JPS5740925A - Detecting method of shifting speed - Google Patents
Detecting method of shifting speedInfo
- Publication number
- JPS5740925A JPS5740925A JP11666680A JP11666680A JPS5740925A JP S5740925 A JPS5740925 A JP S5740925A JP 11666680 A JP11666680 A JP 11666680A JP 11666680 A JP11666680 A JP 11666680A JP S5740925 A JPS5740925 A JP S5740925A
- Authority
- JP
- Japan
- Prior art keywords
- patterns
- shifting speed
- standstill
- shifted
- pulse
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
- G03F1/44—Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/82—Auxiliary processes, e.g. cleaning or inspecting
- G03F1/84—Inspecting
Abstract
PURPOSE:To detect the shrunk part of a mask pattern by a method wherein a stage, having a plurality of vernier patterns graduated at different pitches, is shifted at a fixed speed and the shifting speed is detected by the pattern which looks as if it is at a standstill among the plurality of patterns. CONSTITUTION:The stage 2 of a guide section is shifted by a driving section 1. The mask 3, whereon the vernier patterns are graduated, is fixed on the stage 2. The vision of a lens systme 7 is projected on an image monitor 4, one of the vernier patterns on the image monitor is seen as if it is at a standstill while the driving section 1 and the vernier patterns are shifted at a fixed step and measurements. The patterns 11, 10 and 12 are looked as if they are at a standstill when the feed of the driving secion 1 is 50mum/pulse, 49mum/pulse and 51mum/pulse. Through these procedures, the shifting speed can be visually detected. The expansion and contraction of a substance can be detected when the shifting speed of the substance is unchanged .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11666680A JPS5740925A (en) | 1980-08-25 | 1980-08-25 | Detecting method of shifting speed |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11666680A JPS5740925A (en) | 1980-08-25 | 1980-08-25 | Detecting method of shifting speed |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5740925A true JPS5740925A (en) | 1982-03-06 |
Family
ID=14692881
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11666680A Pending JPS5740925A (en) | 1980-08-25 | 1980-08-25 | Detecting method of shifting speed |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5740925A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05129178A (en) * | 1991-10-31 | 1993-05-25 | Toshiba Corp | Method for measuring misalignment |
-
1980
- 1980-08-25 JP JP11666680A patent/JPS5740925A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05129178A (en) * | 1991-10-31 | 1993-05-25 | Toshiba Corp | Method for measuring misalignment |
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