JPS5718593B2 - - Google Patents
Info
- Publication number
- JPS5718593B2 JPS5718593B2 JP4318878A JP4318878A JPS5718593B2 JP S5718593 B2 JPS5718593 B2 JP S5718593B2 JP 4318878 A JP4318878 A JP 4318878A JP 4318878 A JP4318878 A JP 4318878A JP S5718593 B2 JPS5718593 B2 JP S5718593B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4318878A JPS54136181A (en) | 1978-04-14 | 1978-04-14 | Test method for semiconductor memory unit of tri-state output |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4318878A JPS54136181A (en) | 1978-04-14 | 1978-04-14 | Test method for semiconductor memory unit of tri-state output |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS54136181A JPS54136181A (en) | 1979-10-23 |
JPS5718593B2 true JPS5718593B2 (de) | 1982-04-17 |
Family
ID=12656934
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4318878A Granted JPS54136181A (en) | 1978-04-14 | 1978-04-14 | Test method for semiconductor memory unit of tri-state output |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS54136181A (de) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3516755A1 (de) * | 1984-05-09 | 1985-11-14 | Mitsubishi Denki K.K., Tokio/Tokyo | Testgeraet fuer halbleitereinrichtungen |
DE3528189A1 (de) * | 1984-08-06 | 1986-02-13 | Mitsubishi Denki K.K., Tokio/Tokyo | Testgeraet fuer halbleitereinrichtungen |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59119284A (ja) * | 1982-12-27 | 1984-07-10 | Advantest Corp | 論理回路の不良解析装置 |
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1978
- 1978-04-14 JP JP4318878A patent/JPS54136181A/ja active Granted
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3516755A1 (de) * | 1984-05-09 | 1985-11-14 | Mitsubishi Denki K.K., Tokio/Tokyo | Testgeraet fuer halbleitereinrichtungen |
US4651088A (en) * | 1984-05-09 | 1987-03-17 | Mitsubishi Denki Kabushiki Kaisha | Device for testing semiconductor devices |
DE3528189A1 (de) * | 1984-08-06 | 1986-02-13 | Mitsubishi Denki K.K., Tokio/Tokyo | Testgeraet fuer halbleitereinrichtungen |
US4720671A (en) * | 1984-08-06 | 1988-01-19 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device testing device |
Also Published As
Publication number | Publication date |
---|---|
JPS54136181A (en) | 1979-10-23 |