JPS5759372A - Circuit structure altering device for integrated semiconductor circuit - Google Patents
Circuit structure altering device for integrated semiconductor circuitInfo
- Publication number
- JPS5759372A JPS5759372A JP56127321A JP12732181A JPS5759372A JP S5759372 A JPS5759372 A JP S5759372A JP 56127321 A JP56127321 A JP 56127321A JP 12732181 A JP12732181 A JP 12732181A JP S5759372 A JPS5759372 A JP S5759372A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- integrated semiconductor
- altering device
- structure altering
- circuit structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/525—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections
- H01L23/5256—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections comprising fuses, i.e. connections having their state changed from conductive to non-conductive
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/23—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by opening or closing resistor geometric tracks of predetermined resistive values, e.g. snapistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
- H03F3/45484—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit
- H03F3/45596—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit by offset reduction
- H03F3/45618—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit by offset reduction by using balancing means
- H03F3/45623—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection in differential amplifiers with bipolar transistors as the active amplifying circuit by offset reduction by using balancing means using switching means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45696—Indexing scheme relating to differential amplifiers the LC comprising more than two resistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45702—Indexing scheme relating to differential amplifiers the LC comprising two resistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45726—Indexing scheme relating to differential amplifiers the LC comprising more than one switch, which are not cross coupled
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Semiconductor Integrated Circuits (AREA)
- Hall/Mr Elements (AREA)
- Amplifiers (AREA)
- Logic Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19803030620 DE3030620A1 (de) | 1980-08-13 | 1980-08-13 | Anordnung zur aenderung der elektrischen schaltungskonfiguration von integrierten halbleiterschaltkreisen |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5759372A true JPS5759372A (en) | 1982-04-09 |
Family
ID=6109541
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56127321A Pending JPS5759372A (en) | 1980-08-13 | 1981-08-13 | Circuit structure altering device for integrated semiconductor circuit |
Country Status (4)
Country | Link |
---|---|
US (1) | US4438347A (ja) |
EP (1) | EP0045895A1 (ja) |
JP (1) | JPS5759372A (ja) |
DE (1) | DE3030620A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60254763A (ja) * | 1984-05-31 | 1985-12-16 | Sanken Electric Co Ltd | 集積回路の製造方法 |
JP2020148699A (ja) * | 2019-03-15 | 2020-09-17 | エイブリック株式会社 | 半導体装置 |
Families Citing this family (64)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4792920A (en) * | 1983-06-29 | 1988-12-20 | Canon Denshi Kabushiki Kaisha | Interface providing impedance matching by selective connection of a resistor array to a power supply |
JPH01245165A (ja) * | 1988-03-28 | 1989-09-29 | Seiko Instr & Electron Ltd | 電圧検出回路 |
JPH0233644A (ja) * | 1988-07-15 | 1990-02-02 | Ncr Corp | フレキシブル基板を用いた固有コードの設定方法及び装置 |
JPH02189607A (ja) * | 1989-01-18 | 1990-07-25 | Seiko Instr Inc | ボルテージ・レギュレーター |
US5079442A (en) * | 1990-03-28 | 1992-01-07 | Advanced Micro Devices, Inc. | Apparatus adaptable for use as a replacement output driver in a signal generating circuit |
US6100747A (en) * | 1994-05-30 | 2000-08-08 | Stmicroelectronics, S.R.L. | Device for selecting design options in an integrated circuit |
DE69411368T2 (de) * | 1994-05-30 | 1998-10-22 | St Microelectronics Srl | Schaltung zur Auswahl von Entwurfsmöglichkeiten in einer integrierten Schaltung |
EP0856893B1 (en) | 1996-12-31 | 2002-05-02 | STMicroelectronics, Inc. | Structure and device for selecting design options in an integrated circuit |
DE10036283A1 (de) * | 2000-07-26 | 2002-02-07 | Bosch Gmbh Robert | Laserdiodenanordnung |
TW573335B (en) * | 2001-08-28 | 2004-01-21 | Anachip Corp | Adjustment system, method and apparatus of using magnetic field to conduct micro-adjustment onto packaged chip |
