JPS5759668B2 - - Google Patents

Info

Publication number
JPS5759668B2
JPS5759668B2 JP8856979A JP8856979A JPS5759668B2 JP S5759668 B2 JPS5759668 B2 JP S5759668B2 JP 8856979 A JP8856979 A JP 8856979A JP 8856979 A JP8856979 A JP 8856979A JP S5759668 B2 JPS5759668 B2 JP S5759668B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8856979A
Other languages
Japanese (ja)
Other versions
JPS5612744A (en
Inventor
Yoshe Hasegawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP8856979A priority Critical patent/JPS5612744A/en
Publication of JPS5612744A publication Critical patent/JPS5612744A/en
Publication of JPS5759668B2 publication Critical patent/JPS5759668B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
JP8856979A 1979-07-12 1979-07-12 Wafer prober Granted JPS5612744A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8856979A JPS5612744A (en) 1979-07-12 1979-07-12 Wafer prober

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8856979A JPS5612744A (en) 1979-07-12 1979-07-12 Wafer prober

Publications (2)

Publication Number Publication Date
JPS5612744A JPS5612744A (en) 1981-02-07
JPS5759668B2 true JPS5759668B2 (en) 1982-12-15

Family

ID=13946488

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8856979A Granted JPS5612744A (en) 1979-07-12 1979-07-12 Wafer prober

Country Status (1)

Country Link
JP (1) JPS5612744A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6183969U (en) * 1984-11-06 1986-06-03

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4751458A (en) * 1984-04-02 1988-06-14 American Telephone And Telegraph Company, At&T Bell Laboratories Test pads for integrated circuit chips
JP2632894B2 (en) * 1987-03-24 1997-07-23 東京エレクトロン株式会社 Probe device
JP3144672B2 (en) * 1997-01-22 2001-03-12 東京エレクトロン株式会社 Probe apparatus and probe needle polishing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6183969U (en) * 1984-11-06 1986-06-03

Also Published As

Publication number Publication date
JPS5612744A (en) 1981-02-07

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