JPS5717836A - Measuring device for light path frequency characteristic - Google Patents

Measuring device for light path frequency characteristic

Info

Publication number
JPS5717836A
JPS5717836A JP9255880A JP9255880A JPS5717836A JP S5717836 A JPS5717836 A JP S5717836A JP 9255880 A JP9255880 A JP 9255880A JP 9255880 A JP9255880 A JP 9255880A JP S5717836 A JPS5717836 A JP S5717836A
Authority
JP
Japan
Prior art keywords
semiconductor laser
fiber
laser
light
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9255880A
Other languages
Japanese (ja)
Inventor
Kenichi Sato
Kouichi Asatani
Kenji Okadaya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Telegraph and Telephone Corp
Original Assignee
Nippon Telegraph and Telephone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Telegraph and Telephone Corp filed Critical Nippon Telegraph and Telephone Corp
Priority to JP9255880A priority Critical patent/JPS5717836A/en
Publication of JPS5717836A publication Critical patent/JPS5717836A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/333—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face using modulated input signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/331—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by using interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To reduce interferential properties and to measure precise light transmission signal frequency characteristics by feeding back semiconductor laser back beam to an active layer of the semiconductor laser. CONSTITUTION:A semiconductor laser 3 is subjected to direct intensity modulation by applying the signal from a signal generation circuit 1 to a laser modulation circuit 2. Laser output beam is coupled to a light path to be measured, is detected at the other end by a photodiode 5 and is converted into an electric signal. And it is amplified by a light receiving circuit 6, is received by a spectrum analyzer 7, and the frequency characteristics of the path 4 are measured. On the other hand, a back beam from the semiconductor laser 3 is guided to a multimode type optical fiber 8 and at the other end 9 of the fiber 8, a reflector that is devised to give a specified reflection ratio to the output light of the semiconductor laser 3 is provided. The back beam passed through the fiber 8 is reflected at the other end 9 to pass again the fiber 8 and fed back to the active layer of the semiconductor laser.
JP9255880A 1980-07-07 1980-07-07 Measuring device for light path frequency characteristic Pending JPS5717836A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9255880A JPS5717836A (en) 1980-07-07 1980-07-07 Measuring device for light path frequency characteristic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9255880A JPS5717836A (en) 1980-07-07 1980-07-07 Measuring device for light path frequency characteristic

Publications (1)

Publication Number Publication Date
JPS5717836A true JPS5717836A (en) 1982-01-29

Family

ID=14057739

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9255880A Pending JPS5717836A (en) 1980-07-07 1980-07-07 Measuring device for light path frequency characteristic

Country Status (1)

Country Link
JP (1) JPS5717836A (en)

Similar Documents

Publication Publication Date Title
DE3176220D1 (en) Fibre-optical measuring equipment
JPS5640737A (en) Damage detector for optical fiber for laser power transmission
JPS5621004A (en) Optical sensing system
EP0656537B1 (en) Photodetecting apparatus for scattering medium with phase detection
JPS5478156A (en) Detector of break point of optical fibers
JPS536059A (en) Measuring method and apparatus for optical fiber transmission characteristics
JPS5717836A (en) Measuring device for light path frequency characteristic
JPS6418070A (en) Detecting apparatus for voltage
WO1989012806A3 (en) Apparatus for measuring the radiated power of lasers
JPS57101709A (en) Film thickness gauge with infrared ray
JPS55142220A (en) Device for measuring wavelength
JPS53113572A (en) Dispersion characteristic measuring device of optical fiber
JPS646834A (en) Instrument for measuring light emission spectrum
JPS57162542A (en) Optical signal transmitting system
JPS57157124A (en) Optical rod fabry-perot thermometer
JPS54109863A (en) Range measuring device
JPS5666713A (en) Measuring device of beam diameter of laser light
JPS5533623A (en) Measurement of break standardizing frequency of refractive index distribution type and transmission mode of optical fiber
JPS56145323A (en) Spectrophotometer
JPS57108702A (en) Displacement meter
RU2594634C1 (en) Multichannel device for measuring energy of powerful nano-and picosecond transmission-type laser pulses
JPS53148292A (en) Direct viewing apparatus of light output to current characteristics of semiconductor lasers
JPS57187676A (en) Measuring device for distance
JPS554011A (en) Optical branching and receiving device
RU780676C (en) Method of determining characteristics of atmosphere