US9823090B2 (en) | 2014-10-31 | 2017-11-21 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a movement of a target object |
US7923996B2 (en) * | 2008-02-26 | 2011-04-12 | Allegro Microsystems, Inc. | Magnetic field sensor with automatic sensitivity adjustment |
US8447556B2 (en) * | 2009-02-17 | 2013-05-21 | Allegro Microsystems, Inc. | Circuits and methods for generating a self-test of a magnetic field sensor |
EP2634592B1 (en) | 2009-07-22 | 2015-01-14 | Allegro Microsystems, LLC | Circuits and methods for generating a diagnostic mode of operation in a magnetic field sensor |
JP2012168899A (ja) * | 2011-02-16 | 2012-09-06 | Seiko Instruments Inc | ボルテージレギュレータ |
US8680846B2 (en) | 2011-04-27 | 2014-03-25 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor |
US8604777B2 (en) | 2011-07-13 | 2013-12-10 | Allegro Microsystems, Llc | Current sensor with calibration for a current divider configuration |
US9201122B2 (en) | 2012-02-16 | 2015-12-01 | Allegro Microsystems, Llc | Circuits and methods using adjustable feedback for self-calibrating or self-testing a magnetic field sensor with an adjustable time constant |
US9817078B2 (en) | 2012-05-10 | 2017-11-14 | Allegro Microsystems Llc | Methods and apparatus for magnetic sensor having integrated coil |
US9383425B2 (en) | 2012-12-28 | 2016-07-05 | Allegro Microsystems, Llc | Methods and apparatus for a current sensor having fault detection and self test functionality |
US10725100B2 (en) | 2013-03-15 | 2020-07-28 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having an externally accessible coil |
US10145908B2 (en) | 2013-07-19 | 2018-12-04 | Allegro Microsystems, Llc | Method and apparatus for magnetic sensor producing a changing magnetic field |
US9810519B2 (en) | 2013-07-19 | 2017-11-07 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors that act as tooth detectors |
US10495699B2 (en) | 2013-07-19 | 2019-12-03 | Allegro Microsystems, Llc | Methods and apparatus for magnetic sensor having an integrated coil or magnet to detect a non-ferromagnetic target |
EP3203254A1 (en) | 2013-12-26 | 2017-08-09 | Allegro Microsystems, LLC | Methods and apparatus for sensor diagnostics |
US9645220B2 (en) | 2014-04-17 | 2017-05-09 | Allegro Microsystems, Llc | Circuits and methods for self-calibrating or self-testing a magnetic field sensor using phase discrimination |
US9735773B2 (en) | 2014-04-29 | 2017-08-15 | Allegro Microsystems, Llc | Systems and methods for sensing current through a low-side field effect transistor |
US9739846B2 (en) | 2014-10-03 | 2017-08-22 | Allegro Microsystems, Llc | Magnetic field sensors with self test |
US9719806B2 (en) | 2014-10-31 | 2017-08-01 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a movement of a ferromagnetic target object |
US9823092B2 (en) | 2014-10-31 | 2017-11-21 | Allegro Microsystems, Llc | Magnetic field sensor providing a movement detector |
US10712403B2 (en) | 2014-10-31 | 2020-07-14 | Allegro Microsystems, Llc | Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element |
US9720054B2 (en) | 2014-10-31 | 2017-08-01 | Allegro Microsystems, Llc | Magnetic field sensor and electronic circuit that pass amplifier current through a magnetoresistance element |
US9841485B2 (en) | 2014-11-14 | 2017-12-12 | Allegro Microsystems, Llc | Magnetic field sensor having calibration circuitry and techniques |
US10466298B2 (en) | 2014-11-14 | 2019-11-05 | Allegro Microsystems, Llc | Magnetic field sensor with shared path amplifier and analog-to-digital-converter |
US9804249B2 (en) | 2014-11-14 | 2017-10-31 | Allegro Microsystems, Llc | Dual-path analog to digital converter |
US9638764B2 (en) | 2015-04-08 | 2017-05-02 | Allegro Microsystems, Llc | Electronic circuit for driving a hall effect element with a current compensated for substrate stress |
US9851417B2 (en) | 2015-07-28 | 2017-12-26 | Allegro Microsystems, Llc | Structure and system for simultaneous sensing a magnetic field and mechanical stress |
US10107873B2 (en) | 2016-03-10 | 2018-10-23 | Allegro Microsystems, Llc | Electronic circuit for compensating a sensitivity drift of a hall effect element due to stress |
US10132879B2 (en) | 2016-05-23 | 2018-11-20 | Allegro Microsystems, Llc | Gain equalization for multiple axis magnetic field sensing |
US10012518B2 (en) | 2016-06-08 | 2018-07-03 | Allegro Microsystems, Llc | Magnetic field sensor for sensing a proximity of an object |
