JPS5793858U - - Google Patents
Info
- Publication number
- JPS5793858U JPS5793858U JP17177980U JP17177980U JPS5793858U JP S5793858 U JPS5793858 U JP S5793858U JP 17177980 U JP17177980 U JP 17177980U JP 17177980 U JP17177980 U JP 17177980U JP S5793858 U JPS5793858 U JP S5793858U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Or Calibration Of Command Recording Devices (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17177980U JPS6329251Y2 (en:Method) | 1980-11-28 | 1980-11-28 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17177980U JPS6329251Y2 (en:Method) | 1980-11-28 | 1980-11-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5793858U true JPS5793858U (en:Method) | 1982-06-09 |
| JPS6329251Y2 JPS6329251Y2 (en:Method) | 1988-08-05 |
Family
ID=29530121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17177980U Expired JPS6329251Y2 (en:Method) | 1980-11-28 | 1980-11-28 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6329251Y2 (en:Method) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57186846U (en:Method) * | 1981-05-22 | 1982-11-27 | ||
| JPS5973715A (ja) * | 1982-10-20 | 1984-04-26 | Fujitsu Ten Ltd | センサ処理装置 |
| JPH02291919A (ja) * | 1989-03-08 | 1990-12-03 | Westinghouse Electric Corp <We> | 自動トランスデューサ励起源検査装置 |
| JP2006017695A (ja) * | 2004-05-31 | 2006-01-19 | Yokogawa Electric Corp | 校正方法およびこれを利用したジルコニア式酸素濃度計 |
| JP2021001768A (ja) * | 2019-06-20 | 2021-01-07 | 株式会社アプリクス | 化学分析装置の校正方法 |
-
1980
- 1980-11-28 JP JP17177980U patent/JPS6329251Y2/ja not_active Expired
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57186846U (en:Method) * | 1981-05-22 | 1982-11-27 | ||
| JPS5973715A (ja) * | 1982-10-20 | 1984-04-26 | Fujitsu Ten Ltd | センサ処理装置 |
| JPH02291919A (ja) * | 1989-03-08 | 1990-12-03 | Westinghouse Electric Corp <We> | 自動トランスデューサ励起源検査装置 |
| JP2006017695A (ja) * | 2004-05-31 | 2006-01-19 | Yokogawa Electric Corp | 校正方法およびこれを利用したジルコニア式酸素濃度計 |
| JP2021001768A (ja) * | 2019-06-20 | 2021-01-07 | 株式会社アプリクス | 化学分析装置の校正方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6329251Y2 (en:Method) | 1988-08-05 |