JPS5759450U - - Google Patents
Info
- Publication number
- JPS5759450U JPS5759450U JP13552880U JP13552880U JPS5759450U JP S5759450 U JPS5759450 U JP S5759450U JP 13552880 U JP13552880 U JP 13552880U JP 13552880 U JP13552880 U JP 13552880U JP S5759450 U JPS5759450 U JP S5759450U
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13552880U JPS5759450U (ja) | 1980-09-24 | 1980-09-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP13552880U JPS5759450U (ja) | 1980-09-24 | 1980-09-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5759450U true JPS5759450U (ja) | 1982-04-08 |
Family
ID=29495690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP13552880U Pending JPS5759450U (ja) | 1980-09-24 | 1980-09-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5759450U (ja) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0653298A (ja) * | 1990-01-24 | 1994-02-25 | Internatl Business Mach Corp <Ibm> | 半導体ウェーハ試験用乾燥界面熱形チャック温度制御システム |
| WO2002041390A1 (fr) * | 2000-11-20 | 2002-05-23 | Advantest Corporation | Dispositif et procede pour tester un dispositif electronique |
| JP2016003965A (ja) * | 2014-06-17 | 2016-01-12 | 新日本無線株式会社 | 湿度センサ検査装置 |
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1980
- 1980-09-24 JP JP13552880U patent/JPS5759450U/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0653298A (ja) * | 1990-01-24 | 1994-02-25 | Internatl Business Mach Corp <Ibm> | 半導体ウェーハ試験用乾燥界面熱形チャック温度制御システム |
| WO2002041390A1 (fr) * | 2000-11-20 | 2002-05-23 | Advantest Corporation | Dispositif et procede pour tester un dispositif electronique |
| JP2016003965A (ja) * | 2014-06-17 | 2016-01-12 | 新日本無線株式会社 | 湿度センサ検査装置 |