JPS57211061A - Electron scan type ultrasonic flaw detector - Google Patents

Electron scan type ultrasonic flaw detector

Info

Publication number
JPS57211061A
JPS57211061A JP56095250A JP9525081A JPS57211061A JP S57211061 A JPS57211061 A JP S57211061A JP 56095250 A JP56095250 A JP 56095250A JP 9525081 A JP9525081 A JP 9525081A JP S57211061 A JPS57211061 A JP S57211061A
Authority
JP
Japan
Prior art keywords
focal region
region gate
ultrasonic wave
circuit
focus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56095250A
Other languages
English (en)
Other versions
JPH0215821B2 (ja
Inventor
Kazuo Sugai
Yasuaki Sato
Hirotoshi Kino
Shiyuuichi Hiruoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Engineering Co Ltd
Hitachi Ltd
Original Assignee
Hitachi Engineering Co Ltd
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Engineering Co Ltd, Hitachi Ltd filed Critical Hitachi Engineering Co Ltd
Priority to JP56095250A priority Critical patent/JPS57211061A/ja
Priority to US06/389,911 priority patent/US4472973A/en
Priority to EP82105429A priority patent/EP0068389B1/en
Priority to DE8282105429T priority patent/DE3277645D1/de
Priority to CA000405546A priority patent/CA1193355A/en
Publication of JPS57211061A publication Critical patent/JPS57211061A/ja
Publication of JPH0215821B2 publication Critical patent/JPH0215821B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G10—MUSICAL INSTRUMENTS; ACOUSTICS
    • G10K—SOUND-PRODUCING DEVICES; METHODS OR DEVICES FOR PROTECTING AGAINST, OR FOR DAMPING, NOISE OR OTHER ACOUSTIC WAVES IN GENERAL; ACOUSTICS NOT OTHERWISE PROVIDED FOR
    • G10K11/00—Methods or devices for transmitting, conducting or directing sound in general; Methods or devices for protecting against, or for damping, noise or other acoustic waves in general
    • G10K11/18—Methods or devices for transmitting, conducting or directing sound
    • G10K11/26—Sound-focusing or directing, e.g. scanning
    • G10K11/34—Sound-focusing or directing, e.g. scanning using electrical steering of transducer arrays, e.g. beam steering
    • G10K11/341—Circuits therefor
    • G10K11/346—Circuits therefor using phase variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0645—Display representation or displayed parameters, e.g. A-, B- or C-Scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/262—Arrangements for orientation or scanning by relative movement of the head and the sensor by electronic orientation or focusing, e.g. with phased arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/52—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00
    • G01S7/52017—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00 particularly adapted to short-range imaging
    • G01S7/52053—Display arrangements
    • G01S7/52057—Cathode ray tube displays
    • G01S7/5206—Two-dimensional coordinated display of distance and direction; B-scan display

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Acoustics & Sound (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Multimedia (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP56095250A 1981-06-22 1981-06-22 Electron scan type ultrasonic flaw detector Granted JPS57211061A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP56095250A JPS57211061A (en) 1981-06-22 1981-06-22 Electron scan type ultrasonic flaw detector
US06/389,911 US4472973A (en) 1981-06-22 1982-06-18 Ultrasonic flaw detecting apparatus of electronically scanning type
EP82105429A EP0068389B1 (en) 1981-06-22 1982-06-21 Ultrasonic flaw detecting apparatus of electronically scanning type
DE8282105429T DE3277645D1 (en) 1981-06-22 1982-06-21 Ultrasonic flaw detecting apparatus of electronically scanning type
CA000405546A CA1193355A (en) 1981-06-22 1982-06-21 Ultrasonic flaw detecting apparatus of electronically scanning type

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56095250A JPS57211061A (en) 1981-06-22 1981-06-22 Electron scan type ultrasonic flaw detector

Publications (2)

Publication Number Publication Date
JPS57211061A true JPS57211061A (en) 1982-12-24
JPH0215821B2 JPH0215821B2 (ja) 1990-04-13

Family

ID=14132504

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56095250A Granted JPS57211061A (en) 1981-06-22 1981-06-22 Electron scan type ultrasonic flaw detector

Country Status (5)

Country Link
US (1) US4472973A (ja)
EP (1) EP0068389B1 (ja)
JP (1) JPS57211061A (ja)
CA (1) CA1193355A (ja)
DE (1) DE3277645D1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103630606A (zh) * 2013-12-06 2014-03-12 新兴铸管股份有限公司 双金属冶金复合锅炉管超声波分层检测方法

