JPS579159U - - Google Patents
Info
- Publication number
- JPS579159U JPS579159U JP2893581U JP2893581U JPS579159U JP S579159 U JPS579159 U JP S579159U JP 2893581 U JP2893581 U JP 2893581U JP 2893581 U JP2893581 U JP 2893581U JP S579159 U JPS579159 U JP S579159U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/261—Details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/305—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching
- H01J37/3053—Electron-beam or ion-beam tubes for localised treatment of objects for casting, melting, evaporating, or etching for evaporating or etching
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8005037A FR2477769A1 (fr) | 1980-03-06 | 1980-03-06 | Dispositif pour microscope electronique permettant un traitement in situ d'echantillons |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS579159U true JPS579159U (enExample) | 1982-01-18 |
Family
ID=9239385
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2893581U Pending JPS579159U (enExample) | 1980-03-06 | 1981-03-02 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS579159U (enExample) |
| FR (1) | FR2477769A1 (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2639473A1 (fr) * | 1988-11-18 | 1990-05-25 | Chaixmeca Sarl | Dispositif pour le transfert sous atmosphere controlee d'echantillons destines a l'examen en microscopie electronique en transmission |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3858049A (en) * | 1973-09-17 | 1974-12-31 | Etec Corp | Method and apparatus for sem specimen coating and transfer |
| DE2511449A1 (de) * | 1975-03-15 | 1976-09-16 | Leybold Heraeus Gmbh & Co Kg | Probenschleuse |
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1980
- 1980-03-06 FR FR8005037A patent/FR2477769A1/fr active Granted
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1981
- 1981-03-02 JP JP2893581U patent/JPS579159U/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| FR2477769B1 (enExample) | 1982-09-24 |
| FR2477769A1 (fr) | 1981-09-11 |