JPS5718572B2 - - Google Patents
Info
- Publication number
- JPS5718572B2 JPS5718572B2 JP8701976A JP8701976A JPS5718572B2 JP S5718572 B2 JPS5718572 B2 JP S5718572B2 JP 8701976 A JP8701976 A JP 8701976A JP 8701976 A JP8701976 A JP 8701976A JP S5718572 B2 JPS5718572 B2 JP S5718572B2
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
Landscapes
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8701976A JPS5312384A (en) | 1976-07-20 | 1976-07-20 | Indicating method for defect mark |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8701976A JPS5312384A (en) | 1976-07-20 | 1976-07-20 | Indicating method for defect mark |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5312384A JPS5312384A (en) | 1978-02-03 |
| JPS5718572B2 true JPS5718572B2 (ja) | 1982-04-17 |
Family
ID=13903238
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8701976A Granted JPS5312384A (en) | 1976-07-20 | 1976-07-20 | Indicating method for defect mark |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5312384A (ja) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55100787A (en) * | 1979-01-25 | 1980-07-31 | Hajime Sangyo Kk | Inspection unit for body |
| CN102818809A (zh) * | 2012-09-05 | 2012-12-12 | 杭州瑞利测控技术有限公司 | 一种基于机器视觉的坯布疵点在线检测系统及实现方法 |
-
1976
- 1976-07-20 JP JP8701976A patent/JPS5312384A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5312384A (en) | 1978-02-03 |