JPS58102176A - Method of breaking test for ac breaker - Google Patents
Method of breaking test for ac breakerInfo
- Publication number
- JPS58102176A JPS58102176A JP56200922A JP20092281A JPS58102176A JP S58102176 A JPS58102176 A JP S58102176A JP 56200922 A JP56200922 A JP 56200922A JP 20092281 A JP20092281 A JP 20092281A JP S58102176 A JPS58102176 A JP S58102176A
- Authority
- JP
- Japan
- Prior art keywords
- current
- breaker
- circuit
- test
- circuit breaker
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
- G01R31/3333—Apparatus, systems or circuits therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、交流遮断器の遮断試験方法に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for testing an AC circuit breaker.
近時、系統における短絡電流の解析が種々行われ、例え
ば短絡事故時に直流分含有率が非常に犬走いため、短絡
型Ｒが零点と交差しない時間的領域（通常は短絡事故発
生直後の比較的短かい領域）が存在することが解明され
え、仁のような短絡電流の一例を示せば、第１図に示す
通りである。この場合、遮断器が仁のような回路電流を
１断じ得ゐ力）どうかの検証を行う必要がある。Ｉた、
このような短絡電流波形に対しての遮断器像点に発生す
るアークについての解析を行う必要があゐ。Recently, various analyzes of short-circuit currents in power systems have been conducted. An example of a short-circuit current like a nickel is shown in FIG. 1. In this case, it is necessary to verify whether the circuit breaker is capable of cutting off such a large amount of circuit current. I,
It is necessary to analyze the arc that occurs at the circuit breaker image point for such a short circuit current waveform.
そこで、本発明者は、前述した零点と交差しない短絡電
流によゐ交流遮断器の透析性能と１断器接点に発生する
アークの状ＩＩを検証し得る試験方法を得るべく種々検
討を重ねた結果、２樵の電ｔＩｔを合成して遮断器に供
給することにより所期の目的を達成し得ることを突き止
めた。Therefore, the present inventor conducted various studies in order to obtain a test method capable of verifying the dialysis performance of an AC circuit breaker and the shape of the arc generated at one breaker contact using a short-circuit current that does not cross the above-mentioned zero point. As a result, it was found that the desired purpose could be achieved by combining the electricity tIt of the two woodworkers and supplying it to the circuit breaker.
すなわち１通常の商用周波数で変化する交流電［１，と
、この交流電流工、よプも比較的低い周波数で変化する
交流電流Ｉ２とを重畳（Ｉ。That is, an alternating current [1, which changes at a normal commercial frequency, and an alternating current I2, which also changes at a relatively low frequency, are superimposed (I).
十Ｉ２）することによ砂、第１図に示す波形に近い短絡
電流を得ることができ、これを合成等価試験回路に組み
込むことにより、交流遮断器の遮断性能の検証を容易に
達成し得すことが判った。By doing this, it is possible to obtain a short circuit current close to the waveform shown in Figure 1, and by incorporating this into a composite equivalent test circuit, it is possible to easily verify the breaking performance of an AC circuit breaker. It turned out that
従って１本発明の目的は、交流遮断器が遮断すべき交流
短絡型ｔＩＬが、その遮断動作に際して発生するアーク
の抵抗により電流零点を形成すゐような直流分含有率の
高い場合に、交流遮断器の遮断性１ｉ＠を簡便に検証し
得る交流遮断器の遮断試験方法を提供するにある・
前記の目的￥ｒ４成するため、本発明においては、交流
１ｌｌＩ断器が遮断すべき交流値Ｍ！１電流が、その遮
断動作に際して発生するアークの抵抗によシミ流零点を
形成するような直流分含有率の高い場合における遮断試
験方法であって、供試遮断器に短絡ｌｌＥ流を供給する
電ｔＩＬ１１と供試遮断器の遮断極間に過渡回復電圧を
供給する電圧源とを備えた合成等価試験回路を用いると
ともに前記電流源は菖１および第２の電流源からなｐ。Therefore, an object of the present invention is to interrupt the AC when the AC short-circuit type TIL to be interrupted by the AC circuit breaker has such a high DC content that a current zero point is formed due to the resistance of the arc generated during the interruption operation. To provide a breaking test method for an AC breaker that can easily verify the breaking performance 1i@ of an AC breaker. ! This is a breaking test method when the current has a high direct current content such that a spot current zero point is formed due to the resistance of the arc generated during the breaking operation. A synthetic equivalent test circuit is used, which includes tIL11 and a voltage source that supplies a transient recovery voltage between the breaking poles of the circuit breaker under test, and the current source is composed of the iris 1 and the second current source.
