JPS57163874A - Automatic input and output switching testing equipment - Google Patents

Automatic input and output switching testing equipment

Info

Publication number
JPS57163874A
JPS57163874A JP56050869A JP5086981A JPS57163874A JP S57163874 A JPS57163874 A JP S57163874A JP 56050869 A JP56050869 A JP 56050869A JP 5086981 A JP5086981 A JP 5086981A JP S57163874 A JPS57163874 A JP S57163874A
Authority
JP
Japan
Prior art keywords
test
combination
parts
output switching
tested
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP56050869A
Other languages
Japanese (ja)
Inventor
Bunya Hirano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP56050869A priority Critical patent/JPS57163874A/en
Publication of JPS57163874A publication Critical patent/JPS57163874A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To test simultaneously two objects to be tested and also to achieve a combination test, by equipping two test execution parts, and providing an operation part which supplies commands to a connection part of those test execution parts. CONSTITUTION:Test execution parts operate independently of each other through the operation of an operation part 7a for a single-body test of an object 1 to be tested and an operation part 7b for that of an object 2 to be tested. For a combination test, manual operation parts 7a and 7b are reset by operating an operation part 9 to connect input and output switching relay parts 3a and 3b through the operation of a combination connection part 8, and combination test commands are sent to said relay parts 3a and 3b to compose a combination tensting circuit of the input and output switching relay parts 3a and 3b, thus achieving the combination test. Consequently,a test time is shortened greatly.
JP56050869A 1981-04-02 1981-04-02 Automatic input and output switching testing equipment Pending JPS57163874A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56050869A JPS57163874A (en) 1981-04-02 1981-04-02 Automatic input and output switching testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56050869A JPS57163874A (en) 1981-04-02 1981-04-02 Automatic input and output switching testing equipment

Publications (1)

Publication Number Publication Date
JPS57163874A true JPS57163874A (en) 1982-10-08

Family

ID=12870724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56050869A Pending JPS57163874A (en) 1981-04-02 1981-04-02 Automatic input and output switching testing equipment

Country Status (1)

Country Link
JP (1) JPS57163874A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105988051A (en) * 2015-07-28 2016-10-05 北京长城华冠汽车科技股份有限公司 Unit test apparatus and unit test apparatus method for subsystems

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50160066A (en) * 1974-06-15 1975-12-25
JPS5182672A (en) * 1975-01-17 1976-07-20 Nippon Electric Co
JPS539140A (en) * 1976-07-12 1978-01-27 Mitsubishi Electric Corp Starting method of testing apparatus using computer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50160066A (en) * 1974-06-15 1975-12-25
JPS5182672A (en) * 1975-01-17 1976-07-20 Nippon Electric Co
JPS539140A (en) * 1976-07-12 1978-01-27 Mitsubishi Electric Corp Starting method of testing apparatus using computer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105988051A (en) * 2015-07-28 2016-10-05 北京长城华冠汽车科技股份有限公司 Unit test apparatus and unit test apparatus method for subsystems
CN105988051B (en) * 2015-07-28 2019-08-23 北京长城华冠汽车科技股份有限公司 The monomer test equipment and monomer test method of one subsystem

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