JPS571955A - Light receiving device for inspecting plate surface - Google Patents
Light receiving device for inspecting plate surfaceInfo
- Publication number
- JPS571955A JPS571955A JP7558380A JP7558380A JPS571955A JP S571955 A JPS571955 A JP S571955A JP 7558380 A JP7558380 A JP 7558380A JP 7558380 A JP7558380 A JP 7558380A JP S571955 A JPS571955 A JP S571955A
- Authority
- JP
- Japan
- Prior art keywords
- slit
- plate
- box
- light receiving
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To increase the sensitivity in checking defective parts by providing a specified slit for inputting and outputting a laser beam at the bottom of a tightly enclosed box in inspecting silicon wafers and the like. CONSTITUTION:A pair of scattered light sensors each comprising a cylindrical lens 9 and a light receiving slit plate 12, and a linear photoelectric converter 8a are enclosed in cases 13, and fixed to a base 15 by supporting plate 14 in parallel with and on both sides of a scanning line A so that they face to each other. The pair of the cases 13 are covered by a box 10 and tightly closed. The width of the slits provided in the lid and bottom of the box 10 are of the minimum size required for passing the laser beam 2. The base 15 is arranged at the close proximity to the plate 5 to be inspected in parallel. The scanning line A is a central line of the light emitting slit 11. At the time of inspection, the plate 5 is moved in the direction at a right angle with the longitudinal direction of the slit 11, and secondary scanning is performed in the Y direction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7558380A JPS571955A (en) | 1980-06-06 | 1980-06-06 | Light receiving device for inspecting plate surface |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7558380A JPS571955A (en) | 1980-06-06 | 1980-06-06 | Light receiving device for inspecting plate surface |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS571955A true JPS571955A (en) | 1982-01-07 |
JPS6321854B2 JPS6321854B2 (en) | 1988-05-09 |
Family
ID=13580352
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7558380A Granted JPS571955A (en) | 1980-06-06 | 1980-06-06 | Light receiving device for inspecting plate surface |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS571955A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58158937A (en) * | 1982-03-17 | 1983-09-21 | Hitachi Ltd | Surface defect detector |
JPS62105038A (en) * | 1985-11-01 | 1987-05-15 | Hitachi Electronics Eng Co Ltd | Photodetection system for inspecting instrument for glass substrate surface |
JPH02269938A (en) * | 1989-04-11 | 1990-11-05 | Idemitsu Petrochem Co Ltd | Analysis apparatus |
-
1980
- 1980-06-06 JP JP7558380A patent/JPS571955A/en active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58158937A (en) * | 1982-03-17 | 1983-09-21 | Hitachi Ltd | Surface defect detector |
JPS62105038A (en) * | 1985-11-01 | 1987-05-15 | Hitachi Electronics Eng Co Ltd | Photodetection system for inspecting instrument for glass substrate surface |
JPH02269938A (en) * | 1989-04-11 | 1990-11-05 | Idemitsu Petrochem Co Ltd | Analysis apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPS6321854B2 (en) | 1988-05-09 |
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