JPS57506A - Method for measuring wall thickness of outer coating of electrical cable - Google Patents
Method for measuring wall thickness of outer coating of electrical cableInfo
- Publication number
- JPS57506A JPS57506A JP7278180A JP7278180A JPS57506A JP S57506 A JPS57506 A JP S57506A JP 7278180 A JP7278180 A JP 7278180A JP 7278180 A JP7278180 A JP 7278180A JP S57506 A JPS57506 A JP S57506A
- Authority
- JP
- Japan
- Prior art keywords
- outer coating
- reference points
- electrical cable
- wall thickness
- measuring wall
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
PURPOSE:To measure safely an outer coating wall thickness of an electric cable without contacting by using a photoelectrical measurement and an electromagnetic measurement together. CONSTITUTION:A scanning camera 10 is arranged on a upper direction of a running path of an electric cable 3 comprising a central conductor 1 and an outer coating of an insulator coated on it, further two reference points S, S' are located on both sides of the running path, and a sensor for a displacement gauge comprising high frequency coils 12, 12' is placed on this reference points S, S'. The scanning camera 10 detects a distance between the reference points S, S' photoelectrically and the outer surface of the electrical cable 3 and the high frequency coils 12, 12' detect a distance between the reference points S, S' and the central conductor 1 of the electrical cable 3 electromagnetically. On the basis of these detected values, the thickness of the outer coating 2 is measured.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7278180A JPS57506A (en) | 1980-06-02 | 1980-06-02 | Method for measuring wall thickness of outer coating of electrical cable |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7278180A JPS57506A (en) | 1980-06-02 | 1980-06-02 | Method for measuring wall thickness of outer coating of electrical cable |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS57506A true JPS57506A (en) | 1982-01-05 |
Family
ID=13499267
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7278180A Pending JPS57506A (en) | 1980-06-02 | 1980-06-02 | Method for measuring wall thickness of outer coating of electrical cable |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS57506A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6111606A (en) * | 1984-06-18 | 1986-01-20 | ツムバツハ・エレクトロニク・アクチエンゲゼルシヤフト | Method and device for inspecting thickness of layer |
US5355083A (en) * | 1988-11-16 | 1994-10-11 | Measurex Corporation | Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate |
-
1980
- 1980-06-02 JP JP7278180A patent/JPS57506A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6111606A (en) * | 1984-06-18 | 1986-01-20 | ツムバツハ・エレクトロニク・アクチエンゲゼルシヤフト | Method and device for inspecting thickness of layer |
JPH0539407B2 (en) * | 1984-06-18 | 1993-06-15 | Zumbach Electronic Ag | |
US5355083A (en) * | 1988-11-16 | 1994-10-11 | Measurex Corporation | Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate |
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