菖１の電流源から所要の周波数の電流を供給し、第２の
電流源力）ら前記周波数よ）低い周波数の電流を供給し
、これらの合成電流を短絡電流として供給することを物
像とする。The idea is to supply a current of a desired frequency from the current source of the iris 1, supply a current of a lower frequency (than the frequency) from the second current source, and supply these combined currents as a short-circuit current. do.
また、第１電源と第２電源とは発電機を使用すゐことが
できる０代案として、嬉１電源を発電機とし、第２電源
を充電コンデンサとしても所期の目的ｔＳ成することが
できる。In addition, as an alternative to using a generator as the first power source and the second power source, the desired purpose can be achieved by using the first power source as a generator and the second power source as a charging capacitor. .
次に、本発明に係ゐ交ｔｌｔ迩断器の遮断試験方法の実
施例につき添付図Ｆｊ７ｉを参照しながら以下詳細に説
明する。Next, an embodiment of the method for testing the disconnection of a TLT disconnector according to the present invention will be described in detail with reference to the attached drawing Fj7i.
菖２図は、本発明試験方法を実施する回路図である。す
なわち、第２図において、供試遮断器１０と直列に補助
遮断器１２を接続し、これらの１断！ｆ＋１０．１２に
対し、リアクトル１４および開閉器１６を介してｊ１１
′亀源１８に接続し、供試遮断器１０に所定の試験電流
ｘ１を供給する回路を構成する。また、前記遮断器１０
゜１２に対し、リアクトル２０および開閉！６２２を介
して縞２電源２４に接続し、供試遮断器１０に所定の試
験電ＩＪＬＩ２ｔ−供給す石回路を構成する。Diagram 2 is a circuit diagram for implementing the test method of the present invention. That is, in FIG. 2, the auxiliary circuit breaker 12 is connected in series with the test circuit breaker 10, and one of these circuit breakers is disconnected! j11 via reactor 14 and switch 16 for f+10.12
'A circuit is connected to the power source 18 and supplies a predetermined test current x1 to the circuit breaker 10 under test. Moreover, the circuit breaker 10
Reactor 20 and opening/closing for ゜12! 622 to the stripe 2 power supply 24 to form a circuit that supplies a predetermined test voltage IJLI2t- to the circuit breaker under test 10.
この場合、菖１電源１８は、嬶３図（１）に示すような
、例えば商用周波数で変化する交流電流１、を供給する
ようにし、また縞２電源２４は縞３図（２）に示すよう
な、前記交流電流Ｉ、よりも低い周波数の交流電流１２
′ｔ−供給するよう設定する。In this case, the iris 1 power supply 18 is configured to supply an alternating current 1 that varies at the commercial frequency, for example, as shown in Figure 3 (1), and the stripe 2 power supply 24 is as shown in Figure 3 (2). An alternating current 12 having a lower frequency than the alternating current I, such as
't-set to supply.
このように構成することにより、１１！閉器１６゜２２
を同時に閉路することＫよｐ、供試遮断器１０および補
助遮断器１２には、第３図Ｇ）に示すように、交流１１
Ｅ＊Ｉ、と交流電流工、との合成電ｆｉ（１，＋Ｉ２）
が供給される。With this configuration, 11! Closer 16°22
The test circuit breaker 10 and the auxiliary circuit breaker 12 are connected to the AC 11 as shown in FIG.
The composite electric current fi(1,+I2) of E*I and AC current engineering
is supplied.
しかるに、第３図に示す電流物性において、例えば回路
遮断器の主接点が閉路状Ｓから開放状虐となることＫよ
り〔＃Ｉ３図（４）参照〕、接点間にアークが発生する
が、このアークの影響により電流零点が生じ得る時点（
Ｐ点）近傍での 。However, in the electric current properties shown in Fig. 3, for example, the main contacts of a circuit breaker change from the closed state S to the open state K [see #I3 (4)], and an arc occurs between the contacts. The point at which a current zero point can occur due to the influence of this arc (
in the vicinity of point P).
アークの動作状ｌ１ＡＹｒ検証すること罠なる。そこで
、菖３図（５１に示す合成電流（Ｉ、 十Ｉ２）の電流
波形は、アーク抵抗の影響の九めに、零点との交点Ｐ、
、ｉ’２ が発生することが予想される。It is a trap to verify the operating state of the arc l1AYr. Therefore, the current waveform of the composite current (I, 12) shown in Diagram 3 (51) is determined by the intersection point P with the zero point due to the influence of arc resistance.
, i'2 is expected to occur.
