JPS57180060A - Astigmation correction procedure and its apparatus in scanning electron microscope and its analogous equipment - Google Patents
Astigmation correction procedure and its apparatus in scanning electron microscope and its analogous equipmentInfo
- Publication number
- JPS57180060A JPS57180060A JP56064471A JP6447181A JPS57180060A JP S57180060 A JPS57180060 A JP S57180060A JP 56064471 A JP56064471 A JP 56064471A JP 6447181 A JP6447181 A JP 6447181A JP S57180060 A JPS57180060 A JP S57180060A
- Authority
- JP
- Japan
- Prior art keywords
- correction
- astigmation
- sawtooth wave
- circuits
- electron microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- XBDRAUPLGHAFCU-UHFFFAOYSA-N 3-[6-amino-5-(6-ethoxynaphthalen-2-yl)pyridin-3-yl]-n-[2-(dimethylamino)ethyl]benzamide Chemical compound C1=CC2=CC(OCC)=CC=C2C=C1C(C(=NC=1)N)=CC=1C1=CC=CC(C(=O)NCCN(C)C)=C1 XBDRAUPLGHAFCU-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56064471A JPS57180060A (en) | 1981-04-28 | 1981-04-28 | Astigmation correction procedure and its apparatus in scanning electron microscope and its analogous equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56064471A JPS57180060A (en) | 1981-04-28 | 1981-04-28 | Astigmation correction procedure and its apparatus in scanning electron microscope and its analogous equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57180060A true JPS57180060A (en) | 1982-11-05 |
| JPS6329379B2 JPS6329379B2 (enrdf_load_stackoverflow) | 1988-06-13 |
Family
ID=13259168
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56064471A Granted JPS57180060A (en) | 1981-04-28 | 1981-04-28 | Astigmation correction procedure and its apparatus in scanning electron microscope and its analogous equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57180060A (enrdf_load_stackoverflow) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04115448A (ja) * | 1990-09-06 | 1992-04-16 | Hitachi Ltd | 電子線装置 |
-
1981
- 1981-04-28 JP JP56064471A patent/JPS57180060A/ja active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04115448A (ja) * | 1990-09-06 | 1992-04-16 | Hitachi Ltd | 電子線装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6329379B2 (enrdf_load_stackoverflow) | 1988-06-13 |
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