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4537073A (en) * 1982-12-24 1985-08-27 Kabushiki Kaisha Kobe Seiko Sho Inspection method of square billet using electronic scanning
JPS605136A (ja) * 1983-06-24 1985-01-11 株式会社日立製作所 超音波断層装置
JPS60103944A (ja) * 1983-11-10 1985-06-08 株式会社東芝 超音波検査装置
US4736630A (en) * 1985-08-05 1988-04-12 Hitachi, Ltd. Apparatus and method for sending out and receiving ultrasonic wave signals
DE3641027A1 (de) * 1986-12-01 1988-06-09 Fraunhofer Ges Forschung Verfahren zur ortung von schallemissionsquellen und vorrichtung zur durchfuehrung des verfahrens
US4949259A (en) * 1987-10-29 1990-08-14 Hewlett-Packard Company Delay coefficient generator for accumulators
JPH01156661A (ja) * 1987-12-15 1989-06-20 Hitachi Ltd 接合部探査装置
US4947351A (en) * 1988-05-06 1990-08-07 The United States Of America As Represented By The Secretary Of The Air Force Ultrasonic scan system for nondestructive inspection
DE19608930A1 (de) * 1996-03-07 1997-09-11 Frieder A Grieshaber Verfahren zur Bestimmung der Dichte von Stoffen
DE19617455C2 (de) * 1996-05-02 1998-04-09 Siemens Ag Verfahren zur Ultraschallprüfung eines Werkstückes
FR2796153B1 (fr) * 1999-07-09 2001-11-30 Setval Controle non destructif a capteurs ultrasonores repartis
WO2001071337A1 (en) * 2000-03-16 2001-09-27 Howmet Research Corporation Method of detecting hard alpha inclusions in a titanium casting
US20070068253A1 (en) * 2005-09-15 2007-03-29 General Electric Company Uni-index variable angle phased array probe
DE102006010010A1 (de) * 2006-03-04 2007-09-06 Intelligendt Systems & Services Gmbh & Co Kg Verfahren zur Ultraschallprüfung eines Werkstückes in einem gekrümmten Bereich seiner Oberfläche und zur Durchführung des Verfahrens geeignete Prüfanordnung
US7975549B2 (en) * 2007-06-19 2011-07-12 The Boeing Company Method, apparatus and system for inspecting a workpiece having a curved surface
JP5461979B2 (ja) * 2009-12-22 2014-04-02 株式会社東芝 原子炉振動監視装置及びその監視方法
CN102095801A (zh) * 2011-01-28 2011-06-15 首钢总公司 一种快速准确检测铸坯内夹杂物的系统及其方法
DE102014102374B4 (de) 2014-02-24 2016-01-14 Areva Gmbh Verfahren zur Prüfung eines Werkstücks mittels Ultraschall
CN106994984B (zh) * 2017-05-23 2023-09-01 山东省科学院激光研究所 激光声磁钢轨表面缺陷快速探伤系统及方法
WO2020056500A1 (en) * 2018-09-18 2020-03-26 The University Of British Columbia Ultrasonic analysis of a subject

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55140149A (en) * 1979-04-20 1980-11-01 Hitachi Ltd Supersonic wave flaw detector

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52131679A (en) * 1976-04-28 1977-11-04 Tokyo Shibaura Electric Co Ultrasonic diagnostic device
JPS53114282A (en) * 1977-03-16 1978-10-05 Tokyo Shibaura Electric Co Ultrasonic diagnosing device
GB1604159A (en) * 1977-06-15 1981-12-02 Svejsecentralen Apparatus for providing an ultrasonic sectional view
US4267584A (en) * 1977-07-01 1981-05-12 Siemens Gammasonics, Inc. Permutating analog shift register variable delay system
US4173007A (en) * 1977-07-01 1979-10-30 G. D. Searle & Co. Dynamically variable electronic delay lines for real time ultrasonic imaging systems
US4180790A (en) * 1977-12-27 1979-12-25 General Electric Company Dynamic array aperture and focus control for ultrasonic imaging systems
GB2033579B (en) * 1978-10-05 1983-05-11 Babcock Power Ltd Ultrasonic probes
US4287768A (en) * 1978-11-13 1981-09-08 Matsushita Electric Industrial Company, Limited Beam deflection method and apparatus for sector scan ultrasound imaging systems
US4241610A (en) * 1979-02-05 1980-12-30 Varian Associates, Inc. Ultrasonic imaging system utilizing dynamic and pseudo-dynamic focusing
AU536017B2 (en) * 1979-02-20 1984-04-12 Commonwealth Of Australia, The Ultrasonic linear array beamforming method and apparatus
DE2926173A1 (de) * 1979-06-28 1981-01-15 Siemens Ag Verfahren zur zerstoerungsfreien werkstoffpruefung mit ultraschallimpulsen
JPS5611047A (en) * 1979-07-11 1981-02-04 Tokyo Shibaura Electric Co Ultrasonic diagnosing device
JPS5615734A (en) * 1979-07-20 1981-02-16 Tokyo Shibaura Electric Co Ultrasonic diagnosing device
US4271707A (en) * 1979-11-16 1981-06-09 Northrop Corporation Received signal encoding and correlating system
JPS5670758A (en) * 1979-11-16 1981-06-12 Matsushita Electric Ind Co Ltd Ultrasonic diagnosis apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55140149A (en) * 1979-04-20 1980-11-01 Hitachi Ltd Supersonic wave flaw detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103630606A (zh) * 2013-12-06 2014-03-12 新兴铸管股份有限公司 双金属冶金复合锅炉管超声波分层检测方法

Also Published As

Publication number Publication date
EP0068389B1 (en) 1987-11-11
JPH0215821B2 (ja) 1990-04-13
US4472973A (en) 1984-09-25
EP0068389A1 (en) 1983-01-05
DE3277645D1 (en) 1987-12-17
CA1193355A (en) 1985-09-10

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