JPS57239U - - Google Patents

Info

Publication number
JPS57239U
JPS57239U JP7247980U JP7247980U JPS57239U JP S57239 U JPS57239 U JP S57239U JP 7247980 U JP7247980 U JP 7247980U JP 7247980 U JP7247980 U JP 7247980U JP S57239 U JPS57239 U JP S57239U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7247980U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7247980U priority Critical patent/JPS57239U/ja
Publication of JPS57239U publication Critical patent/JPS57239U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Debugging And Monitoring (AREA)
JP7247980U 1980-05-28 1980-05-28 Pending JPS57239U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7247980U JPS57239U (en) 1980-05-28 1980-05-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7247980U JPS57239U (en) 1980-05-28 1980-05-28

Publications (1)

Publication Number Publication Date
JPS57239U true JPS57239U (en) 1982-01-05

Family

ID=29435683

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7247980U Pending JPS57239U (en) 1980-05-28 1980-05-28

Country Status (1)

Country Link
JP (1) JPS57239U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS621038A (en) * 1985-06-26 1987-01-07 Panafacom Ltd Detection control system for abnormality of device temperature

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS621038A (en) * 1985-06-26 1987-01-07 Panafacom Ltd Detection control system for abnormality of device temperature

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