JPS5726215Y2 - - Google Patents

Info

Publication number
JPS5726215Y2
JPS5726215Y2 JP1976115232U JP11523276U JPS5726215Y2 JP S5726215 Y2 JPS5726215 Y2 JP S5726215Y2 JP 1976115232 U JP1976115232 U JP 1976115232U JP 11523276 U JP11523276 U JP 11523276U JP S5726215 Y2 JPS5726215 Y2 JP S5726215Y2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1976115232U
Other versions
JPS5332939U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1976115232U priority Critical patent/JPS5726215Y2/ja
Publication of JPS5332939U publication Critical patent/JPS5332939U/ja
Application granted granted Critical
Publication of JPS5726215Y2 publication Critical patent/JPS5726215Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
JP1976115232U 1976-08-27 1976-08-27 Expired JPS5726215Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1976115232U JPS5726215Y2 (ja) 1976-08-27 1976-08-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1976115232U JPS5726215Y2 (ja) 1976-08-27 1976-08-27

Publications (2)

Publication Number Publication Date
JPS5332939U JPS5332939U (ja) 1978-03-22
JPS5726215Y2 true JPS5726215Y2 (ja) 1982-06-07

Family

ID=28724829

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1976115232U Expired JPS5726215Y2 (ja) 1976-08-27 1976-08-27

Country Status (1)

Country Link
JP (1) JPS5726215Y2 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2511784B2 (ja) * 1993-04-20 1996-07-03 旭マシナリー株式会社 ロ―タリ―カッタ―
JP2005100332A (ja) * 2003-08-29 2005-04-14 Kyodo Printing Co Ltd 接触式ｉｃカードまたはｉｃモジュールに内蔵されたｉｃチップの電気特性の検査・測定方法及び検査・測定システム並びにこれに用いる安定化電源
US9121900B2 (en) * 2011-12-02 2015-09-01 Sandisk Technologies Inc. Systems and methods for sensing signals communicated with a host device or on an interface of plug-in card when there is lack of access to sensing points

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5183758U (ja) * 1974-12-27 1976-07-05

Also Published As

Publication number Publication date
JPS5332939U (ja) 1978-03-22

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