JPS5756729A - Impulsive force measuring device - Google Patents
Impulsive force measuring deviceInfo
- Publication number
- JPS5756729A JPS5756729A JP13147680A JP13147680A JPS5756729A JP S5756729 A JPS5756729 A JP S5756729A JP 13147680 A JP13147680 A JP 13147680A JP 13147680 A JP13147680 A JP 13147680A JP S5756729 A JPS5756729 A JP S5756729A
- Authority
- JP
- Japan
- Prior art keywords
- impulsive force
- diaphragm
- pickup
- measuring device
- peak value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/0052—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to impact
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Force Measurement Appropriate To Specific Purposes (AREA)
Abstract
PURPOSE:To simplify a measuring device by obtaining the peak value or integral value of a voltage by detecting impulsive force, applied to a diaphragm, directly by a pickup provided at the back of the disphragm. CONSTITUTION:Impulsive force generated by colliding a ball, etc., is measured. For example, the impulsive force is applied to a diaphragm 5 whose circumferential edge is fixed to a frame 4 and an electromagnetic pickup 6 is provided at the back or on the back side of the diaphragm 5. This pickup 6, including a permanent magnet 13 and a coil 8, detects vibrations of the diaphragm 5 and the peak value or integral value of a voltage induced across the pickup 6 is measured by impulsive force evaluation device 20 to display the peak value or integral value on a display device 30.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13147680A JPS5756729A (en) | 1980-09-24 | 1980-09-24 | Impulsive force measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13147680A JPS5756729A (en) | 1980-09-24 | 1980-09-24 | Impulsive force measuring device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5756729A true JPS5756729A (en) | 1982-04-05 |
Family
ID=15058859
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13147680A Pending JPS5756729A (en) | 1980-09-24 | 1980-09-24 | Impulsive force measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5756729A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0393761U (en) * | 1989-10-06 | 1991-09-25 | ||
KR100504108B1 (en) * | 1997-12-12 | 2005-09-30 | 삼성전자주식회사 | Vibration measuring equipment of semiconductor device manufacturing equipment |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5011760U (en) * | 1973-06-06 | 1975-02-06 | ||
JPS5568374A (en) * | 1978-11-15 | 1980-05-23 | Mutsumi Yamaguchi | Pitching game device |
JPS561673B2 (en) * | 1975-06-23 | 1981-01-14 |
-
1980
- 1980-09-24 JP JP13147680A patent/JPS5756729A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5011760U (en) * | 1973-06-06 | 1975-02-06 | ||
JPS561673B2 (en) * | 1975-06-23 | 1981-01-14 | ||
JPS5568374A (en) * | 1978-11-15 | 1980-05-23 | Mutsumi Yamaguchi | Pitching game device |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0393761U (en) * | 1989-10-06 | 1991-09-25 | ||
KR100504108B1 (en) * | 1997-12-12 | 2005-09-30 | 삼성전자주식회사 | Vibration measuring equipment of semiconductor device manufacturing equipment |
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