従って、第２図に示す供試遮断器１０の遮断性１１ｉ！
は、前記合成電流の零点Ｐ、 、 Ｐ、 においてこの
電１）ｔｔｊａ断し得るかどうかの検証試験となる。Therefore, the breaking performance 11i of the test circuit breaker 10 shown in FIG. 2!
is a verification test to see if this current can be cut off at the zero points P, , P, of the composite current.
このため、縛２図に示すように、供試遮断器１０に対し
、リアクトル２６およびギャップ２Ｂを介して光電コン
アン＋５０１ｒ並判接続し、さらにこの充電コンデンサ
３ｏに対し充電用Ｉｌ流器を接続してなるワイルードプ
ヶ合成試験法を実施する回路が構成される。なお、この
回路には、適ｊｔＡは回復電圧ｇＭｌｌＩｌ用のコンデ
ンｔ３４および抵抗３６が接続される。For this reason, as shown in Figure 2, a photoelectric converter +501r is connected to the test circuit breaker 10 via the reactor 26 and the gap 2B, and a charging Il current is connected to the charging capacitor 3o. A circuit is constructed to implement the wild-type synthetic test method. Note that a capacitor t34 and a resistor 36 for the recovery voltage gMllIl are connected to this circuit.
このような回路構成によるワイルードプケ合成試−法に
おいては、第３図Ｂ）に示すように、合成ｍ１Ｊｔ Ｉ
、＋ Ｉ□が零点となる２１点で供試１断器１０と補助
遮断器１２により合成電流は遮断されることになる。こ
のため、零点Ｐ、の直前にギャップ２８を始動させてコ
ンデンｔ３０に充電した電荷をリアクトル２６ｔ−通じ
て放電してこれを過渡回復電圧として供試器に重畳させ
、供試遮断器１０の遮断性能を検証することができる。In the wild-puke synthesis test method using such a circuit configuration, as shown in FIG. 3B), the synthesis m1Jt I
, +I□ becomes zero at the 21st point, the combined current is cut off by the sample 1 breaker 10 and the auxiliary breaker 12. For this reason, the gap 28 is started immediately before the zero point P, and the charge charged in the capacitor t30 is discharged through the reactor 26t-, and this is superimposed on the test device as a transient recovery voltage, and the test circuit breaker 10 is interrupted. Performance can be verified.
前述したところから明らかなように１本発明によれば、
２つの電流＃ｉｔ−使用して、第１１に示すようなアー
クの発生によって電流零点を形成するようなＩＩｔＩＬ
分含有率の高い短絡電流の透析試験會容易Ｋｖｉ＆施す
ることができる。なお、第２図に示す試験回路において
、＠１電源と第２電源とはそれぞれ発電機で構成した場
合を示したが、例えば第２電＃【充電コンデンｔ５Ｂと
し、このコンデンｔ３８に充電した電荷をリアクトル２
０ｔ−通じて放電することによっても、略同様の効米を
期待することができる。As is clear from the above, according to the present invention,
Two currents #it- are used to form a current zero point by the generation of an arc as shown in No. 11.
Dialysis test of short circuit current with high content of Kvi & can be easily performed. In the test circuit shown in Fig. 2, the @1 power supply and the second power supply are each constructed from a generator. The reactor 2
Substantially the same rice efficiency can be expected by discharging at 0t-.
菫た、以上の説明においては１合成電流Ｉ。In the above explanation, 1 composite current I.
＋ Ｉ２が供試遮断器１０および補助遮断器１２で遮断
された際の回路に発生する異常電圧については触れてい
ないが、適宜保−装置として、伺えば放電ギヤツタや非
直線抵抗による吸収手段等ｔ−設けることは勿論である
。Although there is no mention of the abnormal voltage generated in the circuit when +I2 is interrupted by the test circuit breaker 10 and the auxiliary circuit breaker 12, appropriate protection devices such as discharge gear ivy or absorption means using nonlinear resistance, etc., are not mentioned. Of course, t- is provided.
以上、本発明の好適な実施例について説明したが、本発
明の精神を逸脱しない範囲内において株々の設計変更を
なし得ることは勿論であゐ。Although the preferred embodiments of the present invention have been described above, it is of course possible to make various design changes without departing from the spirit of the present invention.
