JPS5795628A - Electron beam exposure device - Google Patents
Electron beam exposure deviceInfo
- Publication number
- JPS5795628A JPS5795628A JP17088680A JP17088680A JPS5795628A JP S5795628 A JPS5795628 A JP S5795628A JP 17088680 A JP17088680 A JP 17088680A JP 17088680 A JP17088680 A JP 17088680A JP S5795628 A JPS5795628 A JP S5795628A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- level
- mark
- scanned
- amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
- H01J37/3045—Object or beam position registration
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Beam Exposure (AREA)
Abstract
PURPOSE:To automate level compensation and to perform always stable mark detection, by scanning a substrate to extract an offset level by the electron beam before the mark detection, and feeding back said level to an amplifier of the mark detecting signal. CONSTITUTION:The mark position provided on the substrate is scanned by the electron beam. A signal from a reflected electron detector 6 is amplified to obtain positioning data. A switch 5 is provided between the amplifier 1 of the detecting device and an output terminal 8. The substrate is scanned to detect the different states of the surface at various machining stages before the mark is scanned. Said amplified signal is fed back to the amplifier 1 through the swtich 5, AD converter 4, a registor 3, and a DA converter 2, so that the signal output (the detected signal at the offset level) besed on the surface state becomes a zero level. In this constitution, the offset level compensation at every machining stage can be automatically performed, and the mark detection can be performed at the constant signal level. Therefore the positioning accuracy and the reliability can be improved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17088680A JPS5795628A (en) | 1980-12-05 | 1980-12-05 | Electron beam exposure device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17088680A JPS5795628A (en) | 1980-12-05 | 1980-12-05 | Electron beam exposure device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5795628A true JPS5795628A (en) | 1982-06-14 |
Family
ID=15913133
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17088680A Pending JPS5795628A (en) | 1980-12-05 | 1980-12-05 | Electron beam exposure device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5795628A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59125623A (en) * | 1982-12-27 | 1984-07-20 | Fujitsu Ltd | Electron beam exposure device |
US4705954A (en) * | 1984-09-04 | 1987-11-10 | Siemens Aktiengesellschaft | Method and apparatus for automatically positioning a particle beam |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5585028A (en) * | 1978-12-22 | 1980-06-26 | Hitachi Ltd | Mark detecting signal amplifier |
-
1980
- 1980-12-05 JP JP17088680A patent/JPS5795628A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5585028A (en) * | 1978-12-22 | 1980-06-26 | Hitachi Ltd | Mark detecting signal amplifier |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59125623A (en) * | 1982-12-27 | 1984-07-20 | Fujitsu Ltd | Electron beam exposure device |
US4705954A (en) * | 1984-09-04 | 1987-11-10 | Siemens Aktiengesellschaft | Method and apparatus for automatically positioning a particle beam |
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