JPS57191502A - Positioning system - Google Patents

Positioning system

Info

Publication number
JPS57191502A
JPS57191502A JP57041832A JP4183282A JPS57191502A JP S57191502 A JPS57191502 A JP S57191502A JP 57041832 A JP57041832 A JP 57041832A JP 4183282 A JP4183282 A JP 4183282A JP S57191502 A JPS57191502 A JP S57191502A
Authority
JP
Japan
Prior art keywords
positioning system
positioning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57041832A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6312522B2 (enExample
Inventor
Deebitsudo Gurobuman Uooren
Arubaato Neruson Ji Deebitsudo
Maikeru Waaroumonto Jiyon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS57191502A publication Critical patent/JPS57191502A/ja
Publication of JPS6312522B2 publication Critical patent/JPS6312522B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7073—Alignment marks and their environment
    • G03F9/7076—Mark details, e.g. phase grating mark, temporary mark
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1876—Diffractive Fresnel lenses; Zone plates; Kinoforms
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7049—Technique, e.g. interferometric

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Control Of Position Or Direction (AREA)
JP57041832A 1981-05-20 1982-03-18 Positioning system Granted JPS57191502A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/265,140 US4405238A (en) 1981-05-20 1981-05-20 Alignment method and apparatus for x-ray or optical lithography

Publications (2)

Publication Number Publication Date
JPS57191502A true JPS57191502A (en) 1982-11-25
JPS6312522B2 JPS6312522B2 (enExample) 1988-03-19

Family

ID=23009187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57041832A Granted JPS57191502A (en) 1981-05-20 1982-03-18 Positioning system

Country Status (4)

Country Link
US (1) US4405238A (enExample)
EP (1) EP0065115B1 (enExample)
JP (1) JPS57191502A (enExample)
DE (1) DE3265191D1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61128106A (ja) * 1984-11-26 1986-06-16 Nippon Kogaku Kk <Nikon> 位置検出方法及び装置

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4765714A (en) * 1984-04-03 1988-08-23 Horner Joseph L Binary phase-only optical correlation system
DE3704313A1 (de) * 1986-11-20 1988-06-01 Krupp Gmbh Beruehrungsloses optisches verfahren zur bestimmung von gegenstaenden
US4815854A (en) * 1987-01-19 1989-03-28 Nec Corporation Method of alignment between mask and semiconductor wafer
US4791482A (en) * 1987-02-06 1988-12-13 Westinghouse Electric Corp. Object locating system
JPH01285803A (ja) * 1988-05-13 1989-11-16 Fujitsu Ltd フレネル・ゾーン・プレートおよびそれを用いる位置合せ方法
JPH07119574B2 (ja) * 1988-09-12 1995-12-20 富士通株式会社 二次元位置検出方法
JP2666859B2 (ja) * 1988-11-25 1997-10-22 日本電気株式会社 目合せ用バーニヤパターンを備えた半導体装置
US5229617A (en) * 1989-07-28 1993-07-20 Canon Kabushiki Kaisha Position detecting method having reflectively scattered light prevented from impinging on a detector
JP2925168B2 (ja) * 1989-07-28 1999-07-28 キヤノン株式会社 位置検出装置及び方法
JP3008633B2 (ja) * 1991-01-11 2000-02-14 キヤノン株式会社 位置検出装置
JP2592369B2 (ja) * 1991-08-22 1997-03-19 富士通株式会社 多層配線回路基板の製造方法及び誘電体ミラーマスクの製造方法
US5504596A (en) * 1992-12-21 1996-04-02 Nikon Corporation Exposure method and apparatus using holographic techniques
US5864394A (en) * 1994-06-20 1999-01-26 Kla-Tencor Corporation Surface inspection system
US5576831A (en) * 1994-06-20 1996-11-19 Tencor Instruments Wafer alignment sensor
US5883710A (en) 1994-12-08 1999-03-16 Kla-Tencor Corporation Scanning system for inspecting anomalies on surfaces
US20040057044A1 (en) * 1994-12-08 2004-03-25 Mehrdad Nikoonahad Scanning system for inspecting anamolies on surfaces
US5825482A (en) * 1995-09-29 1998-10-20 Kla-Tencor Corporation Surface inspection system with misregistration error correction and adaptive illumination
DE19609399C2 (de) * 1996-03-01 2002-05-29 Infineon Technologies Ag Verfahren zum Bestimmen der Kristallorientierung in einem Wafer
EP0979398B1 (en) * 1996-06-04 2012-01-04 KLA-Tencor Corporation Optical scanning system for surface inspection
US5973316A (en) * 1997-07-08 1999-10-26 Nec Research Institute, Inc. Sub-wavelength aperture arrays with enhanced light transmission
US6040936A (en) * 1998-10-08 2000-03-21 Nec Research Institute, Inc. Optical transmission control apparatus utilizing metal films perforated with subwavelength-diameter holes
US6236033B1 (en) 1998-12-09 2001-05-22 Nec Research Institute, Inc. Enhanced optical transmission apparatus utilizing metal films having apertures and periodic surface topography
US6285020B1 (en) 1999-11-05 2001-09-04 Nec Research Institute, Inc. Enhanced optical transmission apparatus with improved inter-surface coupling
US6441298B1 (en) 2000-08-15 2002-08-27 Nec Research Institute, Inc Surface-plasmon enhanced photovoltaic device
CA2319898C (en) 2000-09-18 2006-05-16 Institut National D'optique Position encoding optical device and method
US6649901B2 (en) 2002-03-14 2003-11-18 Nec Laboratories America, Inc. Enhanced optical transmission apparatus with improved aperture geometry
US8225664B1 (en) * 2007-10-17 2012-07-24 Lsp Technologies Lamb waves for laser bond inspection
CN101694531B (zh) * 2009-10-15 2011-01-05 电子科技大学 过剩光载流子菲涅耳波带片
KR102695015B1 (ko) * 2018-09-17 2024-08-13 삼성전자주식회사 네가티브톤 현상용 포토마스크

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4842764A (enExample) * 1971-09-29 1973-06-21

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3545854A (en) * 1966-06-17 1970-12-08 Gen Electric Semiconductor mask making
US4037969A (en) * 1976-04-02 1977-07-26 Bell Telephone Laboratories, Incorporated Zone plate alignment marks
FR2436967A1 (fr) * 1978-09-19 1980-04-18 Thomson Csf Procede d'alignement optique de motifs dans deux plans rapproches et dispositif d'alignement mettant en oeuvre un tel procede
US4360586A (en) * 1979-05-29 1982-11-23 Massachusetts Institute Of Technology Spatial period division exposing
US4326805A (en) * 1980-04-11 1982-04-27 Bell Telephone Laboratories, Incorporated Method and apparatus for aligning mask and wafer members

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4842764A (enExample) * 1971-09-29 1973-06-21

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61128106A (ja) * 1984-11-26 1986-06-16 Nippon Kogaku Kk <Nikon> 位置検出方法及び装置

Also Published As

Publication number Publication date
EP0065115B1 (en) 1985-08-07
EP0065115A1 (en) 1982-11-24
DE3265191D1 (en) 1985-09-12
JPS6312522B2 (enExample) 1988-03-19
US4405238A (en) 1983-09-20

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