
ン1−・ 4・・・ガイド棒、5・・・支え板、6・・
・スリー!、7・・・ケース・ 8・・・バネ、9・・
・固定支持枠、10−支’ltl棒、11・・・エアシ
リンダー、12・・・押え板、13・・・接触媒質、1
4.15・・・供給・マイf、16・・・供給孔、J7
・・・導管、22・・・振動子、2S・・・スポンジ材
。
出諷人代理人 弁理士 鈴 江 武 彦第1図
(a)
第2!!I (a)FIGS. 1(a) and (b) are configuration diagrams showing one embodiment of the present invention, and FIGS. 11E2 (a) and (b) are 7. Figure 13 (1) (b) is a diagram showing another embodiment of the present invention. 1... Object to be inspected, 2... Array type probe, 3...
1-・4...Guide rod, 5...Support plate, 6...
·Three! , 7... Case, 8... Spring, 9...
・Fixed support frame, 10-support 'ltl rod, 11... Air cylinder, 12... Holding plate, 13... Coupling material, 1
4.15... Supply/My f, 16... Supply hole, J7
... Conduit, 22 ... Vibrator, 2S ... Sponge material. Author's agent Patent attorney Suzue Takehiko Figure 1 (a) 2! ! I (a)
Claims (1)
波の送受信を行なう電子走査型超音波探傷に使用する複
数個の振動子を配列してなるアレイ型探触子において、
前記探触子と被探傷体との間にその一端面を被探傷体の
形状に合わせまた他端面を探触子の送受前面の形状に合
わせて加工したシ、−を介在させ、且つ該V1−面上に
て探触子を可動する如く構成したことを特徴とするアレ
イ臘探触子保持真。In an array type probe made by arranging a plurality of transducers used in electronic scanning ultrasonic flaw detection, which uses a plurality of ultrasonic transducers to transmit and receive ultrasonic waves by causing phase interference with each other,
A wire is interposed between the probe and the object to be tested, one end surface of which is processed to match the shape of the object to be tested and the other end surface to match the shape of the transmitting/receiving front surface of the probe, and the V1 - An array-shaped probe holding stem characterized in that the probe is configured to be movable on a surface.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56207487A JPS58108453A (en) | 1981-12-22 | 1981-12-22 | Holding means for array type probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56207487A JPS58108453A (en) | 1981-12-22 | 1981-12-22 | Holding means for array type probe |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58108453A true JPS58108453A (en) | 1983-06-28 |
Family
ID=16540544
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56207487A Pending JPS58108453A (en) | 1981-12-22 | 1981-12-22 | Holding means for array type probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58108453A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62137007U (en) * | 1986-02-20 | 1987-08-28 | ||
EP1511006A2 (en) * | 2003-09-01 | 2005-03-02 | Centre National De La Recherche Scientifique (Cnrs) | Method and device using an ultrasonic detector |
JP2010166972A (en) * | 2009-01-20 | 2010-08-05 | Toshiba Corp | Ultrasonic diagnostic apparatus and imaging program |
CN103837599A (en) * | 2012-11-23 | 2014-06-04 | 上海金艺检测技术有限公司 | Contact-type four-channel ultrasonic probe bracket for roller flaw detection |
JP2017506742A (en) * | 2014-02-17 | 2017-03-09 | ウエスチングハウス・エレクトリック・カンパニー・エルエルシー | Phased array ultrasonic transducer for nondestructive inspection of jet pump riser tube welds and welded fixtures |
-
1981
- 1981-12-22 JP JP56207487A patent/JPS58108453A/en active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62137007U (en) * | 1986-02-20 | 1987-08-28 | ||
JPH0315056Y2 (en) * | 1986-02-20 | 1991-04-03 | ||
EP1511006A2 (en) * | 2003-09-01 | 2005-03-02 | Centre National De La Recherche Scientifique (Cnrs) | Method and device using an ultrasonic detector |
FR2859284A1 (en) * | 2003-09-01 | 2005-03-04 | Centre Nat Rech Scient | ULTRASONIC CHARACTERIZATION PROBE, CHARACTERIZATION DEVICE COMPRISING SUCH PROBE AND CHARACTERIZATION METHOD USING SUCH PROBE |
EP1511006A3 (en) * | 2003-09-01 | 2005-03-23 | Centre National De La Recherche Scientifique (Cnrs) | Method and device using an ultrasonic detector |
JP2010166972A (en) * | 2009-01-20 | 2010-08-05 | Toshiba Corp | Ultrasonic diagnostic apparatus and imaging program |
CN103837599A (en) * | 2012-11-23 | 2014-06-04 | 上海金艺检测技术有限公司 | Contact-type four-channel ultrasonic probe bracket for roller flaw detection |
JP2017506742A (en) * | 2014-02-17 | 2017-03-09 | ウエスチングハウス・エレクトリック・カンパニー・エルエルシー | Phased array ultrasonic transducer for nondestructive inspection of jet pump riser tube welds and welded fixtures |
US10557828B2 (en) | 2014-02-17 | 2020-02-11 | Westinghouse Electric Company Llc | Ultrasonic phased array transducer for the NDE inspection of the jet pump riser welds and welded attachments |
US11506634B2 (en) | 2014-02-17 | 2022-11-22 | Westinghouse Electric Company Llc | Ultrasonic phased array transducer for the NDE inspection of the jet pump riser welds and welded attachments |
US11808735B2 (en) | 2014-02-17 | 2023-11-07 | Westinghouse Electric Company Llc | Ultrasonic phased array transducer for the NDE inspection of the jet pump riser welds and welded attachments |
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