JPS5788367A - Measuring circuit for semiconductor device - Google Patents

Measuring circuit for semiconductor device

Info

Publication number
JPS5788367A
JPS5788367A JP16437680A JP16437680A JPS5788367A JP S5788367 A JPS5788367 A JP S5788367A JP 16437680 A JP16437680 A JP 16437680A JP 16437680 A JP16437680 A JP 16437680A JP S5788367 A JPS5788367 A JP S5788367A
Authority
JP
Japan
Prior art keywords
potential
plane
source
vgg
channel potential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16437680A
Other languages
English (en)
Other versions
JPS63742B2 (ja
Inventor
Yoshihiro Miyamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP16437680A priority Critical patent/JPS5788367A/ja
Publication of JPS5788367A publication Critical patent/JPS5788367A/ja
Publication of JPS63742B2 publication Critical patent/JPS63742B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2641—Circuits therefor for testing charge coupled devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP16437680A 1980-11-20 1980-11-20 Measuring circuit for semiconductor device Granted JPS5788367A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16437680A JPS5788367A (en) 1980-11-20 1980-11-20 Measuring circuit for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16437680A JPS5788367A (en) 1980-11-20 1980-11-20 Measuring circuit for semiconductor device

Publications (2)

Publication Number Publication Date
JPS5788367A true JPS5788367A (en) 1982-06-02
JPS63742B2 JPS63742B2 (ja) 1988-01-08

Family

ID=15791949

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16437680A Granted JPS5788367A (en) 1980-11-20 1980-11-20 Measuring circuit for semiconductor device

Country Status (1)

Country Link
JP (1) JPS5788367A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5965262A (ja) * 1982-10-05 1984-04-13 Toshiba Corp チャネル電位測定装置
US4942357A (en) * 1989-08-07 1990-07-17 Eastman Kodak Company Method of testing a charge-coupled device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03228539A (ja) * 1990-01-30 1991-10-09 Sanyo Electric Co Ltd 往復送り機構の安全装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5965262A (ja) * 1982-10-05 1984-04-13 Toshiba Corp チャネル電位測定装置
US4942357A (en) * 1989-08-07 1990-07-17 Eastman Kodak Company Method of testing a charge-coupled device

Also Published As

Publication number Publication date
JPS63742B2 (ja) 1988-01-08

Similar Documents

Publication Publication Date Title
ES485464A1 (es) Perfeccionamientos en dispositivos de comprobacion para in- dicar una tension electrica y- su polaridad.
JPS54157085A (en) Method of and device for measuring potential with no contact at electronic part
JPS5551361A (en) Range switching device for electric measuring instrument
EP0307973A3 (en) An isfet chip suitable to be used in an apparatus comprising a measuring circuit for selectively measuring ions in a liquid
JPS5788367A (en) Measuring circuit for semiconductor device
SE7802193L (sv) Koppling for kompensation av overtonsstrommar i en elektrisk forbrukaranordning
DE3169947D1 (en) Method of measuring the moisture content of a material
ES8201737A1 (es) Procedimiento y su correspondiente aparato para la medida del estado de carga de un acumulador
JPS56105665A (en) Semiconductor memory device
ES376910A1 (es) Aparato sensible a la carga de un elemento dielectrico.
JPS54119989A (en) Electrolyte analyzer
JPS55149848A (en) Measuring instrument of induction system for surface electric potential
JPS54115296A (en) Measuring method of moisture content in sand
SU945774A1 (ru) Устройство дл измерени анизотропии в электропровод щих объектах
JPS5610265A (en) Method for measuring voltage-current characteristic of semiconductor element
JPS57135347A (en) Discrimination method for electrically conductive fiber
JPS55146052A (en) Noise reduction circuit in noncontact type potentiometer
JPS54121068A (en) Measuring method for semiconductor device
JPS56155542A (en) Field-effect semiconductor device and measuring method thereof
GB2001472A (en) Integrated circuit devices including a structure for crossing information signals
JPS547382A (en) Surface potential measuring apparatus
JPS5748263A (en) Hall ic
JPS52131475A (en) Measurement equipment for semiconductor
GB1330497A (en) Integrator circuit
JPS5418782A (en) Surface electrometer