US10260905B2 (en) | 2016-06-08 | 2019-04-16 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors to cancel offset variations |
US10041810B2 (en) | 2016-06-08 | 2018-08-07 | Allegro Microsystems, Llc | Arrangements for magnetic field sensors that act as movement detectors |
US10162017B2 (en) | 2016-07-12 | 2018-12-25 | Allegro Microsystems, Llc | Systems and methods for reducing high order hall plate sensitivity temperature coefficients |
US10324141B2 (en) | 2017-05-26 | 2019-06-18 | Allegro Microsystems, Llc | Packages for coil actuated position sensors |
US10837943B2 (en) | 2017-05-26 | 2020-11-17 | Allegro Microsystems, Llc | Magnetic field sensor with error calculation |
US10641842B2 (en) | 2017-05-26 | 2020-05-05 | Allegro Microsystems, Llc | Targets for coil actuated position sensors |
US10996289B2 (en) | 2017-05-26 | 2021-05-04 | Allegro Microsystems, Llc | Coil actuated position sensor with reflected magnetic field |
US11428755B2 (en) | 2017-05-26 | 2022-08-30 | Allegro Microsystems, Llc | Coil actuated sensor with sensitivity detection |
US10310028B2 (en) | 2017-05-26 | 2019-06-04 | Allegro Microsystems, Llc | Coil actuated pressure sensor |
US10520559B2 (en) | 2017-08-14 | 2019-12-31 | Allegro Microsystems, Llc | Arrangements for Hall effect elements and vertical epi resistors upon a substrate |
US10866117B2 (en) | 2018-03-01 | 2020-12-15 | Allegro Microsystems, Llc | Magnetic field influence during rotation movement of magnetic target |
US11255700B2 (en) | 2018-08-06 | 2022-02-22 | Allegro Microsystems, Llc | Magnetic field sensor |
US10823586B2 (en) | 2018-12-26 | 2020-11-03 | Allegro Microsystems, Llc | Magnetic field sensor having unequally spaced magnetic field sensing elements |
US11061084B2 (en) | 2019-03-07 | 2021-07-13 | Allegro Microsystems, Llc | Coil actuated pressure sensor and deflectable substrate |
US10955306B2 (en) | 2019-04-22 | 2021-03-23 | Allegro Microsystems, Llc | Coil actuated pressure sensor and deformable substrate |
US11280637B2 (en) | 2019-11-14 | 2022-03-22 | Allegro Microsystems, Llc | High performance magnetic angle sensor |
US11237020B2 (en) | 2019-11-14 | 2022-02-01 | Allegro Microsystems, Llc | Magnetic field sensor having two rows of magnetic field sensing elements for measuring an angle of rotation of a magnet |
US11194004B2 (en) | 2020-02-12 | 2021-12-07 | Allegro Microsystems, Llc | Diagnostic circuits and methods for sensor test circuits |
US11169223B2 (en) | 2020-03-23 | 2021-11-09 | Allegro Microsystems, Llc | Hall element signal calibrating in angle sensor |
US11262422B2 (en) | 2020-05-08 | 2022-03-01 | Allegro Microsystems, Llc | Stray-field-immune coil-activated position sensor |
US11493361B2 (en) | 2021-02-26 | 2022-11-08 | Allegro Microsystems, Llc | Stray field immune coil-activated sensor |
US11630130B2 (en) | 2021-03-31 | 2023-04-18 | Allegro Microsystems, Llc | Channel sensitivity matching |
US11578997B1 (en) | 2021-08-24 | 2023-02-14 | Allegro Microsystems, Llc | Angle sensor using eddy currents |
US11994541B2 (en) | 2022-04-15 | 2024-05-28 | Allegro Microsystems, Llc | Current sensor assemblies for low currents |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1243175A (en) * | 1967-09-01 | 1971-08-18 | Lucas Industries Ltd | Electrical component assemblies |
GB1500394A (en) * | 1976-04-27 | 1978-02-08 | Welwyn Electric Ltd | Electrical resistor network |
US4182024A (en) * | 1977-12-15 | 1980-01-08 | National Semiconductor Corporation | Automatic control of integrated circuit trimming |
US4201970A (en) * | 1978-08-07 | 1980-05-06 | Rca Corporation | Method and apparatus for trimming resistors |
-
1980
- 1980-08-13 DE DE19803030620 patent/DE3030620A1/de not_active Withdrawn
-
1981
- 1981-07-27 EP EP81105923A patent/EP0045895A1/de not_active Withdrawn
- 1981-08-07 US US06/291,112 patent/US4438347A/en not_active Expired - Fee Related
- 1981-08-13 JP JP56127321A patent/JPS5759372A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60254763A (ja) * | 1984-05-31 | 1985-12-16 | Sanken Electric Co Ltd | 集積回路の製造方法 |
JPH0455344B2 (ja) * | 1984-05-31 | 1992-09-03 | Sanken Electric Co Ltd | |
JP2020148699A (ja) * | 2019-03-15 | 2020-09-17 | エイブリック株式会社 | 半導体装置 |
Also Published As
Publication number | Publication date |
---|---|
DE3030620A1 (de) | 1982-03-11 |
EP0045895A1 (de) | 1982-02-17 |
US4438347A (en) | 1984-03-20 |
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