JPS5751734B2 - - Google Patents
Info
- Publication number
- JPS5751734B2 JPS5751734B2 JP74412A JP41274A JPS5751734B2 JP S5751734 B2 JPS5751734 B2 JP S5751734B2 JP 74412 A JP74412 A JP 74412A JP 41274 A JP41274 A JP 41274A JP S5751734 B2 JPS5751734 B2 JP S5751734B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP74412A JPS5751734B2 (enExample) | 1973-12-26 | 1973-12-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP74412A JPS5751734B2 (enExample) | 1973-12-26 | 1973-12-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5098282A JPS5098282A (enExample) | 1975-08-05 |
| JPS5751734B2 true JPS5751734B2 (enExample) | 1982-11-04 |
Family
ID=11473070
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP74412A Expired JPS5751734B2 (enExample) | 1973-12-26 | 1973-12-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5751734B2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62876A (ja) * | 1985-06-27 | 1987-01-06 | Mitsubishi Electric Corp | 半導体集積回路用試験装置 |
| JP2531042Y2 (ja) * | 1990-09-28 | 1997-04-02 | アンリツ株式会社 | プローブヘッド |
| JPH0459145U (enExample) * | 1990-09-28 | 1992-05-21 | ||
| JP2531043Y2 (ja) * | 1990-09-28 | 1997-04-02 | アンリツ株式会社 | プローブヘッドの先端構造 |
-
1973
- 1973-12-26 JP JP74412A patent/JPS5751734B2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5098282A (enExample) | 1975-08-05 |