JPS552957A - Testing system - Google Patents

Testing system

Info

Publication number
JPS552957A
JPS552957A JP7607178A JP7607178A JPS552957A JP S552957 A JPS552957 A JP S552957A JP 7607178 A JP7607178 A JP 7607178A JP 7607178 A JP7607178 A JP 7607178A JP S552957 A JPS552957 A JP S552957A
Authority
JP
Japan
Prior art keywords
change
testers
over
testing
testing station
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7607178A
Other languages
Japanese (ja)
Inventor
Hajime Saito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7607178A priority Critical patent/JPS552957A/en
Publication of JPS552957A publication Critical patent/JPS552957A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE: For increasing the frequency of the use of this testing systems, to enable the change-over setting of the corresponding ones of a plurality of testers to be made to a common testing station with the change-over switch provided between said testers and the testing stations corresponding to said testers.
CONSTITUTION: Change-over switches S1WSm are positioned as illustrated for example, and testers T1WTm are connected to the test stations PS1WPSm corresponding thereto. Said testing stations indepentently test the testpieces having a small number of connecting terminals n1Wnm. If the change-over connection of all of said change-over switches S1WSm to a common testing station SPP from the illustrated positions thereof, the testieces having as large a number of connecting terminals as n1+n2...+nm=n can be tested by said testing station SPp. Control is made by a controller CNT so that the testers whose change-over setting has been made to said common testing station PSP may interlock with each other in the operation thereof.
COPYRIGHT: (C)1980,JPO&Japio
JP7607178A 1978-06-23 1978-06-23 Testing system Pending JPS552957A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7607178A JPS552957A (en) 1978-06-23 1978-06-23 Testing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7607178A JPS552957A (en) 1978-06-23 1978-06-23 Testing system

Publications (1)

Publication Number Publication Date
JPS552957A true JPS552957A (en) 1980-01-10

Family

ID=13594551

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7607178A Pending JPS552957A (en) 1978-06-23 1978-06-23 Testing system

Country Status (1)

Country Link
JP (1) JPS552957A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5738475U (en) * 1980-08-13 1982-03-01

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5738475U (en) * 1980-08-13 1982-03-01
JPS6111418Y2 (en) * 1980-08-13 1986-04-10

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