JPS5777904A - Thickness measuring of metal pipe - Google Patents

Thickness measuring of metal pipe

Info

Publication number
JPS5777904A
JPS5777904A JP55153893A JP15389380A JPS5777904A JP S5777904 A JPS5777904 A JP S5777904A JP 55153893 A JP55153893 A JP 55153893A JP 15389380 A JP15389380 A JP 15389380A JP S5777904 A JPS5777904 A JP S5777904A
Authority
JP
Japan
Prior art keywords
thickness
rays
metal pipe
pipe
transmission level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55153893A
Other languages
English (en)
Inventor
Toshio Endo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55153893A priority Critical patent/JPS5777904A/ja
Publication of JPS5777904A publication Critical patent/JPS5777904A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP55153893A 1980-11-04 1980-11-04 Thickness measuring of metal pipe Pending JPS5777904A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55153893A JPS5777904A (en) 1980-11-04 1980-11-04 Thickness measuring of metal pipe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55153893A JPS5777904A (en) 1980-11-04 1980-11-04 Thickness measuring of metal pipe

Publications (1)

Publication Number Publication Date
JPS5777904A true JPS5777904A (en) 1982-05-15

Family

ID=15572409

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55153893A Pending JPS5777904A (en) 1980-11-04 1980-11-04 Thickness measuring of metal pipe

Country Status (1)

Country Link
JP (1) JPS5777904A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0686828A1 (en) * 1994-06-08 1995-12-13 Beta Instrument Company Limited Scanning apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0686828A1 (en) * 1994-06-08 1995-12-13 Beta Instrument Company Limited Scanning apparatus

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