JPS5790121A - Method and apparatus for measuring distribution of light - Google Patents

Method and apparatus for measuring distribution of light

Info

Publication number
JPS5790121A
JPS5790121A JP16694680A JP16694680A JPS5790121A JP S5790121 A JPS5790121 A JP S5790121A JP 16694680 A JP16694680 A JP 16694680A JP 16694680 A JP16694680 A JP 16694680A JP S5790121 A JPS5790121 A JP S5790121A
Authority
JP
Japan
Prior art keywords
light
receiving
receiving part
measurement
rotating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16694680A
Other languages
Japanese (ja)
Inventor
Shuji Kosako
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP16694680A priority Critical patent/JPS5790121A/en
Publication of JPS5790121A publication Critical patent/JPS5790121A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter

Abstract

PURPOSE:To permit the measurement of distribution of light in a short period of time, by rotating an element group arranged in a straight line through a rotating arm and arranging the element group so that it has sensitivity in a plurality of directions having specific angles in a surface of revolution. CONSTITUTION:A light-receiving part 1 is secured to one end of a rotating arm and vertically rotated around an illuminator 3 to be measured. Light-receiving elements 17-25 are secured at the focul points of lenses 7-16 of the light-receiving part 1 and both sides thereof. The distribution of light is measured by sampling the output of each light-receiving element for every interval equal to an angle DELTAtheta made by an effective width 26 of each lens while vertically rotating the light-receiving part 1. When the light-receiving part 1 is located at the position of vertical angle 29, the outputs of the light-receiving element 17 and the light-receiving elements located at the same related positions with respect to the lenses 8-16 respectively as the light-receiving element 17 are totaled. Then, similar operations are repeated to conduct measurement. Thereby, measurement can be performed in a short period of time.
JP16694680A 1980-11-26 1980-11-26 Method and apparatus for measuring distribution of light Pending JPS5790121A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16694680A JPS5790121A (en) 1980-11-26 1980-11-26 Method and apparatus for measuring distribution of light

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16694680A JPS5790121A (en) 1980-11-26 1980-11-26 Method and apparatus for measuring distribution of light

Publications (1)

Publication Number Publication Date
JPS5790121A true JPS5790121A (en) 1982-06-04

Family

ID=15840556

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16694680A Pending JPS5790121A (en) 1980-11-26 1980-11-26 Method and apparatus for measuring distribution of light

Country Status (1)

Country Link
JP (1) JPS5790121A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5468688A (en) * 1993-11-01 1995-11-21 Georgia Tech Research Corporation Process for the low temperature creation of nitride films on semiconductors
KR100416294B1 (en) * 2002-03-05 2004-01-31 대양전기공업 주식회사 A goniophotometer
JP2013217651A (en) * 2012-04-04 2013-10-24 Otsuka Denshi Co Ltd Light distribution characteristics measurement device and light distribution characteristics measurement method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5468688A (en) * 1993-11-01 1995-11-21 Georgia Tech Research Corporation Process for the low temperature creation of nitride films on semiconductors
KR100416294B1 (en) * 2002-03-05 2004-01-31 대양전기공업 주식회사 A goniophotometer
JP2013217651A (en) * 2012-04-04 2013-10-24 Otsuka Denshi Co Ltd Light distribution characteristics measurement device and light distribution characteristics measurement method

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