JPS57186863U - - Google Patents

Info

Publication number
JPS57186863U
JPS57186863U JP7503681U JP7503681U JPS57186863U JP S57186863 U JPS57186863 U JP S57186863U JP 7503681 U JP7503681 U JP 7503681U JP 7503681 U JP7503681 U JP 7503681U JP S57186863 U JPS57186863 U JP S57186863U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7503681U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7503681U priority Critical patent/JPS57186863U/ja
Publication of JPS57186863U publication Critical patent/JPS57186863U/ja
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP7503681U 1981-05-23 1981-05-23 Pending JPS57186863U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7503681U JPS57186863U (en) 1981-05-23 1981-05-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7503681U JPS57186863U (en) 1981-05-23 1981-05-23

Publications (1)

Publication Number Publication Date
JPS57186863U true JPS57186863U (en) 1982-11-27

Family

ID=29870784

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7503681U Pending JPS57186863U (en) 1981-05-23 1981-05-23

Country Status (1)

Country Link
JP (1) JPS57186863U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018009867A (en) * 2016-07-13 2018-01-18 株式会社Ihi Leakage flux flaw detection device
JP2020051917A (en) * 2018-09-27 2020-04-02 アイシン精機株式会社 Inspection apparatus and inspection method for cylindrical superconductor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018009867A (en) * 2016-07-13 2018-01-18 株式会社Ihi Leakage flux flaw detection device
JP2020051917A (en) * 2018-09-27 2020-04-02 アイシン精機株式会社 Inspection apparatus and inspection method for cylindrical superconductor

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