JPS5755643A - Circuit testing device - Google Patents

Circuit testing device

Info

Publication number
JPS5755643A
JPS5755643A JP55131267A JP13126780A JPS5755643A JP S5755643 A JPS5755643 A JP S5755643A JP 55131267 A JP55131267 A JP 55131267A JP 13126780 A JP13126780 A JP 13126780A JP S5755643 A JPS5755643 A JP S5755643A
Authority
JP
Japan
Prior art keywords
circuit
specific kind
circuits
those
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55131267A
Other languages
Japanese (ja)
Inventor
Akira Onodera
Yasuhiro Ogawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55131267A priority Critical patent/JPS5755643A/en
Publication of JPS5755643A publication Critical patent/JPS5755643A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Data Exchanges In Wide-Area Networks (AREA)

Abstract

PURPOSE:To test circuits other than a specific kind of circuit, by providing a means of converting electric signal conditions of circuits other than the specific kind of circuit into those of the specific kind of circuit. CONSTITUTION:A specific kind of circuit is tested according to the same prcedure with an ordinary circuit testing device. To test circuits using electric conditions other than those of the specific kind of circuit, a person in charge of the test energizes the relays SW of a signal converting circuit SCV previously and consequently the circuits SV are inserted between a circuit-side testing circuit L and an exchange- side testing circuit S. This circuit SCV functions to convert the electric signal condition into those of the specific kind of circuit. As a result, the circuit to be tested is tested while the specific kind of circuit is considered to be connected to a circuit lead-in device CTS.
JP55131267A 1980-09-20 1980-09-20 Circuit testing device Pending JPS5755643A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55131267A JPS5755643A (en) 1980-09-20 1980-09-20 Circuit testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55131267A JPS5755643A (en) 1980-09-20 1980-09-20 Circuit testing device

Publications (1)

Publication Number Publication Date
JPS5755643A true JPS5755643A (en) 1982-04-02

Family

ID=15053926

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55131267A Pending JPS5755643A (en) 1980-09-20 1980-09-20 Circuit testing device

Country Status (1)

Country Link
JP (1) JPS5755643A (en)

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