JPS5727576B2 - - Google Patents

Info

Publication number
JPS5727576B2
JPS5727576B2 JP8539775A JP8539775A JPS5727576B2 JP S5727576 B2 JPS5727576 B2 JP S5727576B2 JP 8539775 A JP8539775 A JP 8539775A JP 8539775 A JP8539775 A JP 8539775A JP S5727576 B2 JPS5727576 B2 JP S5727576B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8539775A
Other languages
Japanese (ja)
Other versions
JPS529487A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP50085397A priority Critical patent/JPS529487A/ja
Publication of JPS529487A publication Critical patent/JPS529487A/ja
Publication of JPS5727576B2 publication Critical patent/JPS5727576B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP50085397A 1975-07-14 1975-07-14 Sample analyzer Granted JPS529487A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP50085397A JPS529487A (en) 1975-07-14 1975-07-14 Sample analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP50085397A JPS529487A (en) 1975-07-14 1975-07-14 Sample analyzer

Publications (2)

Publication Number Publication Date
JPS529487A JPS529487A (en) 1977-01-25
JPS5727576B2 true JPS5727576B2 (enrdf_load_stackoverflow) 1982-06-11

Family

ID=13857627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP50085397A Granted JPS529487A (en) 1975-07-14 1975-07-14 Sample analyzer

Country Status (1)

Country Link
JP (1) JPS529487A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0292174U (enrdf_load_stackoverflow) * 1989-01-10 1990-07-23

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59224549A (ja) * 1983-06-04 1984-12-17 Shimadzu Corp 質量分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0292174U (enrdf_load_stackoverflow) * 1989-01-10 1990-07-23

Also Published As

Publication number Publication date
JPS529487A (en) 1977-01-25

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