JPS5753839A - Optical reproducer - Google Patents

Optical reproducer

Info

Publication number
JPS5753839A
JPS5753839A JP12972880A JP12972880A JPS5753839A JP S5753839 A JPS5753839 A JP S5753839A JP 12972880 A JP12972880 A JP 12972880A JP 12972880 A JP12972880 A JP 12972880A JP S5753839 A JPS5753839 A JP S5753839A
Authority
JP
Japan
Prior art keywords
reflected light
reproduced signal
optical
reproducer
detectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12972880A
Other languages
Japanese (ja)
Other versions
JPH0127492B2 (en
Inventor
Shunji Harikae
Tomio Yoshida
Isao Sato
Kenji Koishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP12972880A priority Critical patent/JPS5753839A/en
Publication of JPS5753839A publication Critical patent/JPS5753839A/en
Publication of JPH0127492B2 publication Critical patent/JPH0127492B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Automatic Focus Adjustment (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Optical Head (AREA)

Abstract

PURPOSE:To miniaturize an optical reproducer and to obtain a reproduced signal with high S/N, by dividing a reflected light flux into two parts by installing a wedge right after a focusing lens and obtaining a servo signal and a reproduced signal from each of the divided two light fluxes. CONSTITUTION:The reflected light flux given from a disk 6 is focused by a single lens 7 and divided into two parts by a wedge 10 to be led to photodetectors 13 and 14. The servo signals for focusing and tracking are obtained from the detectors 13 and 14, respectively. At the same time, a reproduced signal is obtained from the total sum of the outputs of detectors 13 and 14. Thus the number of optical elements can be reduced in an optical path of reflected light in comparison with the conventional optical system. As a result, not only the miniaturization but a low cost can be realized for an optical reproducer. Furthermore, the reproduced signal is obtained from the whole quantity of reflected light to increase the S/N.
JP12972880A 1980-09-17 1980-09-17 Optical reproducer Granted JPS5753839A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12972880A JPS5753839A (en) 1980-09-17 1980-09-17 Optical reproducer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12972880A JPS5753839A (en) 1980-09-17 1980-09-17 Optical reproducer

Publications (2)

Publication Number Publication Date
JPS5753839A true JPS5753839A (en) 1982-03-31
JPH0127492B2 JPH0127492B2 (en) 1989-05-29

Family

ID=15016724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12972880A Granted JPS5753839A (en) 1980-09-17 1980-09-17 Optical reproducer

Country Status (1)

Country Link
JP (1) JPS5753839A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1569283A1 (en) * 2004-01-26 2005-08-31 LumiLeds Lighting U.S., LLC LED with an optical system to increase luminance by recycling emitted light
JP2008196872A (en) * 2007-02-09 2008-08-28 Lasertec Corp Inspection device, inspection method, and manufacturing method of pattern substrate
JP2009150910A (en) * 2009-04-02 2009-07-09 Lasertec Corp Defect inspection device, defect inspection method, optical scanning device, and production method of semiconductor device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1569283A1 (en) * 2004-01-26 2005-08-31 LumiLeds Lighting U.S., LLC LED with an optical system to increase luminance by recycling emitted light
US7080932B2 (en) 2004-01-26 2006-07-25 Philips Lumileds Lighting Company, Llc LED with an optical system to increase luminance by recycling emitted light
JP2008196872A (en) * 2007-02-09 2008-08-28 Lasertec Corp Inspection device, inspection method, and manufacturing method of pattern substrate
JP2009150910A (en) * 2009-04-02 2009-07-09 Lasertec Corp Defect inspection device, defect inspection method, optical scanning device, and production method of semiconductor device

Also Published As

Publication number Publication date
JPH0127492B2 (en) 1989-05-29

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