蘂１図は直流分を含む短絡電流の波形図、第２図は本発
明に係る交流遮断器の１断試験方法を実施する試験回路
図、纂３図（１）〜（４）ｉｊ本発明方法により得られ
る短絡電流と電流纏断状１１１を示す波形図である。
１０・・・供試遮断器 １２・・・補助遮断器１４・・
・リアクトル １６・・・開 閉 器１８・・・ｆｇ１
１１Ｅ源 ２０・・・リアクトル２２・・・關 閉 器
２４・・・ｌＥ２電源２６・・・リアクトル ２８・
・・ギャップ３０・・・充電コンデンサ ３２・・・
充電用整流器３４・・・過渡回復電圧調整用コンデンサ
３６・・・過ｆＲ回復電圧調整用抵抗
３８・・・充電コンデンサ
ＦＩＧ、１
苧攻梵生Figure 1 is a waveform diagram of a short-circuit current including a DC component, Figure 2 is a test circuit diagram for carrying out a one-break test method for an AC breaker according to the present invention, and Figures 3 (1) to (4) ij The present invention FIG. 3 is a waveform diagram showing a short circuit current and a current interruption pattern 111 obtained by the method. 10... Test circuit breaker 12... Auxiliary circuit breaker 14...
・Reactor 16...Open/close device 18...fg1
11E source 20...Reactor 22...Connector 24...1E2 power source 26...Reactor 28.
...Gap 30...Charging capacitor 32...
Charging rectifier 34...Transient recovery voltage adjustment capacitor 36...Excess fR recovery voltage adjustment resistor 38...Charging capacitor FIG, 1
Claims (1)
断動作に際して発生すゐアークの抵抗により電流零点ｔ
−影形成るような直流分含有率の高い場合における遮断
試験方法であって、供試遮断器に短絡型ａを供給する電
Ｒ源と供試１断器の遮断極間に過渡−復電圧を供給する
電圧源とを備えた合成等価試験回路を用いるとともに前
記電流源は嬉１および纂２の電流源力）らなｐ１纂１の
電流源から所要の周波数の電ｆＩｔｔ供給し、縞２の電
流源から前記周波数より低いｌ１ＩＩＬ数の電流を供給
し、これらの合成電流を短絡電流として供給することを
曹黴とする交流遮断器の遮断試験方法。 ■ 骨許縛求の１［−第１項記載の遮断試験方法におい
て、縞１電源と縞２電源とは発電機からなる交流遮断器
の遮断試験方法。 囚 豐ｆｆｔＩＩ求の範囲菖１項記載の遮断試験方法に
おいて、第１電源は発電機とし、１Ｉｉ２電源は充電コ
ンデン？力）らなゐ交流遮断器の遮断試験方法。(1) The AC short-circuit current that should be cut once by the AC 1-breaker is reduced to the current zero point t due to the resistance of the arc that is generated during the breaking operation.
- A breaking test method in cases where the DC content is high such that shadows are formed, and the transient-return voltage is applied between the power R source that supplies short-circuit type a to the test circuit breaker and the breaking pole of the test circuit breaker 1. A synthetic equivalent test circuit is used, which has a voltage source that supplies the stripe 1 and the stripe 2, and the current source is a current source of the stripe 1 and the stripe 2). A method for testing an AC circuit breaker in which a current having a number of l1IIL lower than the frequency is supplied from a current source, and a combined current of these is supplied as a short circuit current. (1) In the breaking test method described in item 1, the stripe 1 power source and the stripe 2 power source are generators. In the interruption test method described in Section 1, the first power source is a generator, and the second power source is a charging capacitor. Power) Breaking test method for Ranai AC circuit breaker.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56200922A JPS58102176A (en) | 1981-12-15 | 1981-12-15 | Method of breaking test for ac breaker |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56200922A JPS58102176A (en) | 1981-12-15 | 1981-12-15 | Method of breaking test for ac breaker |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58102176A true JPS58102176A (en) | 1983-06-17 |
Family
ID=16432501
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56200922A Pending JPS58102176A (en) | 1981-12-15 | 1981-12-15 | Method of breaking test for ac breaker |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58102176A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5153518A (en) * | 1989-09-20 | 1992-10-06 | Hitachi, Ltd. | Synthetic equivalent test circuit of circuit breaker |
| CN102435942A (en) * | 2011-09-06 | 2012-05-02 | 武汉义天科技有限公司 | Electromagnetic induction system of high-tension switch fracture and test method thereof |
-
1981
- 1981-12-15 JP JP56200922A patent/JPS58102176A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5153518A (en) * | 1989-09-20 | 1992-10-06 | Hitachi, Ltd. | Synthetic equivalent test circuit of circuit breaker |
| CN102435942A (en) * | 2011-09-06 | 2012-05-02 | 武汉义天科技有限公司 | Electromagnetic induction system of high-tension switch fracture and test method thereof |
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