JPS5763868A - Sorting method for light emitting device - Google Patents

Sorting method for light emitting device

Info

Publication number
JPS5763868A
JPS5763868A JP13882580A JP13882580A JPS5763868A JP S5763868 A JPS5763868 A JP S5763868A JP 13882580 A JP13882580 A JP 13882580A JP 13882580 A JP13882580 A JP 13882580A JP S5763868 A JPS5763868 A JP S5763868A
Authority
JP
Japan
Prior art keywords
pulse current
optical
light emitting
jig
article
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13882580A
Other languages
Japanese (ja)
Other versions
JPS6134273B2 (en
Inventor
Satoru Todoroki
Hisatoshi Uchida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP13882580A priority Critical patent/JPS5763868A/en
Publication of JPS5763868A publication Critical patent/JPS5763868A/en
Publication of JPS6134273B2 publication Critical patent/JPS6134273B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Led Devices (AREA)

Abstract

PURPOSE:To sort out defective articles from light emitting diodes, by applying a high speed pulse current to a photo semiconductor part and measuring the delay time of the optical pulse current flowing a photodetector installed facing to the semiconductor part via a jig with the optical axis aligned. CONSTITUTION:An article 2 to be measured connected to a ghigh speed pulse generator 1 is installed facing to an photodetector 5 with one end connected to high voltage power source 3 and the other end connected to a register 4 for detecting an optical pulse current via a jig 6 for aligning optical axes provided so that optical axes coincide with each other. Various kinds of pulse current are applied to the article 2 to be measured, and a pulse current waveform (input) and an optical pulse current waveform (output) are observed simulteneously with a sampling oscilloscope 9, thereby to measure delay time in the output side against the input side. Hereby, defective light emitting diodes can be sorted out.
JP13882580A 1980-10-06 1980-10-06 Sorting method for light emitting device Granted JPS5763868A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13882580A JPS5763868A (en) 1980-10-06 1980-10-06 Sorting method for light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13882580A JPS5763868A (en) 1980-10-06 1980-10-06 Sorting method for light emitting device

Publications (2)

Publication Number Publication Date
JPS5763868A true JPS5763868A (en) 1982-04-17
JPS6134273B2 JPS6134273B2 (en) 1986-08-06

Family

ID=15231096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13882580A Granted JPS5763868A (en) 1980-10-06 1980-10-06 Sorting method for light emitting device

Country Status (1)

Country Link
JP (1) JPS5763868A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010034240A (en) * 2008-07-28 2010-02-12 Panasonic Electric Works Co Ltd Lighting fixture

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63174873U (en) * 1987-02-23 1988-11-14

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010034240A (en) * 2008-07-28 2010-02-12 Panasonic Electric Works Co Ltd Lighting fixture

Also Published As

Publication number Publication date
JPS6134273B2 (en) 1986-08-06

Similar Documents

Publication Publication Date Title
ATE32985T1 (en) MULTIPLE TUBE ARRANGEMENT.
DE3681877D1 (en) DEVICE FOR TESTING AND SORTING ELECTRONIC COMPONENTS.
GB1332696A (en) Method and apparatus for detecting short circuits in the machining gap in a electro-discharge machining process
ATE42158T1 (en) COIN RECOGNITION DEVICE.
JPS5226888A (en) Automatic tension testing machine
EP0357440A3 (en) Electro-optic sampling system clock and stimulus pattern generator
ATE51166T1 (en) DEVICE FOR TESTING AND SORTING ELECTRONIC COMPONENTS.
JPS5763868A (en) Sorting method for light emitting device
DE69430304D1 (en) ARRANGEMENT FOR TESTING CONNECTIONS WITH PULLING RESISTORS
Lux et al. Higher order campbell techniques for neutron flux measurement: I. Theory
IE822804L (en) Test system
JPS544009A (en) Detection system of diode conduction failure in diode matrix selection circuit
SU1093887A2 (en) Device for checking cylinder-shaped article diameter
JPS5580040A (en) Light source apparatus for luminous spectrochemical analyzer
JPS56151336A (en) Fault locating device for optical fibers cable
Francini et al. Low‐cost clipped correlator system for use in measuring the velocity of textile fibers
GB2236193A (en) Voltage indication apparatus
ATE35579T1 (en) DEVICE FOR TESTING AND SORTING ELECTRONIC COMPONENTS, ESPECIALLY INTEGRATED CHIPS.
KR900010514Y1 (en) Pulse generating circuitry
JPS55122269A (en) Player unit
JPS57108621A (en) Photoelectric length measure
SU1310637A1 (en) Device for measuring diameters of articles
JPS5791461A (en) Insulation diagnosis device
JPS5791534A (en) Lifetime tester for light receiving semiconductor device
JPS5772372A (en) Monitoring method for light signal of optical thyristor transducer